FEI Co.
Hillsboro, OR 97124
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FEI Receives Titan(TM) Order from Japanese Steelmaker
Steel Researchers to Utilize World's Most Powerful Microscope for Advanced Materials Characterization and Analysis HILLSBORO, Oregon/September 4, 2006-FEI (Nasdaq: FEIC) today announced that Japan's JFE Steel Corporation has ordered a Titan(TM) 80-300 for its research center in Kawasaki. JFE Steel, a leading global supplier of steel products, is the first Japanese customer to order the Titan...
Read More »FEI Receives Titan(TM) Order from Japanese Steelmaker
Steel Researchers to Utilize World's Most Powerful Microscope for Advanced Materials Characterization and Analysis HILLSBORO, Oregon/September 4, 2006-FEI (Nasdaq: FEIC) today announced that Japan's JFE Steel Corporation has ordered a Titan(TM) 80-300 for its research center in Kawasaki. JFE Steel, a leading global supplier of steel products, is the first Japanese customer to order the Titan...
Read More »FIB/SEM System offers nanoscale imaging and analysis.
Helios NanoLab(TM) DualBeam(TM) features ultra-high resolution field emission scanning electron microscope (SEM) column combined with Sidewinder(TM) focused ion beam (FIB) column and gas chemistries to provide imaging resolution and contrast in DualBeam system. Small DualBeam platform enables 3D characterization, analysis, and image reconstruction applications, nano-prototyping (fabrication and...
Read More »FIB/SEM System offers nanoscale imaging and analysis.
Helios NanoLab(TM) DualBeam(TM) features ultra-high resolution field emission scanning electron microscope (SEM) column combined with Sidewinder(TM) focused ion beam (FIB) column and gas chemistries to provide imaging resolution and contrast in DualBeam system. Small DualBeam platform enables 3D characterization, analysis, and image reconstruction applications, nano-prototyping (fabrication and...
Read More »FEI Launches Certified Tools Program Globally
New Program Offers Customers Enhanced Flexibility for Purchasing Factory Certified FEI Solutions HILLSBORO, Ore., July 10 / -- FEI Company (NASDAQ:FEIC) has announced the global launch of its Certified Tools program featuring factory-refurbished FEI systems that are fully-tested and warranted to meet original factory specifications. With the Certified Tools program, customers will now have...
Read More »FEI Launches Certified Tools Program Globally
New Program Offers Customers Enhanced Flexibility for Purchasing Factory Certified FEI Solutions HILLSBORO, Ore., July 10 / -- FEI Company (NASDAQ:FEIC) has announced the global launch of its Certified Tools program featuring factory-refurbished FEI systems that are fully-tested and warranted to meet original factory specifications. With the Certified Tools program, customers will now have...
Read More »FEI's Titan(TM) S/Tem Achieves Low KV Milestone
1.4 Angstrom Resolution Marks Important Breakthrough for Atomic-Scale Imaging of Light Element Nanomaterials HILLSBORO, Ore, July 31, 2006 --- FEI Company (Nasdaq: FEIC) today announced that scientists at its NanoPort(TM) in Europe have broken another image resolution barrier with the world's most advanced commercially-available microscope, the Titan(TM) 80-300 corrected S/TEM. For the first time...
Read More »FEI's Titan(TM) S/Tem Achieves Low KV Milestone
1.4 Angstrom Resolution Marks Important Breakthrough for Atomic-Scale Imaging of Light Element Nanomaterials HILLSBORO, Ore, July 31, 2006 --- FEI Company (Nasdaq: FEIC) today announced that scientists at its NanoPort(TM) in Europe have broken another image resolution barrier with the world's most advanced commercially-available microscope, the Titan(TM) 80-300 corrected S/TEM. For the first time...
Read More »Focused Ion Beam System provides circuit edit platform.
Model V600FIB Focused Ion Beam system is offered for debug, failure analysis, and sample preparation for semiconductor devices down to 90 nm, with upgrade path for circuit edit applications for designs below 65 nm. With Sidewinder(TM) 30 kV ion column, application-specific gas delivery system, and 5-axis tilt stage for stable cross sectioning for failure analysis applications, system accommodates...
Read More »Focused Ion Beam System provides circuit edit platform.
Model V600FIB Focused Ion Beam system is offered for debug, failure analysis, and sample preparation for semiconductor devices down to 90 nm, with upgrade path for circuit edit applications for designs below 65 nm. With Sidewinder(TM) 30 kV ion column, application-specific gas delivery system, and 5-axis tilt stage for stable cross sectioning for failure analysis applications, system accommodates...
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