FEI Co.
Hillsboro, OR 97124
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FEI Expands Helios Nanolab(TM) Family for Semi Market
NanoLab 400/400S to be Introduced at SEMICON Japan Giving Users a Complete Range of Advanced Solutions for Semiconductor Labs NOVEMBER 30, 2006/Hillsboro, Ore.-FEI Company (Nasdaq: FEIC) will expand its top-of-the-line Helios NanoLab(TM) family of DualBeams(TM) when it introduces the Helios NanoLab 400 and 400S systems next week at SEMICON Japan. Combining advanced focused ion beam (FIB) and...
Read More »FEI Expands Helios Nanolab(TM) Family for Semi Market
NanoLab 400/400S to be Introduced at SEMICON Japan Giving Users a Complete Range of Advanced Solutions for Semiconductor Labs NOVEMBER 30, 2006/Hillsboro, Ore.-FEI Company (Nasdaq: FEIC) will expand its top-of-the-line Helios NanoLab(TM) family of DualBeams(TM) when it introduces the Helios NanoLab 400 and 400S systems next week at SEMICON Japan. Combining advanced focused ion beam (FIB) and...
Read More »FEI Receives $11.5 Million Order from Technical University of Denmark
Seven Systems to Form the Core of DTU's New Center for Electron Nanoscopy and Pave the Way for Advanced Catalyst Research NOVEMBER 27, 2006/Hillsboro, Ore.-The Technical University of Denmark (DTU) has placed a $11.5 million dollar order for seven FEI microscopes that will form the core of the University's new Center for Electron Nanoscopy (CEN). The order represents the largest product sale ever...
Read More »FEI Receives $11.5 Million Order from Technical University of Denmark
Seven Systems to Form the Core of DTU's New Center for Electron Nanoscopy and Pave the Way for Advanced Catalyst Research NOVEMBER 27, 2006/Hillsboro, Ore.-The Technical University of Denmark (DTU) has placed a $11.5 million dollar order for seven FEI microscopes that will form the core of the University's new Center for Electron Nanoscopy (CEN). The order represents the largest product sale ever...
Read More »FIB/SEM Systems are designed for semiconductor labs.
NanoLab(TM) 400/400S feature high resolution field emission scanning electron microscope column combined with Sidewinder(TM) focused ion beam column and gas chemistries. Suited for sub-65 nm node devices, DualBeams(TM) systems offer low-kV SEM resolution to support 3D cross-sectional imaging and analysis. NanoLab 400 comes with high resolution stage/load lock, while Model 400S is equipped with...
Read More »FIB/SEM Systems are designed for semiconductor labs.
NanoLab(TM) 400/400S feature high resolution field emission scanning electron microscope column combined with Sidewinder(TM) focused ion beam column and gas chemistries. Suited for sub-65 nm node devices, DualBeams(TM) systems offer low-kV SEM resolution to support 3D cross-sectional imaging and analysis. NanoLab 400 comes with high resolution stage/load lock, while Model 400S is equipped with...
Read More »Imperial College London Unveils UK's First Titan (TM) S/TEM
World's Most Powerful Commercially-Available Microscope Provides Access to Atomic-Scale Data for Nanotechnology Research OCTOBER 18, 2006/Hillsboro, Ore.--Imperial College London has unveiled one of the UK's most powerful microscopes, the Titan(TM) 80-300 S/TEM from FEI. It is the world's most powerful commercially-available scanning/transmission electron microscopes and one of the only...
Read More »Imperial College London Unveils UK's First Titan (TM) S/TEM
World's Most Powerful Commercially-Available Microscope Provides Access to Atomic-Scale Data for Nanotechnology Research OCTOBER 18, 2006/Hillsboro, Ore.--Imperial College London has unveiled one of the UK's most powerful microscopes, the Titan(TM) 80-300 S/TEM from FEI. It is the world's most powerful commercially-available scanning/transmission electron microscopes and one of the only...
Read More »FEI Company and Malvern Instruments Team
FEI's Quanta(TM) SEMs and Malvern's Advanced Particle Analysis Software Combine to Deliver Ground-breaking Solution for Nanoscale Applications Hillsboro, Ore./September 12, 2006 --- FEI Company (NASDAQ: FEIC) and Malvern Instruments Ltd (Malvern, UK) have entered into a joint development and marketing program for advanced nanoparticle analysis utilizing Malvern's particle image analysis software...
Read More »FEI Company and Malvern Instruments Team
FEI's Quanta(TM) SEMs and Malvern's Advanced Particle Analysis Software Combine to Deliver Ground-breaking Solution for Nanoscale Applications Hillsboro, Ore./September 12, 2006 --- FEI Company (NASDAQ: FEIC) and Malvern Instruments Ltd (Malvern, UK) have entered into a joint development and marketing program for advanced nanoparticle analysis utilizing Malvern's particle image analysis software...
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