FEI Co.
Hillsboro, OR 97124
Share:
Software System provides SEM and EDS validation.
Suited for forensics and mining applications, microValidator(TM) provides automatic, standards-based confirmation of imaging and analytical performance that is critical in establishing accuracy, traceability, and reproducibility of results. Package includes software, beam current meter, and sub-stage mount containing essential standards. Offering SEM, EDS, and combined SEM/EDS checks, system...
Read More »Software System provides SEM and EDS validation.
Suited for forensics and mining applications, microValidator(TM) provides automatic, standards-based confirmation of imaging and analytical performance that is critical in establishing accuracy, traceability, and reproducibility of results. Package includes software, beam current meter, and sub-stage mount containing essential standards. Offering SEM, EDS, and combined SEM/EDS checks, system...
Read More »Microscope bridges optical and scanning electron microscopy.
Facilitating operation via interactive touchscreen, Phenom(TM) can be used in most locations and does not require specialized facilities. Solution yields magnification up to 20,000x in compact design to bring high-resolution imaging to industrial as well as academic applications. Example areas of use include quality assurance, product development, research, and teaching.
Read More »Microscope bridges optical and scanning electron microscopy.
Facilitating operation via interactive touchscreen, Phenom(TM) can be used in most locations and does not require specialized facilities. Solution yields magnification up to 20,000x in compact design to bring high-resolution imaging to industrial as well as academic applications. Example areas of use include quality assurance, product development, research, and teaching.
Read More »High Resolution Microscope magnifies up to 20,000x.
Phenom(TM) high-resolution imaging microscope features performance levels between those of optical and scanning electron microscopes. Capable of yielding magnification up to 20,000x, unit features interactive touch screen user interface. Suitable applications include quality assurance, product development, research, and teaching. Unit is portable and requires no specialized facilities.
Read More »High Resolution Microscope magnifies up to 20,000x.
Phenom(TM) high-resolution imaging microscope features performance levels between those of optical and scanning electron microscopes. Capable of yielding magnification up to 20,000x, unit features interactive touch screen user interface. Suitable applications include quality assurance, product development, research, and teaching. Unit is portable and requires no specialized facilities.
Read More »
Circuit Edit/Validation System uses ion column technology.
Offering circuit edit capabilities, V600CE accelerates semiconductor design validation and performance optimization on 65 nm and below devices. Etching planarity is promoted with NanoChemix(TM) tri-nozzle gas delivery system, which accommodates range of precursors for etching and deposition. Dynamic end-point solution displays live imaging of active pattern as well as both stage current readings...
Read More »
Circuit Edit/Validation System uses ion column technology.
Offering circuit edit capabilities, V600CE accelerates semiconductor design validation and performance optimization on 65 nm and below devices. Etching planarity is promoted with NanoChemix(TM) tri-nozzle gas delivery system, which accommodates range of precursors for etching and deposition. Dynamic end-point solution displays live imaging of active pattern as well as both stage current readings...
Read More »STEM System analyzes multiple wafer samples.
Designed for semiconductor labs, Expida(TM) 1255S DualBeam(TM) System integrates STEM Scanning/Transmission Electron Microscopy sample preparation with high-resolution imaging and analysis in single tool. It features ion beam column for preparing TEM samples, and electron column with 14-segment STEM detector for 30 kV imaging. System assures correct end-pointing and precise lamella thickness by...
Read More »STEM System analyzes multiple wafer samples.
Designed for semiconductor labs, Expida(TM) 1255S DualBeam(TM) System integrates STEM Scanning/Transmission Electron Microscopy sample preparation with high-resolution imaging and analysis in single tool. It features ion beam column for preparing TEM samples, and electron column with 14-segment STEM detector for 30 kV imaging. System assures correct end-pointing and precise lamella thickness by...
Read More »