FEI Co.
Hillsboro, OR 97124
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Electron Microscope is offered with electron source module.
Titan(TM) scanning transmission electron microscopes are available with extreme field emission gun (X-FEG), which combines brightness with stable current of thermally assisted field emission to optimize resolution, speed, and sensitivity. X-FEG can also be combined with technologies such as chromatic or spherical aberration correctors or low accelerating voltages. Operational simplicity, absence...
Read More »Electron Microscope is offered with electron source module.
Titan(TM) scanning transmission electron microscopes are available with extreme field emission gun (X-FEG), which combines brightness with stable current of thermally assisted field emission to optimize resolution, speed, and sensitivity. X-FEG can also be combined with technologies such as chromatic or spherical aberration correctors or low accelerating voltages. Operational simplicity, absence...
Read More »FEI Connectivity Solutions Improve and Accelerate TEM Imaging for Semiconductor Manufacturing
Higher-quality results in hours (not days) speed process development and enhance yields Hillsboro, Ore./July 15, - FEI Company (Nasdaq: FEIC), a leading provider of atomic-scale imaging and analysis systems, today announced the Ultimate Throughput(TM) and Ultimate Imaging(TM) Connectivity Solutions. By accelerating and improving the quality of preparation, imaging and analysis of the ultra-thin...
Read More »FEI Connectivity Solutions Improve and Accelerate TEM Imaging for Semiconductor Manufacturing
Higher-quality results in hours (not days) speed process development and enhance yields Hillsboro, Ore./July 15, - FEI Company (Nasdaq: FEIC), a leading provider of atomic-scale imaging and analysis systems, today announced the Ultimate Throughput(TM) and Ultimate Imaging(TM) Connectivity Solutions. By accelerating and improving the quality of preparation, imaging and analysis of the ultra-thin...
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High Resolution SEM is suited for scientists and engineers.
With optional environmental enclosure to isolate instrument from thermal and acoustic interferences, Magellan XHR SEM enables rapid 3D surface imaging at different angles and at resolutions below 1 nm. Magellan 400 is optimized for scientific research, while Magellan 400L is optimized for semiconductor labs. Magellan 400L has load-lock feature that speeds-up sample throughput, and includes...
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High Resolution SEM is suited for scientists and engineers.
With optional environmental enclosure to isolate instrument from thermal and acoustic interferences, Magellan XHR SEM enables rapid 3D surface imaging at different angles and at resolutions below 1 nm. Magellan 400 is optimized for scientific research, while Magellan 400L is optimized for semiconductor labs. Magellan 400L has load-lock feature that speeds-up sample throughput, and includes...
Read More »Microscope enables chemical research at the atomic scale.
Able to select electron beam voltages anywhere between 80-300 kV, Titan(TM) 80-300 environmental transmission electron microscope (ETEM) allows researchers to see chemistry and nanoscale catalysis at atomic level. Microscope delivers high-resolution imaging with gas pressures in sample chamber as high as few percent of atmospheric pressure, and gas controller permits precise control of...
Read More »Microscope enables chemical research at the atomic scale.
Able to select electron beam voltages anywhere between 80-300 kV, Titan(TM) 80-300 environmental transmission electron microscope (ETEM) allows researchers to see chemistry and nanoscale catalysis at atomic level. Microscope delivers high-resolution imaging with gas pressures in sample chamber as high as few percent of atmospheric pressure, and gas controller permits precise control of...
Read More »FEI Annouces Joint Research Program with the FOM Foundation
Project Will Focus on Developing Tools for Single-Atom Imaging and Processing of Material Structures HILLSBORO, Ore./December 18, 2007 -- FEI Company (Nasdaq: FEIC) and the Netherlands-based FOM foundation have announced a joint nanotechnology research project. The goal of the Industrial Partnership Program (IPP) is to advance electron microscopes and focused ion beam systems (FIBs) so that the...
Read More »FEI Annouces Joint Research Program with the FOM Foundation
Project Will Focus on Developing Tools for Single-Atom Imaging and Processing of Material Structures HILLSBORO, Ore./December 18, 2007 -- FEI Company (Nasdaq: FEIC) and the Netherlands-based FOM foundation have announced a joint nanotechnology research project. The goal of the Industrial Partnership Program (IPP) is to advance electron microscopes and focused ion beam systems (FIBs) so that the...
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