FEI Co.
Hillsboro, OR 97124
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SEM can be used with wide range of samples.
With ability to scan variety of samples, including insulated, wet, and dirty samples, Quanta 50 Series scanning electron microscope can be utilized in materials research, mineralogy, chemicals and petroleum, electronics, pharmaceuticals, and biology industries. Beam deceleration optimizes surface imaging capability with low landing energies, while SmartSCAN(TM) technology minimizes noise. Quanta...
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SEM can be used with wide range of samples.
With ability to scan variety of samples, including insulated, wet, and dirty samples, Quanta 50 Series scanning electron microscope can be utilized in materials research, mineralogy, chemicals and petroleum, electronics, pharmaceuticals, and biology industries. Beam deceleration optimizes surface imaging capability with low landing energies, while SmartSCAN(TM) technology minimizes noise. Quanta...
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Scanning Electron Microscope offers sub-nanometer resolution.
Using Magellen(TM) extreme high-resolution SEM, scientists and engineers can see 3D surface images at many different angles and at resolutions below 1 nm. Unit images samples at low beam energies, avoiding distortions otherwise caused by beam penetrating into material below.
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Scanning Electron Microscope offers sub-nanometer resolution.
Using Magellen(TM) extreme high-resolution SEM, scientists and engineers can see 3D surface images at many different angles and at resolutions below 1 nm. Unit images samples at low beam energies, avoiding distortions otherwise caused by beam penetrating into material below.
Read More »FEI Adds Dual-Axis Automation to Leading Electron Tomography Solution for Life Science Research
Xplore3D now offers automated dual-axis acquisition and reconstruction - extending the capability and accuracy of electron tomography for 3D biological ultrastructure Hillsboro, Ore./November 3, 2008 - FEI Company (Nasdaq: FEIC), a leading provider of high-resolution imaging and analysis solutions, today released its Xplore3D software package, updated to include data acquisition and...
Read More »FEI Adds Dual-Axis Automation to Leading Electron Tomography Solution for Life Science Research
Xplore3D now offers automated dual-axis acquisition and reconstruction - extending the capability and accuracy of electron tomography for 3D biological ultrastructure Hillsboro, Ore./November 3, 2008 - FEI Company (Nasdaq: FEIC), a leading provider of high-resolution imaging and analysis solutions, today released its Xplore3D software package, updated to include data acquisition and...
Read More »Software Package automates strain analysis.
Suited for use in semiconductor manufacturing, TrueCrystal Strain Analysis can be installed on Titan(TM) or Tecnai(TM) scanning/transmission electron microscope (S/TEM) system for determining strain along any line in crystalline sample at nanometer level. Package leverages combination of nano-beam diffraction (NBD) in TEM and off-line data analysis package to generate data required for advanced...
Read More »Software Package automates strain analysis.
Suited for use in semiconductor manufacturing, TrueCrystal Strain Analysis can be installed on Titan(TM) or Tecnai(TM) scanning/transmission electron microscope (S/TEM) system for determining strain along any line in crystalline sample at nanometer level. Package leverages combination of nano-beam diffraction (NBD) in TEM and off-line data analysis package to generate data required for advanced...
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Automated Analyzer optimizes mineral processing operations.
Using scanning electron microscope equipped with field emission gun (FEG) and multiple high-speed energy dispersive X-ray spectrometers (EDS), model MLA 600F mineralogy analyzer acquires image and composition information from large number of samples. Software uses data to acquire and measure characteristics such as mineral type and distribution, liberation and association-essential properties of...
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Automated Analyzer optimizes mineral processing operations.
Using scanning electron microscope equipped with field emission gun (FEG) and multiple high-speed energy dispersive X-ray spectrometers (EDS), model MLA 600F mineralogy analyzer acquires image and composition information from large number of samples. Software uses data to acquire and measure characteristics such as mineral type and distribution, liberation and association-essential properties of...
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