FEI Co.

Test & Measurement

FEI Completes Installation of First In-Line DA 300HP DualBeam(TM) in Japan

Top-Ten Japanese Supplier of Semiconductor Devices Adopts FEI's In-Fab Defect Analysis Solution for Rapid Ultra-High STEM, TEM Resolution HILLSBORO, Ore., Nov. 20 -- FEI Company (NASDAQ:FEIC) has completed the first Japanese installation of its advanced DA 300HP DualBeam(TM) system for automated in-fab defect analysis extendable to the 45nm design node. The in-line system, installed in the...

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Sensors, Monitors & Transducers

FEI Company and PDF Solutions® Release Powerful New Semiconductor Defect Analysis Solution

Integration of FEI's Advanced DA 300HP DualBeam(TM) and PDF Solutions' CV(R) Infrastructure Helps Semiconductor Manufacturers Accelerate Yield Learning HILLSBORO, Ore., Dec. 13 / -- FEI Company (NASDAQ:FEIC), the industry leader in Tools for Nanotech(TM), and PDF Solutions, Inc., the leading provider of semiconductor process-design integration technologies and services, jointly announced the...

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Optics & Photonics

FEI's Titan(TM) S/TEM Receives Industry Honors

HILLSBORO, Ore., Jan. 31/ -- Within months of its release, FEI's Titan(TM) scanning transmission electron microscope (S/TEM), the world's most powerful, commercially-available microscope, has earned four prestigious awards for its design, performance and innovation. Awards include the coveted iF Design Award bestowed by the International Design Forum (iF) in Hannover, Germany, and the Innovative...

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Optics & Photonics

Electron Microscope has all-digital design.

Tecnai(TM) G2 transmission electron microscope (TEM) achieves sub-Angstrom imaging and 0.1 eV analysis resolution at 200 kV. Run under Windows XP, Tecnai v3.0 operating software controls microscope and all detectors. It offers TEM Imaging and Analysis software with image and data processing functionality. Also included, Inspect3D Xpress hardware provides tomography reconstruction package that...

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Optics & Photonics

Electron Microscope offers nanoscale analysis of samples.

Nova NanoSEM field emission, Scanning Electron Microscope provides ultra-high resolution characterization of non-conductive and/or contaminating samples, such as organic materials, substrates, porous materials, and plastics. Helix detector technology combines magnetic immersion lens and low-vacuum SEM technologies. Microscope includes in-lens as well as low-vacuum secondary and back scatter...

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