FEI Co.
Hillsboro, OR 97124
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FEI Provides 3D Analysis System to Whiting Oil and Gas Corporation
Hillsboro, Ore. and Denver, Colo. - FEI (NASDAQ: FEIC) and Whiting Oil and Gas Corporation, announce the purchase of QEMSCAN® automated petrography and Helios NanoLab(TM) DualBeam(TM) technology for Whiting's new rock lab in its Denver, Colorado headquarters. QEMSCAN provides data for reservoir characterization, including quantitative compositional and elastic properties critical for designing a...
Read More »FEI Provides 3D Analysis System to Whiting Oil and Gas Corporation
Hillsboro, Ore. and Denver, Colo. - FEI (NASDAQ: FEIC) and Whiting Oil and Gas Corporation, announce the purchase of QEMSCANÃ-® automated petrography and Helios NanoLab(TM) DualBeam(TM) technology for Whiting's new rock lab in its Denver, Colorado headquarters. QEMSCAN provides data for reservoir characterization, including quantitative compositional and elastic properties critical for...
Read More »FEI Installs Advanced Electron Microscopes at nanoGUNE Nanoscience Research Center
Systems will be used to create, and even manipulate, new materials, devices and systems at the nanoscale Hillsboro, Ore., USA and San Sebastian, Spain- FEI Company (NASDAQ: FEIC), a leading scientific instrumentation company, and the Basque Nanoscience Cooperative Research Center, nanoGUNE Consolider, are pleased to announce the installation of three new advanced electron microscope systems from...
Read More »FEI Installs Advanced Electron Microscopes at nanoGUNE Nanoscience Research Center
Systems will be used to create, and even manipulate, new materials, devices and systems at the nanoscale Hillsboro, Ore., USA and San Sebastian, Spain- FEI Company (NASDAQ: FEIC), a leading scientific instrumentation company, and the Basque Nanoscience Cooperative Research Center, nanoGUNE Consolider, are pleased to announce the installation of three new advanced electron microscope systems from...
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FEI Hits Production Milestone for Helios NanoLab DualBeam
Ships 250th system as a result of expanded market adoption across a wide range of industries Hillsboro, Ore.- FEI (NASDAQ: FEIC), a leading instrumentation company that provides microscopy systems for research and industry, today announces that it has shipped the 250th Helios NanoLab(TM) DualBeam(TM) system. Since its introduction in 2006, the award-winning Helios NanoLab has experienced...
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FEI Hits Production Milestone for Helios NanoLab DualBeam
Ships 250th system as a result of expanded market adoption across a wide range of industries Hillsboro, Ore.- FEI (NASDAQ: FEIC), a leading instrumentation company that provides microscopy systems for research and industry, today announces that it has shipped the 250th Helios NanoLab(TM) DualBeam(TM) system. Since its introduction in 2006, the award-winning Helios NanoLab has experienced...
Read More »FEI and CEA-Leti Enter Joint Agreement to Characterize Advanced Semiconductor Materials
CEA-Leti and FEI expect to address technical roadblocks faced by the industry in moving to 22nm IC devices Hillsboro, Ore. and Grenoble, France-FEI (NASDAQ: FEIC) and CEA-Leti today announced the companies have entered into a three year agreement to characterize advanced semiconductor materials for the 22nm technology node and beyond. European-based CEA-Leti, with its two partners on the...
Read More »FEI and CEA-Leti Enter Joint Agreement to Characterize Advanced Semiconductor Materials
CEA-Leti and FEI expect to address technical roadblocks faced by the industry in moving to 22nm IC devices Hillsboro, Ore. and Grenoble, France-FEI (NASDAQ: FEIC) and CEA-Leti today announced the companies have entered into a three year agreement to characterize advanced semiconductor materials for the 22nm technology node and beyond. European-based CEA-Leti, with its two partners on the...
Read More »Scanning Electron Microscope analyzes gas reservoirs.
Combining scanning electron microscope and focused ion beam technologies with gas chemistries, detectors, and manipulators, Helios NanoLab(TM) DualBeam(TM) System analyzes production characteristics of unconventional gas reservoirs. System images kerogen, porosity, and microstructures in 3D with nanometer-scale resolution. Data are essential to determining potential of reservoir, optimizing...
Read More »Scanning Electron Microscope analyzes gas reservoirs.
Combining scanning electron microscope and focused ion beam technologies with gas chemistries, detectors, and manipulators, Helios NanoLab(TM) DualBeam(TM) System analyzes production characteristics of unconventional gas reservoirs. System images kerogen, porosity, and microstructures in 3D with nanometer-scale resolution. Data are essential to determining potential of reservoir, optimizing...
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