FEI Co.

Optics & Photonics

FEI Receives Titan(TM) Order from Japanese Steelmaker

Steel Researchers to Utilize World's Most Powerful Microscope for Advanced Materials Characterization and Analysis HILLSBORO, Oregon/September 4, 2006-FEI (Nasdaq: FEIC) today announced that Japan's JFE Steel Corporation has ordered a Titan(TM) 80-300 for its research center in Kawasaki. JFE Steel, a leading global supplier of steel products, is the first Japanese customer to order the Titan...

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Optics & Photonics

FIB/SEM System offers nanoscale imaging and analysis.

Helios NanoLab(TM) DualBeam(TM) features ultra-high resolution field emission scanning electron microscope (SEM) column combined with Sidewinder(TM) focused ion beam (FIB) column and gas chemistries to provide imaging resolution and contrast in DualBeam system. Small DualBeam platform enables 3D characterization, analysis, and image reconstruction applications, nano-prototyping (fabrication and...

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Agricultural & Farming Products

FEI Launches Certified Tools Program Globally

New Program Offers Customers Enhanced Flexibility for Purchasing Factory Certified FEI Solutions HILLSBORO, Ore., July 10 / -- FEI Company (NASDAQ:FEIC) has announced the global launch of its Certified Tools program featuring factory-refurbished FEI systems that are fully-tested and warranted to meet original factory specifications. With the Certified Tools program, customers will now have...

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Optics & Photonics

FEI's Titan(TM) S/Tem Achieves Low KV Milestone

1.4 Angstrom Resolution Marks Important Breakthrough for Atomic-Scale Imaging of Light Element Nanomaterials HILLSBORO, Ore, July 31, 2006 --- FEI Company (Nasdaq: FEIC) today announced that scientists at its NanoPort(TM) in Europe have broken another image resolution barrier with the world's most advanced commercially-available microscope, the Titan(TM) 80-300 corrected S/TEM. For the first time...

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Focused Ion Beam System provides circuit edit platform.

Model V600FIB Focused Ion Beam system is offered for debug, failure analysis, and sample preparation for semiconductor devices down to 90 nm, with upgrade path for circuit edit applications for designs below 65 nm. With Sidewinder(TM) 30 kV ion column, application-specific gas delivery system, and 5-axis tilt stage for stable cross sectioning for failure analysis applications, system accommodates...

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Optics & Photonics

Russia Opens New Nanotech Center with FEI Tools

FEI Plays Key Role in Moscow's New Pilot Scientific and Technical Center of Excellence for Nanotechnology Development HILLSBORO, Ore. /June 5, 2006--FEI Company (Nasdaq: FEIC) today announced that three of its systems, including Tecnai(TM) T12 and T30 transmission electron microscopes (TEMs) and a Quanta(TM) 3D DualBeam(TM), have been selected as core enabling tools for Russia's new Pilot...

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Optics & Photonics

FEI's Titan(TM) S/TEM Installed at France's LETI

World's most powerful commercial microscope will aid world-class center and its partners in commercializing semiconductor processes below the 65nm design node HILLSBORO, Oregon/May 16, 2006-France's LETI (Laboratoire d'Electronique de Technologie de l'Information) has become one of the first European sites to install and begin using the world's highest-resolution, commercially-available...

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Laboratory and Research Supplies and Equipment

Japan Electronics Manufacturer Selects FEI System for In-Fab Root Cause Analysis

FEI's DA300 HP DualBeam(TM) to be utilized for unique CCD application HILLSBORO, Ore./May 11, 2006--FEI Company (Nasdaq: FEIC) today announced that a global Japanese electronics manufacturer has selected FEI's DA 300 in-fab defect analyzer for its factory. The advanced automated system will enable critical root cause analysis in a fraction of the time required by other techniques and will be used...

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Optics & Photonics

McMaster University Orders Two FEI Titan(TM) S/TEMs

Systems Will Serve Canada's National Facility for Ultrahigh-Resolution Electron Microscopy HILLSBORO, Ore. /April 19, 2006--FEI Company (Nasdaq: FEIC) today announced that McMaster University, based in Ontario, Canada, has ordered two FEI Titan(TM) S/TEM systems-the world's first commercial systems capable of delivering sub-Ã-...ngstrom resolution-and a multi-year service contract to support...

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Laboratory and Research Supplies and Equipment

FEI's Automated 3D Crystallography Featured at PITTCON

FEI's EBS3 fully-automated electron backscattered diffraction solution delivers rapid serial sectioning and 3D crystal orientation reconstructions of materials HILLSBORO, Ore. /March 13, 2006--FEI Company (Nasdaq: FEIC) will feature its EBS3 DualBeam(TM) solution for rapid serial sectioning and 3D crystallographic reconstructions of materials at this week's Pittcon conference in Orlando. The...

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