FEI Co.
Hillsboro, OR 97124
Wafer Handling System offers sub-45 nm process control.
Expida(TM) 1255S wafer DualBeam(TM) system integrates wafer-level STEM (scanning/transmission electron microscopy) sample preparation with imaging and analysis capabilities. Equipped with ion beam column for preparing TEM samples and electron column with 14-segment STEM detector for high-resolution 30 kV imaging, system ensures correct end-pointing and precise lamella thickness by enabling STEM...
Read More »Microscope and Software facilitate mineral processing.
Combination of Quanta(TM) scanning electron microscope (SEM) and JKTech's Mineral Liberation Analyzer (MLA) software allows evaluation of exploration targets for mining operations. Automated stage control and image acquisition of Quanta SEM enable analysis of at least 5,000 individual particles for concentrated samples and 50,000 or more particles for tailings or low-grade materials. MLA can...
Read More »FEI Unveils World's First Table-Top Scanning Electron Microscope for Advancing Science Education
The PHENOM-ED(TM) Previews on Capitol Hill in Support of Education WASHINGTON, Feb. 28 /-- FEI will demonstrate the world's first tabletop scanning electron microscope (SEM) designed specifically for education on Capitol Hill today. The Phenom-Ed provides magnification up to 20,000x -- far beyond the range of traditional optical microscopes giving students access to micro- and nanoscale worlds...
Read More »Field Emission Gun suits 3D research and development.
Eliminating boundaries imposed by existing high vacuum systems, DualBeam(TM) Quanta(TM) 3D FEG features high-current ion column for rapid, site-specific cross-sections of samples to reveal sub-surface structures and features. System's electron source optimizes SEM imaging, while electron beam current enables high throughput spectroscopy.
Read More »California Nanosystems Institute at UCLA Selects Three Fei Systems
Two Titan(TM) S/TEMs and Tecnai(TM) TEM to Support the University's Electron Imaging Center for NanoMachines at the CNSI JANUARY 9, 2007/Hillsboro, Ore.-The California NanoSystems Institute (CNSI) at UCLA has selected FEI for three advanced transmission electron microscopes for the institute's Electron Imaging Center for NanoMachines (EICN) core laboratory. The systems include a 300-kV Titan(TM)...
Read More »FEI Expands Helios Nanolab(TM) Family for Semi Market
NanoLab 400/400S to be Introduced at SEMICON Japan Giving Users a Complete Range of Advanced Solutions for Semiconductor Labs NOVEMBER 30, 2006/Hillsboro, Ore.-FEI Company (Nasdaq: FEIC) will expand its top-of-the-line Helios NanoLab(TM) family of DualBeams(TM) when it introduces the Helios NanoLab 400 and 400S systems next week at SEMICON Japan. Combining advanced focused ion beam (FIB) and...
Read More »FEI Receives $11.5 Million Order from Technical University of Denmark
Seven Systems to Form the Core of DTU's New Center for Electron Nanoscopy and Pave the Way for Advanced Catalyst Research NOVEMBER 27, 2006/Hillsboro, Ore.-The Technical University of Denmark (DTU) has placed a $11.5 million dollar order for seven FEI microscopes that will form the core of the University's new Center for Electron Nanoscopy (CEN). The order represents the largest product sale ever...
Read More »FIB/SEM Systems are designed for semiconductor labs.
NanoLab(TM) 400/400S feature high resolution field emission scanning electron microscope column combined with Sidewinder(TM) focused ion beam column and gas chemistries. Suited for sub-65 nm node devices, DualBeams(TM) systems offer low-kV SEM resolution to support 3D cross-sectional imaging and analysis. NanoLab 400 comes with high resolution stage/load lock, while Model 400S is equipped with...
Read More »Imperial College London Unveils UK's First Titan (TM) S/TEM
World's Most Powerful Commercially-Available Microscope Provides Access to Atomic-Scale Data for Nanotechnology Research OCTOBER 18, 2006/Hillsboro, Ore.--Imperial College London has unveiled one of the UK's most powerful microscopes, the Titan(TM) 80-300 S/TEM from FEI. It is the world's most powerful commercially-available scanning/transmission electron microscopes and one of the only...
Read More »FEI Company and Malvern Instruments Team
FEI's Quanta(TM) SEMs and Malvern's Advanced Particle Analysis Software Combine to Deliver Ground-breaking Solution for Nanoscale Applications Hillsboro, Ore./September 12, 2006 --- FEI Company (NASDAQ: FEIC) and Malvern Instruments Ltd (Malvern, UK) have entered into a joint development and marketing program for advanced nanoparticle analysis utilizing Malvern's particle image analysis software...
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