Olympus Scientific Solutions America
Waltham, MA 02453
Linear PCM Recorders capture pure sound up to 130 dB SPL.
Designed to capture and playback sound exactly how users experience it, LS-12 features two 90-Read More »
Ultrasonic Thickness Gage offers multiple measurement options.
Compatible with dual- and single-element transducers, handheld 45MG achieves instant readings from one side of material and delivers repeatable measurements. Functionality is enhanced via optional Thru-Coat-® and Echo-to-Echo technology and- time-based B-scan. When used with code-activated single element transducer option, unit can make accurate thickness measurements, with resolution of 0.0001...Read More »
Data Analysis Software supports phased array flaw detectors.
OmniPC is computer-based software program that provides analysis capabilities for inspection data acquired with OmniScan flaw detector. It offers capabilities such as data, reference, and measurement cursors for defect sizing and reporting. OmniPC features readings database for trigonometry, flaw statistics on axes, volumetric position information, and code-based acceptance criteria. Data...Read More »
Classic OM Design Revived into a New State of the Art Digital Camera - the Beginning of the New: Olympus OM-D E-M5
The Olympus E-M5 Unites an Intuitive Built-In Electronic Viewfinder with the World's First*15-Axis Image Stabilization and World's Fastest*2 Autofocusing System inside a Powerfully Portable and Rugged Dustproof and Splashproof Body CENTER VALLEY, Pa., - Today Olympus builds upon the 40-year legacy of the OM SLR film camera series and marks the beginning of the new digital imaging era with the...Read More »
Olympus NDT Launches Free Industrial Tech Guide App for iPhone and iPad
Olympus NDT is pleased to introduce the Industrial Tech Guide App for the iPhone-® and iPad-®. This free Olympus mobile application contains two knowledge-based sections designed for technicians performing ultrasonic flaw detection and X-ray fluorescence (XRF) inspections. Available for download in the Apple Application Store, this easy-to-use Tech Guide App will be a helpful tool for...Read More »
IR Metrology System measures bond parameters of 3DS-ICs.
Utilizing confocal IR laser scanning microscope technology, 3DIR Metrology and Defect Review System measures post bond parameters of 3D stacked integrated circuits, such as overlay alignment accuracy, bonding interface thickness variations, and bonding interface quality. System measures alignment points at selected die of bonded wafers, stores images and data, and summarizes results. Correlation...Read More »
Outstanding Success of International Metrology Conference and Exhibition
Hamburg- Olympus attended the recent International Conference on Metrology and Properties of Engineering Surfaces, where it displayed its advanced measuring confocal laser scanning microscopy, the LEXT OLS4000. Hosted by the National Physical Laboratory (NPL), the event was highly successful with a record number of delegates in attendance. With a focus on surface metrology, surface...Read More »
Imaging Microscopes leverage feature-enhancing software.
FluoView FV1000 confocal laser scanning microscopes and FV1000MPE multiphoton excitation systems are available with FV10-ASW v3.0 software, which incorporates high dynamic range imaging and minimizes signal to noise ratios to produce clear, highly resolved images. Other functionality includes partial stitching with multi area time lapse imaging to allow analysis of specific regions of interest....Read More »
Phased Array Flaw Detector features 10.4 in. touchscreen.
With optimized data storage capacity and transfer rate, OmniScan MX2 provides inspection capabilities for manual and automated phased array applications. Integral 10.4 in. LCD touchscreen facilitates navigation, text input, and parameter setup, while SD card and USB interfaces provide connectivity. Fully compatible with phased array modules already in field, modular instrument comes with all...Read More »
Olympus to Exhibit at International Conference on Metrology
Advancing optical metrology Hamburg - Olympus has today announced that it will be exhibiting at the 13th International Conference on Metrology and Properties of Engineering Surfaces. Hosted by the National Physics Laboratory (NPL), the conference will take place from 12 - 15 April 2011 at the Twickenham Stadium in London. Olympus will be promoting its expertise within the field of metrology,...Read More »