Olympus Scientific Solutions America
Waltham, MA 02453
New AxSEAM Scanner Feature Toolless Probe Holders and Dome-shaped Wheels
ScanDeck™ module feature LED indicators which alert the operator to a lack of couplant and when the scanning speed has exceeded the maximum acquisition rate. Enables fast PA/TOFD screening and targeted TFM inspection without switching probes. Aims to maximize simplicity the job of scanning for the operator.
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New OLYMPUS Stream Version 2.4.3 Compatible with Office 365
Enable users to more precisely choose the areas of the sample they wish to analyze, helping speed up the inspection process of high-purity steel. Features the process of capturing multiple line measurements on a sample for cleaner reporting. Ideal for generating Microsoft Word, Excel and PowerPoint reports as well as works with Microsoft Office 2010, 2013, 2016 and 2019.
Read More »
New Handheld XRF Analyzer Delivers Fast Light Element Detection
Equipped with a silicon drift detector to analyze light elements like magnesium, aluminum, silicon, sulfur and phosphorus in alloys. Offers clear on-screen grade ID and comparison for the light elements Mg, Al and Si in seconds. Continuously performs in temperatures from -10°C to 45°C as well as compatible with accessories like field stand, soil foot, probe shield and holster.
Read More »
New Array Flaw Detectors to Perform Critical Inspections
OmniScan X3 supports advanced training courses. Provides pathway for continued excellence in ultrasonic training programs for the NDT community.
Read More »
New Stream 2.4.2 Software Classifies Individual Fields on Large Scan Area
Includes improved image analysis solution to measure and rate non-metallic inclusion content in high-purity steel. Optimizes Stream software for the SCHOTT VisiLED controller MC 1500, enabling users to control LED ring light illumination on their stereo microscopes. Removes halation caused by LED reflection on the sample surface.
Read More »
New TERRA II and BTX III Mobile XRD Analyzers Feature Small Sample Holder
Features SwiftMin® software which provides automated mineral/phase ID and quantification in real time directly on the analyzer. TERRA II XRD available with battery life up to six hours and a rugged and weatherproof case. BTX III offers analytical performance in a compact design intended for benchtop laboratory analysis.
Read More »
New OmniScan X3 Flaw Detector Makes Analysis and Reporting Fast
Elevates the standard with innovations that improve the entire inspection workflow. Combines the essential tools needed for PAUT inspections such as TOFD, two UT channels, eight groups and 16:64PR, 16:128PR and 32:128PR configurations. Produces geometrically correct images to confirm characterization of flaws identified through conventional phased array techniques and obtain images throughout the...
Read More »
New Vanta Element Analyzer Performs in Temperatures from -10 to 45 degree C
X-ray fluorescence analyzer includes 1 GB microSD™ card for storing results and two USB ports for simple data export. Used in various testing environments, including scrap recycling and metal manufacturing. Compatible with accessories such as field stand, soil foot, probe shield and holster.
Read More »
Olympus Launches IPLEX NX Videoscope Which is Supported by Software Capability and 3 Dimensional Modeling
Used for equipment maintenance or inspecting a component’s quality. Features are 8.4-inch touch screen, 4x wider measurement area, powerful laser diode light source. Offers high-definition imaging and 3D modeling.
Read More »
New DSX1000 Digital Microscope Provides 60 Frames-per-second Image Acquisition
Designed to measure and observe a variety of materials. Offers high- and low-magnification accuracy and precision. Memory function saves user data for quick, easy setup and repeatable image acquisition.
Read More »
New AxSEAM Scanner Feature Toolless Probe Holders and Dome-shaped Wheels
ScanDeck™ module feature LED indicators which alert the operator to a lack of couplant and when the scanning speed has exceeded the maximum acquisition rate. Enables fast PA/TOFD screening and targeted TFM inspection without switching probes. Aims to maximize simplicity the job of scanning for the operator.
Read More »
New OLYMPUS Stream Version 2.4.3 Compatible with Office 365
Enable users to more precisely choose the areas of the sample they wish to analyze, helping speed up the inspection process of high-purity steel. Features the process of capturing multiple line measurements on a sample for cleaner reporting. Ideal for generating Microsoft Word, Excel and PowerPoint reports as well as works with Microsoft Office 2010, 2013, 2016 and 2019.
Read More »
New Handheld XRF Analyzer Delivers Fast Light Element Detection
Equipped with a silicon drift detector to analyze light elements like magnesium, aluminum, silicon, sulfur and phosphorus in alloys. Offers clear on-screen grade ID and comparison for the light elements Mg, Al and Si in seconds. Continuously performs in temperatures from -10°C to 45°C as well as compatible with accessories like field stand, soil foot, probe shield and holster.
Read More »
New Array Flaw Detectors to Perform Critical Inspections
OmniScan X3 supports advanced training courses. Provides pathway for continued excellence in ultrasonic training programs for the NDT community.
Read More »
New Stream 2.4.2 Software Classifies Individual Fields on Large Scan Area
Includes improved image analysis solution to measure and rate non-metallic inclusion content in high-purity steel. Optimizes Stream software for the SCHOTT VisiLED controller MC 1500, enabling users to control LED ring light illumination on their stereo microscopes. Removes halation caused by LED reflection on the sample surface.
Read More »
New TERRA II and BTX III Mobile XRD Analyzers Feature Small Sample Holder
Features SwiftMin® software which provides automated mineral/phase ID and quantification in real time directly on the analyzer. TERRA II XRD available with battery life up to six hours and a rugged and weatherproof case. BTX III offers analytical performance in a compact design intended for benchtop laboratory analysis.
Read More »
New OmniScan X3 Flaw Detector Makes Analysis and Reporting Fast
Elevates the standard with innovations that improve the entire inspection workflow. Combines the essential tools needed for PAUT inspections such as TOFD, two UT channels, eight groups and 16:64PR, 16:128PR and 32:128PR configurations. Produces geometrically correct images to confirm characterization of flaws identified through conventional phased array techniques and obtain images throughout the...
Read More »
New Vanta Element Analyzer Performs in Temperatures from -10 to 45 degree C
X-ray fluorescence analyzer includes 1 GB microSD™ card for storing results and two USB ports for simple data export. Used in various testing environments, including scrap recycling and metal manufacturing. Compatible with accessories such as field stand, soil foot, probe shield and holster.
Read More »
Olympus Launches IPLEX NX Videoscope Which is Supported by Software Capability and 3 Dimensional Modeling
Used for equipment maintenance or inspecting a component’s quality. Features are 8.4-inch touch screen, 4x wider measurement area, powerful laser diode light source. Offers high-definition imaging and 3D modeling.
Read More »
New DSX1000 Digital Microscope Provides 60 Frames-per-second Image Acquisition
Designed to measure and observe a variety of materials. Offers high- and low-magnification accuracy and precision. Memory function saves user data for quick, easy setup and repeatable image acquisition.
Read More »
