Marvin Test Solutions, Inc.
Irvine, CA 92614
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Field Test Set suits military applications.
Portable Model MTS-206 includes 14-slot PXI backplane that supports PXI controller and 13 PXI instruments. Of the 14 slots, 7 accommodate 6U or 3U PXI or cPCI instruments. Remaining 7 slots support only 3U instruments. Design allows space for custom electronics as well as system power supplies. Optional instruments include measurement, stimuli, digital, switching, precision DC sources,...
Read More »Laser Source Simulators test seekers on munitions.
Handheld Models MT1888 and MT1888A are Laser Source/Spot Simulators for use in missile testing and pre-flight checkup of laser-guided munitions such as Hellfire, Hellfire II, AGM-65E, and Paveway. They are field programmable using thumbwheel switches. Users can select any PRF code from 1111 to 1888 (MT1888) or Army PIM codes (Alternate Codes) from 4111 to 4888 (MT1888A), which will cause LSS to...
Read More »I/O Module facilitates in-circuit testing.
Digital GC5930 Programmable Levels I/O Module provides 32 channels of programmable level translation outputs combined with programmable level threshold inputs. It eliminates need to create external custom interface circuits. Output level can be programmed between 0.3 and 9 V. Maximum current per pin is 100 mA and maximum current for any group of 8 pins is 160 mA. Operating frequency is 0-50 MHz....
Read More »Waveform Generator offers versatility in one instrument.
Model GC1300 PCI-based Arbitrary Waveform Generator provides combination of function generator, arbitrary waveform synthesizer and programmable sequencer. It features 125 MS/s sample rate, 1 ppm clock accuracy and stability, 14-bit vertical resolution, and 2 Meg memory depth. Sequencing capability allows linkage of up to 4096 waveform segments and/or bursts into strings. Included ArbConnection...
Read More »Waveform Generators provide multiple functions.
PXI-based Arbitrary Waveform Generators, Models GX1200 and GX1201, provide synergistic combination of function generators, arbitrary waveform synthesizers, and programmable sequencers. GX1200 has sample rate of 50 MS/s, while GX1201 offers sample rate of 100 MS/s. Both feature 14-bit vertical resolution, 10-digit sample clock frequency setting, and 1 ppm clock accuracy and stability....
Read More »PXI Switching Card suits general-purpose applications.
PXI general purpose, low-level switching card model GX6325 has 75 Form-C relays (SPDT) capable of switching 2A @ 220 Vdc/250 Vac. Connections to 6U PXI card are made via 3 DB-78 high-density connectors. It is suitable for all test applications requiring low-level switching.
Read More »Programmable Resistor offers PXI platform.
Model GX1164 multi-channel resistor board provides four programmable resistor channels. Three channels may be programmed from 1 to 64K Ohm with 1 Ohm resolution, and one channel can be programmed from 10 to 640K Ohm with 10 Ohm resolution. Custom resistor ranges and resolutions are also available. On-board EEPROM provides personalized calibration data.
Read More »DC Source offers multi-channel programmable operation.
GX1838 3U PXI DC source provides 8 output channels and 3 programmable 14-bit voltage rails. Each voltage rail can be programmed to output between -9 and +32 V, and can provide current of 100 mA. Rails can also be connected to external input, and Rail C can be connected to on-board programmable electronic load. Each rail may be switched to any of 8 output channels.
Read More »I/O Card supports data rates up to 50 MHz.
GC5050 high-speed dynamic digital I/O card has built-in Algorithmic Sequencer that plugs into any PCI slot and allows users to create loops and branches to manipulate output vectors. It provides real-time digital stimulus and capture with 32 pins per card. Up to 16 cards may be daisy-chained for total of 512 pins. Memory behind each pin is configurable from 256 Kbit to 1 Mbit and is user...
Read More »Test Software simplifies ATE applications.
ATEasy v4.0 test development software and test executive provides all necessary tools to develop and execute any test application in test and measurement applications. Enhancements include framework that helps users create re-usable components modeled after real-world test systems; support for Microsoft's COM, DLL and DDE; simplified test application development process; and modular structure...
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