Tektronix, Inc.

New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection
Test & Measurement

New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection

Enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. Enables testing up to 1100V on any pin to boost throughput by 50 percent or more over competitive systems in power and WBG applications. Offered with KTE 7 software that simplifies and speeds up the migration path and achieves...

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New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection
Test & Measurement

New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection

Enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. Enables testing up to 1100V on any pin to boost throughput by 50 percent or more over competitive systems in power and WBG applications. Offered with KTE 7 software that simplifies and speeds up the migration path and achieves...

Read More »
New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection
Test & Measurement

New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection

Enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. Enables testing up to 1100V on any pin to boost throughput by 50 percent or more over competitive systems in power and WBG applications. Offered with KTE 7 software that simplifies and speeds up the migration path and achieves...

Read More »
New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection
Test & Measurement

New S530 Series Parametric Test System Comes with Built-In Transient Over-Voltage / Over-Current Protection

Enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. Enables testing up to 1100V on any pin to boost throughput by 50 percent or more over competitive systems in power and WBG applications. Offered with KTE 7 software that simplifies and speeds up the migration path and achieves...

Read More »

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