Imagenation Corp.
Beaverton, OR 97005
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Wafer-Life Vibration Monitor features 450 mm form factor.
Designed to meet future fab requirements, AVS450 Wireless Auto Vibration System travels through entire path of wafer to measure vibrations of wafer transfers in X, Y, and Z dimensions during semiconductor processes and fabrications. System reports real-time acceleration data so engineers can identify vibration anomalies. With Model AVS450, users can observe and optimize wafer, cassette, SMIF, and...
Read More »Wafer-Life Vibration Monitor features 450 mm form factor.
Designed to meet future fab requirements, AVS450 Wireless Auto Vibration System travels through entire path of wafer to measure vibrations of wafer transfers in X, Y, and Z dimensions during semiconductor processes and fabrications. System reports real-time acceleration data so engineers can identify vibration anomalies. With Model AVS450, users can observe and optimize wafer, cassette, SMIF, and...
Read More »CyberOptics to Discuss Tool Qualification Capabilities of WaferSense® Airborne Particle Sensor at Semicon West 2012
CyberOptics Semiconductor (www.CyberOpticsSemi.com) will discuss the tool qualification features of its WaferSense-® Airborne Particle Sensor (APS) as it is used to measure the presence and density of airborne particles inside fab tools during Semicon West 2012 in Booth No. 2406. CyberOptics will also display its complete WaferSense family of wireless metrology devices including the Auto...
Read More »CyberOptics to Discuss Tool Qualification Capabilities of WaferSense-® Airborne Particle Sensor at Semicon West 2012
CyberOptics Semiconductor (www.CyberOpticsSemi.com) will discuss the tool qualification features of its WaferSenseÃ-® Airborne Particle Sensor (APS) as it is used to measure the presence and density of airborne particles inside fab tools during Semicon West 2012 in Booth No. 2406. CyberOptics will also display its complete WaferSense family of wireless metrology devices including the Auto...
Read More »CyberOptics Semiconductor's WaferSense® Airborne Particle Sensor Is Finalist for Prism Award
CyberOptics' WaferSense-® Airborne Particle Sensor is a finalist in the Prism Awards presented by SPIE and Photonics Media. The Prism Awardsis an international competition recognizing cutting-edge products that break conventional ideas and improve life through photonics. The program uniquely recognizes scientific innovation among trend-setting technological and industrial categories. The...
Read More »CyberOptics Semiconductor's WaferSense-® Airborne Particle Sensor Is Finalist for Prism Award
CyberOptics' WaferSenseÃ-® Airborne Particle Sensor is a finalist in the Prism Awards presented by SPIE and Photonics Media. The Prism Awardsis an international competition recognizing cutting-edge products that break conventional ideas and improve life through photonics. The program uniquely recognizes scientific innovation among trend-setting technological and industrial categories. The...
Read More »450 mm Wireless Wafer Processing Metrology Sensors Support Next-Generation of Semiconductor Production Processes
CyberOptics Semiconductor offers a line of wireless 450 mm wafer processing metrology sensors to help chipmakers and tool manufacturers qualify next-generation semiconductor production processes. CyberOptics' 450 mm carbon fiber WaferSense-® sensors are designed to obtain precise metrology data to optimize new processing equipment for shrinking 32 nm and 22 nm process tolerances, according to...
Read More »450 mm Wireless Wafer Processing Metrology Sensors Support Next-Generation of Semiconductor Production Processes
CyberOptics Semiconductor offers a line of wireless 450 mm wafer processing metrology sensors to help chipmakers and tool manufacturers qualify next-generation semiconductor production processes. CyberOptics' 450 mm carbon fiber WaferSenseÃ-® sensors are designed to obtain precise metrology data to optimize new processing equipment for shrinking 32 nm and 22 nm process tolerances, according...
Read More »CyberOptics Semiconductor to Discuss Solutions for Semiconductor Tool Qualification at ISMI Manufacturing Week
CyberOptics Semiconductor (www.cyberopticssemi.com) will discuss how a Wireless Particle Counting Wafer Improves Semiconductor Tool Qualification" during ISMI Manufacturing Week 2011 to be held in Austin, TX during October 17 - 21. During ISMI Manufacturing Week, Allyn Jackson, CyberOptics Technical Support Manager, will explain how the WaferSense® Airborne Particle Sensor offers faster, more...
Read More »CyberOptics Semiconductor to Discuss Solutions for Semiconductor Tool Qualification at ISMI Manufacturing Week
CyberOptics Semiconductor (www.cyberopticssemi.com) will discuss how a Wireless Particle Counting Wafer Improves Semiconductor Tool Qualification" during ISMI Manufacturing Week 2011 to be held in Austin, TX during October 17 - 21. During ISMI Manufacturing Week, Allyn Jackson, CyberOptics Technical Support Manager, will explain how the WaferSense-® Airborne Particle Sensor offers faster, more...
Read More »Wafer-Life Vibration Monitor features 450 mm form factor.
Designed to meet future fab requirements, AVS450 Wireless Auto Vibration System travels through entire path of wafer to measure vibrations of wafer transfers in X, Y, and Z dimensions during semiconductor processes and fabrications. System reports real-time acceleration data so engineers can identify vibration anomalies. With Model AVS450, users can observe and optimize wafer, cassette, SMIF, and...
Read More »Wafer-Life Vibration Monitor features 450 mm form factor.
Designed to meet future fab requirements, AVS450 Wireless Auto Vibration System travels through entire path of wafer to measure vibrations of wafer transfers in X, Y, and Z dimensions during semiconductor processes and fabrications. System reports real-time acceleration data so engineers can identify vibration anomalies. With Model AVS450, users can observe and optimize wafer, cassette, SMIF, and...
Read More »CyberOptics to Discuss Tool Qualification Capabilities of WaferSense® Airborne Particle Sensor at Semicon West 2012
CyberOptics Semiconductor (www.CyberOpticsSemi.com) will discuss the tool qualification features of its WaferSense-® Airborne Particle Sensor (APS) as it is used to measure the presence and density of airborne particles inside fab tools during Semicon West 2012 in Booth No. 2406. CyberOptics will also display its complete WaferSense family of wireless metrology devices including the Auto...
Read More »CyberOptics to Discuss Tool Qualification Capabilities of WaferSense-® Airborne Particle Sensor at Semicon West 2012
CyberOptics Semiconductor (www.CyberOpticsSemi.com) will discuss the tool qualification features of its WaferSenseÃ-® Airborne Particle Sensor (APS) as it is used to measure the presence and density of airborne particles inside fab tools during Semicon West 2012 in Booth No. 2406. CyberOptics will also display its complete WaferSense family of wireless metrology devices including the Auto...
Read More »CyberOptics Semiconductor's WaferSense® Airborne Particle Sensor Is Finalist for Prism Award
CyberOptics' WaferSense-® Airborne Particle Sensor is a finalist in the Prism Awards presented by SPIE and Photonics Media. The Prism Awardsis an international competition recognizing cutting-edge products that break conventional ideas and improve life through photonics. The program uniquely recognizes scientific innovation among trend-setting technological and industrial categories. The...
Read More »CyberOptics Semiconductor's WaferSense-® Airborne Particle Sensor Is Finalist for Prism Award
CyberOptics' WaferSenseÃ-® Airborne Particle Sensor is a finalist in the Prism Awards presented by SPIE and Photonics Media. The Prism Awardsis an international competition recognizing cutting-edge products that break conventional ideas and improve life through photonics. The program uniquely recognizes scientific innovation among trend-setting technological and industrial categories. The...
Read More »450 mm Wireless Wafer Processing Metrology Sensors Support Next-Generation of Semiconductor Production Processes
CyberOptics Semiconductor offers a line of wireless 450 mm wafer processing metrology sensors to help chipmakers and tool manufacturers qualify next-generation semiconductor production processes. CyberOptics' 450 mm carbon fiber WaferSense-® sensors are designed to obtain precise metrology data to optimize new processing equipment for shrinking 32 nm and 22 nm process tolerances, according to...
Read More »450 mm Wireless Wafer Processing Metrology Sensors Support Next-Generation of Semiconductor Production Processes
CyberOptics Semiconductor offers a line of wireless 450 mm wafer processing metrology sensors to help chipmakers and tool manufacturers qualify next-generation semiconductor production processes. CyberOptics' 450 mm carbon fiber WaferSenseÃ-® sensors are designed to obtain precise metrology data to optimize new processing equipment for shrinking 32 nm and 22 nm process tolerances, according...
Read More »CyberOptics Semiconductor to Discuss Solutions for Semiconductor Tool Qualification at ISMI Manufacturing Week
CyberOptics Semiconductor (www.cyberopticssemi.com) will discuss how a Wireless Particle Counting Wafer Improves Semiconductor Tool Qualification" during ISMI Manufacturing Week 2011 to be held in Austin, TX during October 17 - 21. During ISMI Manufacturing Week, Allyn Jackson, CyberOptics Technical Support Manager, will explain how the WaferSense® Airborne Particle Sensor offers faster, more...
Read More »CyberOptics Semiconductor to Discuss Solutions for Semiconductor Tool Qualification at ISMI Manufacturing Week
CyberOptics Semiconductor (www.cyberopticssemi.com) will discuss how a Wireless Particle Counting Wafer Improves Semiconductor Tool Qualification" during ISMI Manufacturing Week 2011 to be held in Austin, TX during October 17 - 21. During ISMI Manufacturing Week, Allyn Jackson, CyberOptics Technical Support Manager, will explain how the WaferSense-® Airborne Particle Sensor offers faster, more...
Read More »