Veeco Metrology
Tucson, AZ 85706
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Optical Profiler offers Dynamic MEMS measurement option.
WykoÃ-® NT1100 characterizes micro-devices in 3D as they actuate for assessment of true device functionality and measurement of in- and out-of-plane dimensions. System offers dynamic and static measurement of rough surfaces on one platform. Non-contact, white light interferometry provides Angstrom-resolution measurement of features from 0.1-2 mm in height. System includes custom illumination...
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Optical Profiler takes surface measurements.
Wyko(R) NT1100 takes surface measurements with Angstrom resolution and stitching automation for large area measurements. Non-contact interferometry is used for 3D surface measurements from 0.1 to 2 mm. Software provides data analysis, interactive displays, data filtering, and statistical database for production measurement. Applications include R&D, quality inspection, failure analysis and...
Read More »Optical Microscope ensures accurate and repeatable data.
Aurora-3(TM) Near-Field Scanning Optical Microscope (NSOM) offers tuning-fork technology, split light path, and open-architecture. It combines optical characterization with scanning probe microscopy (SPM) technology. Real-time linearized scanner provides accurate, one-step tip positioning. Optional atomic force microscopy capabilities are possible.
Read More »Sensor System detects chemical agents in air or fluids.
Scentris(TM) works by utilizing cantilever surface coated with material that has selective affinity for given target substance. Setup uses high-resolution, laser array-based detection scheme that enables measurement of cantilever deflections down to nanometer-scale and measures sub-hertz resonant frequency shifts on cantilevers with resonant frequencies up to 1 MHz. Software for Scentris is...
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Spectroscopy System aids in biology and materials research.
MultiMode(TM) PicoForce(TM) Scanning Probe Microscope (SPM) Control System, combined with software developed for force spectroscopy, enables force measurements and manipulation of biological or material samples at pico-Newton level. System utilizes atomic force microscope, scanner with closed-loop control of Z-axis that controls tip-sample separation, software GUI, and handheld tool with...
Read More »
Optical Profiler offers Dynamic MEMS measurement option.
WykoÃ-® NT1100 characterizes micro-devices in 3D as they actuate for assessment of true device functionality and measurement of in- and out-of-plane dimensions. System offers dynamic and static measurement of rough surfaces on one platform. Non-contact, white light interferometry provides Angstrom-resolution measurement of features from 0.1-2 mm in height. System includes custom illumination...
Read More »
Optical Profiler takes surface measurements.
Wyko(R) NT1100 takes surface measurements with Angstrom resolution and stitching automation for large area measurements. Non-contact interferometry is used for 3D surface measurements from 0.1 to 2 mm. Software provides data analysis, interactive displays, data filtering, and statistical database for production measurement. Applications include R&D, quality inspection, failure analysis and...
Read More »Optical Microscope ensures accurate and repeatable data.
Aurora-3(TM) Near-Field Scanning Optical Microscope (NSOM) offers tuning-fork technology, split light path, and open-architecture. It combines optical characterization with scanning probe microscopy (SPM) technology. Real-time linearized scanner provides accurate, one-step tip positioning. Optional atomic force microscopy capabilities are possible.
Read More »Sensor System detects chemical agents in air or fluids.
Scentris(TM) works by utilizing cantilever surface coated with material that has selective affinity for given target substance. Setup uses high-resolution, laser array-based detection scheme that enables measurement of cantilever deflections down to nanometer-scale and measures sub-hertz resonant frequency shifts on cantilevers with resonant frequencies up to 1 MHz. Software for Scentris is...
Read More »
Spectroscopy System aids in biology and materials research.
MultiMode(TM) PicoForce(TM) Scanning Probe Microscope (SPM) Control System, combined with software developed for force spectroscopy, enables force measurements and manipulation of biological or material samples at pico-Newton level. System utilizes atomic force microscope, scanner with closed-loop control of Z-axis that controls tip-sample separation, software GUI, and handheld tool with...
Read More »