Veeco Instruments Inc. Corporate Headquarters
Woodbury, NY 11797
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3D Optical Surface Profiler suits wide range of applications.
Based on white light interferometry (WLI) technology, ContourGT(TM) Surface Metrology Product Family addresses range of production QA/QC and R&D precision machining and manufacturing applications within high brightness LED, solar, ophthalmic, semiconductor, medical device, and academic research markets. High brightness dual-LED illumination facilitates precision, non-contact, 3D surface...
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Atomic Force Microscope suits physical and life sciences.
DimensionÃ-® Edge(TM) AFM System provides seamless path from sample placement through optical identification of target region, and from AFM survey mode to zoomed-in feature identification. Closed-loop and drift-compensated stage promotes productivity and accuracy, and low noise levels permit collection of fine details needed for proper material identification. Imaging and single-point...
Read More »Veeco MOCVD Tools Selected for ROY HB-LED Capacity Expansion at Xiamen Sanan OptoElectronics in China
WOODBURY, N.Y--Nov. 1, 2007--Veeco Instruments Inc. (Nasdaq: VECO), announced today that two recently purchased TurboDiscÃ-® E450(TM) As/P Metal Organic Chemical Vapor Deposition (MOCVD) Systems are being used by Xiamen Sanan OptoElectronics of Xiamen, China to expand their capacity of red, yellow and orange (ROY) high brightness light emitting diodes (HB-LEDs). Mr. Kechuang Lin, General...
Read More »Veeco Ships 150th Dektak 150 Surface Profiler
Nov 27, 2007 Woodbury, NY - November 27, 2007 - Veeco Instruments Inc. (Nasdaq: VECO), a leading supplier of instrumentation to the nanoscience community, today announced the shipment of the 150th DektakÃ-® 150 surface profiler. Introduced on November 30, 2006, the Dektak 150 has been widely accepted as a superior solution for measuring thin film thickness, stress and surface roughness and...
Read More »Veeco Receives Orders for Five MBE Systems
Oct 24, 2007 St. Paul, MN, October 24, 2007-Veeco Instruments Inc. (Nasdaq: VECO) announced today that it has received five orders during the third quarter of 2007 for its Molecular Beam Epitaxy (MBE) systems. The orders extend across the complete Veeco product line including an R&D GEN930(TM) system, two pilot-production GEN20(TM) systems, and two production GEN200Ã-® systems. These systems...
Read More »Profiler offers programmable stylus profiling.
DektakÃ-® 8 Advanced Development Profiler, with Low-Inertia Sensor 3 head, provides accurate characterization of MEMS, semiconductors, data storage devices, and other surfaces. It offers dual camera optics; 7.5 angstrom, 1 sigma step height repeatability; and vertical range of up to 1 mm. Overhead gantry allows for long scan roughness, planarity, and flatness measurements on samples up to 200...
Read More »Microscopes enable in-plane anisotropic materials analysis.
MultiModeÃ-® and Dimension(TM) scanning probe microscopes use Torsional Resonance Mode(TM) (TRmode(TM)), which measures tip-sample interactions through torsional resonance of microscope cantilever to provide lateral characterization of sample surfaces. TRmode can be used in conjunction with TappingMode(TM), offering researchers complementary lateral and vertical data for virtually every SPM...
Read More »AFM System provides imaging at up to 300-
EnviroScope(TM) Atomic Force Microscope System combines hermetically sealed sample chamber with modular environmental controls to provide atomic force microcopy scanning under non-ambient vacuum, gas, and liquid environments. Scanner head is based on Dimension(TM) AFM head, and includes piezoelectric tube scanner, laser, and quadrature optical detector. EnviroScope comes with NanoScopeÃ-®...
Read More »
3D Optical Surface Profiler suits wide range of applications.
Based on white light interferometry (WLI) technology, ContourGT(TM) Surface Metrology Product Family addresses range of production QA/QC and R&D precision machining and manufacturing applications within high brightness LED, solar, ophthalmic, semiconductor, medical device, and academic research markets. High brightness dual-LED illumination facilitates precision, non-contact, 3D surface...
Read More »
Atomic Force Microscope suits physical and life sciences.
DimensionÃ-® Edge(TM) AFM System provides seamless path from sample placement through optical identification of target region, and from AFM survey mode to zoomed-in feature identification. Closed-loop and drift-compensated stage promotes productivity and accuracy, and low noise levels permit collection of fine details needed for proper material identification. Imaging and single-point...
Read More »Veeco MOCVD Tools Selected for ROY HB-LED Capacity Expansion at Xiamen Sanan OptoElectronics in China
WOODBURY, N.Y--Nov. 1, 2007--Veeco Instruments Inc. (Nasdaq: VECO), announced today that two recently purchased TurboDiscÃ-® E450(TM) As/P Metal Organic Chemical Vapor Deposition (MOCVD) Systems are being used by Xiamen Sanan OptoElectronics of Xiamen, China to expand their capacity of red, yellow and orange (ROY) high brightness light emitting diodes (HB-LEDs). Mr. Kechuang Lin, General...
Read More »Veeco Ships 150th Dektak 150 Surface Profiler
Nov 27, 2007 Woodbury, NY - November 27, 2007 - Veeco Instruments Inc. (Nasdaq: VECO), a leading supplier of instrumentation to the nanoscience community, today announced the shipment of the 150th DektakÃ-® 150 surface profiler. Introduced on November 30, 2006, the Dektak 150 has been widely accepted as a superior solution for measuring thin film thickness, stress and surface roughness and...
Read More »Veeco Receives Orders for Five MBE Systems
Oct 24, 2007 St. Paul, MN, October 24, 2007-Veeco Instruments Inc. (Nasdaq: VECO) announced today that it has received five orders during the third quarter of 2007 for its Molecular Beam Epitaxy (MBE) systems. The orders extend across the complete Veeco product line including an R&D GEN930(TM) system, two pilot-production GEN20(TM) systems, and two production GEN200Ã-® systems. These systems...
Read More »Veeco Appoints William Tomeo EVP, Worldwide Sales and Service
WOODBURY, N.Y -- Oct. 9, 2007--Veeco Instruments Inc. (Nasdaq: VECO) today announced that it has appointed William A. Tomeo, 56, to the position of Executive Vice President of Worldwide Sales and Service, which includes global field sales, account management, customer service and field support for all domestic and international Veeco customers. Mr. Tomeo brings to Veeco over 35 years of sales,...
Read More »Profiler offers programmable stylus profiling.
DektakÃ-® 8 Advanced Development Profiler, with Low-Inertia Sensor 3 head, provides accurate characterization of MEMS, semiconductors, data storage devices, and other surfaces. It offers dual camera optics; 7.5 angstrom, 1 sigma step height repeatability; and vertical range of up to 1 mm. Overhead gantry allows for long scan roughness, planarity, and flatness measurements on samples up to 200...
Read More »Microscopes enable in-plane anisotropic materials analysis.
MultiModeÃ-® and Dimension(TM) scanning probe microscopes use Torsional Resonance Mode(TM) (TRmode(TM)), which measures tip-sample interactions through torsional resonance of microscope cantilever to provide lateral characterization of sample surfaces. TRmode can be used in conjunction with TappingMode(TM), offering researchers complementary lateral and vertical data for virtually every SPM...
Read More »AFM System provides imaging at up to 300-
EnviroScope(TM) Atomic Force Microscope System combines hermetically sealed sample chamber with modular environmental controls to provide atomic force microcopy scanning under non-ambient vacuum, gas, and liquid environments. Scanner head is based on Dimension(TM) AFM head, and includes piezoelectric tube scanner, laser, and quadrature optical detector. EnviroScope comes with NanoScopeÃ-®...
Read More »