Micro Control

Burn-In System targets medium power devices.
Laboratory and Research Supplies and Equipment

Burn-In System targets medium power devices.

Featuring individual temperature control per DUT for 24 devices up to 20 W, LC-2 Logic Burn-In with Test System is suited for applications in engineering characterization, life testing, and production screening of logic devices. System accommodates up to 64 burn-in boards sized at 12.3 x 24 in. It includes 5 individually programmable power supplies per burn-in board, 16 pattern and power zones,...

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Burn-In System targets medium power devices.
Laboratory and Research Supplies and Equipment

Burn-In System targets medium power devices.

Featuring individual temperature control per DUT for 24 devices up to 20 W, LC-2 Logic Burn-In with Test System is suited for applications in engineering characterization, life testing, and production screening of logic devices. System accommodates up to 64 burn-in boards sized at 12.3 x 24 in. It includes 5 individually programmable power supplies per burn-in board, 16 pattern and power zones,...

Read More »
Burn-In System adapts to other vendor's boards.
Test & Measurement

Burn-In System adapts to other vendor's boards.

(Minneapolis, MN) Micro Control Company announces that it will be exhibiting its new LC-1 Logic Burn-In with Test System at SEMICON West 2007. Stop by booth #7047 on Level 1 of Moscone West to see the latest burn-in innovation from Micro Control Company. The LC-1 is a sophisticated, low cost, full test capable, production burn-in system ideally suited for applications in engineering...

Read More »
Burn-In System adapts to other vendor's boards.
Test & Measurement

Burn-In System adapts to other vendor's boards.

(Minneapolis, MN) Micro Control Company announces that it will be exhibiting its new LC-1 Logic Burn-In with Test System at SEMICON West 2007. Stop by booth #7047 on Level 1 of Moscone West to see the latest burn-in innovation from Micro Control Company. The LC-1 is a sophisticated, low cost, full test capable, production burn-in system ideally suited for applications in engineering...

Read More »
Burn-In System offers scan testing.
Test & Measurement

Burn-In System offers scan testing.

(Minneapolis, MN) Micro Control Company announces the new LC-1 Logic Burn-In with Test System. The LC-1 is a sophisticated burn-in-with-test system suited for applications in engineering characterization, life testing, and production screening of low-power logic devices. The LC-1 offers scan testing during burn-in making it useful in meeting JTAG requirements. A unique feature of the LC-1 is its...

Read More »
Burn-In System offers scan testing.
Test & Measurement

Burn-In System offers scan testing.

(Minneapolis, MN) Micro Control Company announces the new LC-1 Logic Burn-In with Test System. The LC-1 is a sophisticated burn-in-with-test system suited for applications in engineering characterization, life testing, and production screening of low-power logic devices. The LC-1 offers scan testing during burn-in making it useful in meeting JTAG requirements. A unique feature of the LC-1 is its...

Read More »
Burn-In System offers memory and logic testing capabilities.
Test & Measurement

Burn-In System offers memory and logic testing capabilities.

LM-1 Logic and Memory Burn-In System has system capacity of 1,536 devices when individual temperature control is required or 6,400 device capacity when conventional burn-in cycle is run. Burn-in-with-test system features 300 A current per burn-in board, programmable temperature control up to 150-ºC, and scan mode vector memory up to 1 G deep. Handling up to 32 burn-in boards, system can be...

Read More »
Burn-In System offers memory and logic testing capabilities.
Test & Measurement

Burn-In System offers memory and logic testing capabilities.

LM-1 Logic and Memory Burn-In System has system capacity of 1,536 devices when individual temperature control is required or 6,400 device capacity when conventional burn-in cycle is run. Burn-in-with-test system features 300 A current per burn-in board, programmable temperature control up to 150Â-ºC, and scan mode vector memory up to 1 G deep. Handling up to 32 burn-in boards, system can be...

Read More »
Burn-In System targets medium power devices.
Laboratory and Research Supplies and Equipment

Burn-In System targets medium power devices.

Featuring individual temperature control per DUT for 24 devices up to 20 W, LC-2 Logic Burn-In with Test System is suited for applications in engineering characterization, life testing, and production screening of logic devices. System accommodates up to 64 burn-in boards sized at 12.3 x 24 in. It includes 5 individually programmable power supplies per burn-in board, 16 pattern and power zones,...

Read More »
Burn-In System targets medium power devices.
Laboratory and Research Supplies and Equipment

Burn-In System targets medium power devices.

Featuring individual temperature control per DUT for 24 devices up to 20 W, LC-2 Logic Burn-In with Test System is suited for applications in engineering characterization, life testing, and production screening of logic devices. System accommodates up to 64 burn-in boards sized at 12.3 x 24 in. It includes 5 individually programmable power supplies per burn-in board, 16 pattern and power zones,...

Read More »
Burn-In System adapts to other vendor's boards.
Test & Measurement

Burn-In System adapts to other vendor's boards.

(Minneapolis, MN) Micro Control Company announces that it will be exhibiting its new LC-1 Logic Burn-In with Test System at SEMICON West 2007. Stop by booth #7047 on Level 1 of Moscone West to see the latest burn-in innovation from Micro Control Company. The LC-1 is a sophisticated, low cost, full test capable, production burn-in system ideally suited for applications in engineering...

Read More »
Burn-In System adapts to other vendor's boards.
Test & Measurement

Burn-In System adapts to other vendor's boards.

(Minneapolis, MN) Micro Control Company announces that it will be exhibiting its new LC-1 Logic Burn-In with Test System at SEMICON West 2007. Stop by booth #7047 on Level 1 of Moscone West to see the latest burn-in innovation from Micro Control Company. The LC-1 is a sophisticated, low cost, full test capable, production burn-in system ideally suited for applications in engineering...

Read More »
Burn-In System offers scan testing.
Test & Measurement

Burn-In System offers scan testing.

(Minneapolis, MN) Micro Control Company announces the new LC-1 Logic Burn-In with Test System. The LC-1 is a sophisticated burn-in-with-test system suited for applications in engineering characterization, life testing, and production screening of low-power logic devices. The LC-1 offers scan testing during burn-in making it useful in meeting JTAG requirements. A unique feature of the LC-1 is its...

Read More »
Burn-In System offers scan testing.
Test & Measurement

Burn-In System offers scan testing.

(Minneapolis, MN) Micro Control Company announces the new LC-1 Logic Burn-In with Test System. The LC-1 is a sophisticated burn-in-with-test system suited for applications in engineering characterization, life testing, and production screening of low-power logic devices. The LC-1 offers scan testing during burn-in making it useful in meeting JTAG requirements. A unique feature of the LC-1 is its...

Read More »
Burn-In System offers memory and logic testing capabilities.
Test & Measurement

Burn-In System offers memory and logic testing capabilities.

LM-1 Logic and Memory Burn-In System has system capacity of 1,536 devices when individual temperature control is required or 6,400 device capacity when conventional burn-in cycle is run. Burn-in-with-test system features 300 A current per burn-in board, programmable temperature control up to 150-ºC, and scan mode vector memory up to 1 G deep. Handling up to 32 burn-in boards, system can be...

Read More »
Burn-In System offers memory and logic testing capabilities.
Test & Measurement

Burn-In System offers memory and logic testing capabilities.

LM-1 Logic and Memory Burn-In System has system capacity of 1,536 devices when individual temperature control is required or 6,400 device capacity when conventional burn-in cycle is run. Burn-in-with-test system features 300 A current per burn-in board, programmable temperature control up to 150Â-ºC, and scan mode vector memory up to 1 G deep. Handling up to 32 burn-in boards, system can be...

Read More »

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