Aehr Test Systems
400-T Kato Terrace
Fremont, CA 94539
Fremont, CA 94539
Full Wafer Parallel Tester suits IC manufacturers.
Designed to help manufacturers increase throughput, FOX-1 full wafer contact test and burn-in system can test entire wafer of devices with single touchdown or be utilized for short-duration burn-in and test. Solution combines full wafer contact, massively parallel test, and Design For Test (DFT) technologies.
Read More »Full Wafer Parallel Tester suits IC manufacturers.
Designed to help manufacturers increase throughput, FOX-1 full wafer contact test and burn-in system can test entire wafer of devices with single touchdown or be utilized for short-duration burn-in and test. Solution combines full wafer contact, massively parallel test, and Design For Test (DFT) technologies.
Read More »