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        <title>ThomasNet Industrial Newsroom - </title>
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            <title>Metrology Tools measure thin transparent films.</title>
            <link>http://news.thomasnet.com/fullstory/486804</link>
            <description>
Utilizing FOCUS(TM) beam ellipsometry, S3000(TM) (300 mm) and S2000(TM) (200 mm) measure transparent films throughout device fabrication process. Laser light sources are used for optimal accuracy, stability, spot size, and tool-to-tool matching. Also provided, optional deep UV and visible reflectometry capabilities offer flexibility in addressing various applications throughout fabrication. Built on Vanguard(TM) platform, products incorporate Cognex&amp;#174; PatMAX&amp;#174; geometric pattern-matching technology.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/laboratory-research-supplies-equipment' target='_blank''&gt;Laboratory and Research Supplies and Equipment&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/metrology-equipment-51125151-1.html' target='_blank''&gt;Metrology Equipment&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/metrology-instruments-40642605-1.html' target='_blank''&gt;Metrology Instruments&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/ellipsometers-25837006-1.html' target='_blank''&gt;Ellipsometers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet Industrial Newsroom)</author>
            <pubDate>Mon, 10 Jul 2006 08:08:29 -0500</pubDate>
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