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        <title>ThomasNet Industrial Newsroom - </title>
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        <item>
            <title>Transient Capture Module provides time stamping.</title>
            <link>http://news.thomasnet.com/fullstory/569004</link>
            <description>
Equipped with 16 input channels, Model EX1200-7416 can continuously monitor variety of analog and discrete signals up to 100 V. Each channel has 8-bit DAC that can be independently programmed to set trip level. Model EX1200-7416 also detects transients that cannot normally be captured by typical DMM or scanning measurement system. As part of EX1200 LXI Class A instrument series, module records events with IEEE 1588 time codes to provide precise correlation of event/time data.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/electronic-components-devices' target='_blank''&gt;Electronic Components and Devices&lt;/a&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/voltage-comparators-16731200-1.html' target='_blank''&gt;Voltage Comparators&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/analog-comparators-16700700-1.html' target='_blank''&gt;Analog Comparators&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/transient-analyzers-1670108-1.html' target='_blank''&gt;Transient Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/i-o-modules-52100344-1.html' target='_blank''&gt;I/O Modules&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Tue, 24 Nov 2009 08:33:52 -0500</pubDate>
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        <item>
            <title>Metrology Tool provides composition and thickness measurement.</title>
            <link>http://news.thomasnet.com/fullstory/568972</link>
            <description>
Consisting of atmospheric in-line x-ray fluorescence metrology tool platform, System SMX-ILH provides composition and thickness measurements for thin film solar PV metal film stacks on flexible roll to roll substrates such as stainless steel, aluminum, and polyimide or rigid substrates such as float glass. Remote SMX-ILH models are designed to measure in one static location or across gradient. Typical measurement applications include Mo thickness and all CIGS combinations.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/laboratory-research-supplies-equipment' target='_blank''&gt;Laboratory and Research Supplies and Equipment&lt;/a&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/metrology-equipment-51125151-1.html' target='_blank''&gt;Metrology Equipment&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/metrology-instruments-40642605-1.html' target='_blank''&gt;Metrology Instruments&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/xray-fluorescence-xrf-analyzers-1671544-1.html' target='_blank''&gt;X-Ray Fluorescence (XRF) Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Tue, 24 Nov 2009 08:33:48 -0500</pubDate>
        </item>
        <item>
            <title>Residual Gas Analyzers feature web-enabled design.</title>
            <link>http://news.thomasnet.com/fullstory/567683</link>
            <description>
Featuring optimized electronics platform for data acquisition, Microvision 2 and e-Vision 2 offer stability for e-diagnostic, process monitoring, and general vacuum trouble-shooting applications. Ethernet connectivity enables users to access data from anywhere on TCP-IP network, providing solution to wide-scale multi-RGA installations. RGAs are available with variety of software control systems, including built-in web application, recipe-driven Process Eye Professional, and TOOLweb RGA.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/residual-analyzers-1661909-1.html' target='_blank''&gt;Residual Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/gas-analyzers-1651801-1.html' target='_blank''&gt;Gas Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Fri, 23 Oct 2009 08:35:43 -0500</pubDate>
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        <item>
            <title>High-Voltage Differential Probes offer 10:1 attenuation.</title>
            <link>http://news.thomasnet.com/fullstory/830055</link>
            <description>
With ability to provide general-purpose differential signal measurements, Agilent N2792A and N2793A differential probes have input resistance of 1 M&amp;lt;font face='Symbol'&amp;gt;W&amp;lt;/font&amp;gt; (for N2792A) and 200 k&amp;lt;font face='Symbol'&amp;gt;W&amp;lt;/font&amp;gt; (for N2793A) and low input capacitance of 3.5 pF (for N2792A) and 1 pF (for N2793A) to minimize circuit loading. It can be powered by USB port on scope or computer, or 9 V internal battery. They are compatible with any oscilloscope with 50 &amp;lt;font face='Symbol'&amp;gt;W&amp;lt;/font&amp;gt; BNC input.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/differential-analyzers-1650407-1.html' target='_blank''&gt;Differential Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/probes-63550404-1.html' target='_blank''&gt;Probes&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Fri, 16 Oct 2009 08:40:40 -0500</pubDate>
        </item>
        <item>
            <title>Zeta Potential Measurement Cell handles concentrated samples.</title>
            <link>http://news.thomasnet.com/fullstory/566550</link>
            <description>
Designed for Zetasizer Nano particle characterization system, ZEN1010 enables measurement in samples up to 40% w/v. Design incorporates minimized optical path length and takes just 150 &amp;#181;l sample in measurement area. Although it operates as standard cell, ZEN1010 allows zeta potential measurements in highly concentrated samples. By requiring less sample dilution, it supports optimized maintenance of pH and chemical structure of sample for directly relevant zeta potential measurement.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/laboratory-research-supplies-equipment' target='_blank''&gt;Laboratory and Research Supplies and Equipment&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/test-cells-12740601-1.html' target='_blank''&gt;Test Cells&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/zeta-potential-instruments-96087440-1.html' target='_blank''&gt;Zeta Potential Instruments&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/zeta-potential-analyzers-1671577-1.html' target='_blank''&gt;Zeta Potential Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Fri, 02 Oct 2009 08:29:21 -0500</pubDate>
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        <item>
            <title>XRF System measures thickness of photovoltaic depositions.</title>
            <link>http://news.thomasnet.com/fullstory/566283</link>
            <description>
Utilizing X-ray fluorescence, it-situ System SMX-ISI provides composition and thickness measurements for thin film solar PV metal film stacks on flexible roll to roll substrates such as stainless steel, aluminum, and polyimide or rigid substrates such as float glass. Typical measurement applications include Mo thickness and all CIGS combinations. System can be integrated into any vacuum deposition tool, vacuum process station, or point of vacuum process line. 
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/sensors-monitors-transducers' target='_blank''&gt;Sensors, Monitors and Transducers&lt;/a&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/green-clean' target='_blank''&gt;Green &amp; Clean&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/thickness-measurement-equipment-85371110-1.html' target='_blank''&gt;Thickness Measurement Equipment&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/film-thickness-meters-50970979-1.html' target='_blank''&gt;Film Thickness Meters&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/fluorescence-analysis-equipment-30582605-1.html' target='_blank''&gt;Fluorescence Analysis Equipment&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/xray-fluorescence-xrf-analyzers-1671544-1.html' target='_blank''&gt;X-Ray Fluorescence (XRF) Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Mon, 28 Sep 2009 08:24:31 -0500</pubDate>
        </item>
        <item>
            <title>Signal Analyzer suits high channel count applications.</title>
            <link>http://news.thomasnet.com/fullstory/829376</link>
            <description>
Providing 20 input channels with direct integrated electronic piezoelectric (IEPE) support, USB-based 672u offers &amp;#177;40 V input range and can accommodate variety of analog input types including accelerometer, velomiter, proximity probe, microphone, or tachometer. Each analog input features 24-bit delta sigma ADC. Including 4 mA bias current with AC coupling for IEPE sensors, product suits rotating machine analysis, predictive maintenance, and modal analysis applications.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/multichannel-analyzers-1653807-1.html' target='_blank''&gt;Multichannel Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/vibration-analyzers-1671007-1.html' target='_blank''&gt;Vibration Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/signal-analyzers-1662204-1.html' target='_blank''&gt;Signal Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Tue, 08 Sep 2009 08:32:43 -0500</pubDate>
        </item>
        <item>
            <title>Mass Spectrometer occupies just 73 cm of bench space.</title>
            <link>http://news.thomasnet.com/fullstory/564485</link>
            <description>
Suited for complex samples such as food, wastewater, and soil digests, Series 7700 Inductively Coupled Plasma - Mass Spectrometer trace element analyzer utilizes redesigned ion lens to minimize background noise across mass range. Octopole Reaction System, featuring helium collision mode, provides interference removal, especially for complex and unknown sample types. ICP-MS MassHunter software offers Expert Autotune, One Click Plasma Setting, and Batch-at-a-Glance real-time data review.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/mass-spectrometers-76591502-1.html' target='_blank''&gt;Mass Spectrometers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/trace-analyzers-1663806-1.html' target='_blank''&gt;Trace Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Tue, 18 Aug 2009 08:43:54 -0500</pubDate>
        </item>
        <item>
            <title>PCM Channel Analyzer is multi-functional and portable.</title>
            <link>http://news.thomasnet.com/fullstory/828541</link>
            <description>
Used for measuring PCM devices, digital switches, carrier wave communication devices, and VoIP devices, model 2038 features high resolution color LCD, flexible control modes, and Windows style interface. It supports equal step sequence of frequency spots or customized spots where number of spots is selectable. With remote control via USB or Ethernet interface, device allows users to develop and design voice channel measurement/control systems under variety of different conditions.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/communications-testers-84475003-1.html' target='_blank''&gt;Communications Testers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/pulse-analyzers-1661404-1.html' target='_blank''&gt;Pulse Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/signal-analyzers-1662204-1.html' target='_blank''&gt;Signal Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Tue, 28 Jul 2009 08:27:33 -0500</pubDate>
        </item>
        <item>
            <title>Multi-channel Analyzer works with scintillation detectors.</title>
            <link>http://news.thomasnet.com/fullstory/563673</link>
            <description>
Completely operable without PC, DigiDART-LF provides users with portable SMART multi-channel analyzer for sodium iodide, lanthanum bromide, and other scintillation detectors. Various measurements can be performed directly in-field or on-site, and internal memory stores spectra. Built-in LCD and control keypad create live display as data is acquired, while design promotes digital stability, optimized data throughput rates, and up to 12 hr of operation from one battery charge.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/optics-photonics' target='_blank''&gt;Optics and Photonics&lt;/a&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/spectrum-analyzers-1662600-1.html' target='_blank''&gt;Spectrum Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/multichannel-analyzers-1653807-1.html' target='_blank''&gt;Multichannel Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Mon, 27 Jul 2009 08:30:20 -0500</pubDate>
        </item>
        <item>
            <title>XRD/XRF Analyzer performs solid fat content (SFC) analysis.</title>
            <link>http://news.thomasnet.com/fullstory/828368</link>
            <description>
Capable of measuring 3 distinct polymorphic TGA phases; alpha, beta, and beta-prime, BTX benchtop XRD/XRF analyzer can be positioned close to production process for resolution of issues arising when changing process parameters or raw materials. Based on simultaneous collection of X-ray pattern, system analyzes and identifies key phases in just 30 sec. Analyzer is suited for manufacturers of edible fats such as margarine, shortening, chocolate, cakes, candies, muffins, and biscuits.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/xray-fluorescence-xrf-analyzers-1671544-1.html' target='_blank''&gt;X-Ray Fluorescence (XRF) Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/fat-protein-food-analyzers-30750558-1.html' target='_blank''&gt;Fat &amp; Protein Food Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Wed, 22 Jul 2009 08:30:33 -0500</pubDate>
        </item>
        <item>
            <title>Multi-Channel Analyzer operates without PC.</title>
            <link>http://news.thomasnet.com/fullstory/827797</link>
            <description>
Designed for sodium iodide, lanthanum bromide, and other scintillation detectors, rugged, lightweight DigiDART-LF can perform variety of measurements directly in field or on site and store large amount of spectra in internal memory. It has built-in backlit LCD and control keypad to create live display as data is acquired. Featuring low-power design, unit provides digital stability, high data throughput, and up to 12 hr of operational life from single battery charge.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/multichannel-analyzers-1653807-1.html' target='_blank''&gt;Multichannel Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/data-analyzers-1650209-1.html' target='_blank''&gt;Data Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Mon, 06 Jul 2009 08:34:10 -0500</pubDate>
        </item>
        <item>
            <title>Instruments can be configured with up to 6 test positions.</title>
            <link>http://news.thomasnet.com/fullstory/562628</link>
            <description>
Automated Low Temperature Instruments, integrated with panel PC, display and graph all analytical parameters in real-time on 6.4 in. TFT/LCD touch screen display with 640 x 480 resolution. Also, all information displayed on screen is recorded in MS Excel-compatible file format. Included software package monitors operation and performance of all analyzer components to ensure accurate data measurement. Direct cooling system, 1- or 2-stage, reaches low temperatures in ~15 min.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/thermal-analyzers-1663509-1.html' target='_blank''&gt;Thermal Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/temperature-analyzers-1663459-1.html' target='_blank''&gt;Temperature Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Tue, 30 Jun 2009 08:34:59 -0500</pubDate>
        </item>
        <item>
            <title>XRD/XRF Instrument is suited for art conservation analysis.</title>
            <link>http://news.thomasnet.com/fullstory/561147</link>
            <description>
Designed as portable, combined XRD/XRF instrument, Duetto is used for phase/mineral and elemental identification of delicate materials (such as art work) or items too large to be brought into laboratories. This non-destructive analysis tool allows x-ray diffraction and fluorescence data to be obtained from one location on artifact, without touching it. Applications include paintings, manuscripts, and sculptures.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/xray-fluorescence-xrf-analyzers-1671544-1.html' target='_blank''&gt;X-Ray Fluorescence (XRF) Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Mon, 08 Jun 2009 08:30:25 -0500</pubDate>
        </item>
        <item>
            <title>Gas Analyzers measure trace impurities in argon.</title>
            <link>http://news.thomasnet.com/fullstory/826546</link>
            <description>
Utilizing high frequency argon discharge ionization detector, Models AR710 and AR720 analyze trace impurities, such as H&amp;lt;sub&amp;gt;2&amp;lt;/sub&amp;gt;, N&amp;lt;sub&amp;gt;2&amp;lt;/sub&amp;gt;, O&amp;lt;sub&amp;gt;2&amp;lt;/sub&amp;gt;, CH&amp;lt;sub&amp;gt;2&amp;lt;/sub&amp;gt;, CO, and CO&amp;lt;sub&amp;gt;2&amp;lt;/sub&amp;gt; in argon down to ppb range. Features include laminar low volume flow system, hands-free operation, VCR&amp;#174; fittings to ensure leak-free connections, and mass-spec leak tested valves. Analyzers are available with options such as 4-20 mA output, auto zero, and either bench mounted or 19 in. rack mounted for panel installation.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/argon-analyzers-97003274-1.html' target='_blank''&gt;Argon Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/chromatograph-analyzers-95988564-1.html' target='_blank''&gt;Chromatograph Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/trace-gas-analyzers-95914396-1.html' target='_blank''&gt;Trace Gas Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Fri, 08 May 2009 09:08:21 -0500</pubDate>
        </item>
        <item>
            <title>Turbidity Analyzer utilizes multi-beam sensing technology.</title>
            <link>http://news.thomasnet.com/fullstory/560013</link>
            <description>
Triton TR8 Turbidity Analyzer has optical assembly with 3 light beams and sensor electronics that adjust turbidity signal readings according to reference detector. Digital filter helps to suppress potentially interfering signals while self-monitoring diagnostics assure reliability. It features 880 nm LED light source, 2 nonvolatile memory banks, transmitter with 4-20 mA output, and controller with up to 2 outputs and 4 SPDT relays. Operating temperature range is 20-120&amp;#176;F.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/turbidity-analyzers-1670306-1.html' target='_blank''&gt;Turbidity Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Tue, 05 May 2009 08:30:07 -0500</pubDate>
        </item>
        <item>
            <title>Benchtop XRD/XRF Instrument suits laboratory-based analysis.</title>
            <link>http://news.thomasnet.com/fullstory/559566</link>
            <description>
Model BTX combination x-ray diffraction, x-ray fluorescence instrument performs mineral/phase identification and quantification for routine quality control applications. Data can be collected regardless of grain size, with sizes up to 400 &amp;#181;m being tested producing data normally obtained with micron size particles. Unit's powder handling methods optimize quality of XRD data while minimizing sample preparation requirements.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/laboratory-research-supplies-equipment' target='_blank''&gt;Laboratory and Research Supplies and Equipment&lt;/a&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/xray-diffraction-xray-diffractometers-97002721-1.html' target='_blank''&gt;X-Ray Diffraction, X-Ray Diffractometers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/laboratory-instruments-40582009-1.html' target='_blank''&gt;Laboratory Instruments&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/xray-fluorescence-xrf-analyzers-1671544-1.html' target='_blank''&gt;X-Ray Fluorescence (XRF) Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Mon, 27 Apr 2009 08:33:47 -0500</pubDate>
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        <item>
            <title>Car Park System is compliant with German regulation VDI2053.</title>
            <link>http://news.thomasnet.com/fullstory/825870</link>
            <description>
Providing option of 4 or 8 relay output modules, CPS Car Park System is 8 channel digital controller designed to regulate and monitor ambient air in underground parking facilities and tunnels. It can be configured to monitor from 1-256 modules up to 3,000 ft away from controller with 6 smart transmitter options. Several sensor options including CO, NO, NO&amp;lt;sub&amp;gt;2&amp;lt;/sub&amp;gt;, CH&amp;lt;sub&amp;gt;4&amp;lt;/sub&amp;gt;, LPG, and H&amp;lt;sub&amp;gt;2&amp;lt;/sub&amp;gt; can monitor wide range of hazards emitted by gasoline, natural gas, diesel-powered, and electric vehicles.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/sensors-monitors-transducers' target='_blank''&gt;Sensors, Monitors and Transducers&lt;/a&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/continuous-emissions-monitoring-systems-cems-17866005-1.html' target='_blank''&gt;Continuous Emissions Monitoring Systems (CEMS)&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/confined-space-gas-analyzers-17437500-1.html' target='_blank''&gt;Confined Space Gas Analyzers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/toxic-gas-detectors-22182406-1.html' target='_blank''&gt;Toxic Gas Detectors&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/confined-space-monitors-52254505-1.html' target='_blank''&gt;Confined Space Monitors&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/gas-monitors-52257052-1.html' target='_blank''&gt;Gas Monitors&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Tue, 21 Apr 2009 08:27:27 -0500</pubDate>
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        <item>
            <title>Handheld XRF Analyzer exceeds CPSIA requirements.</title>
            <link>http://news.thomasnet.com/fullstory/557521</link>
            <description>
Used for detecting lead (Pb) content to meet regulations such as RoHS and Consumer Product Safety Improvement Act (CPSIA), Quick-Shot XRF can also perform precious metal analysis and alloy identification. Testing method is not limited by product size or location, and detection reaches below parts-per-million (ppm) levels determined hazardous in CPSIA regulation. Removable PDA offers immediate review of results, which may be transferred to any computer via Bluetooth.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/xray-fluorescence-xrf-analyzers-1671544-1.html' target='_blank''&gt;X-Ray Fluorescence (XRF) Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Fri, 27 Mar 2009 08:38:05 -0500</pubDate>
        </item>
        <item>
            <title>XRF Glass Panel Sampling Tool suits CIGS/CdTe PV panel film.</title>
            <link>http://news.thomasnet.com/fullstory/556446</link>
            <description>
Featuring 600 x 1,200 mm lateral X/Y range of measurement, SMX-FPV is designed for near-line film composition and thickness control of CIGS and CdTe film stacks. It also provides process control of active, contact, and TCO layers. Detailed analysis of full photovoltaic panels is possible, including copper and gallium ratio determination as well as panel gradient analysis. Areas of use include research and process development, in-process monitoring, and post-process QC.
&lt;br&gt;&lt;br&gt;&lt;b&gt;This story is related to the following:&lt;/b&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/sensors-monitors-transducers' target='_blank''&gt;Sensors, Monitors and Transducers&lt;/a&gt;&lt;br&gt;&lt;a href='http://news.thomasnet.com/news/test-measuring-instruments' target='_blank''&gt;Test and Measuring Instruments&lt;/a&gt;&lt;br&gt;&lt;br&gt;Search for suppliers of: &lt;a href='http://www.thomasnet.com/products/thickness-testers-84781400-1.html' target='_blank''&gt;Thickness Testers&lt;/a&gt;  |  &lt;a href='http://www.thomasnet.com/products/xray-fluorescence-xrf-analyzers-1671544-1.html' target='_blank''&gt;X-Ray Fluorescence (XRF) Analyzers&lt;/a&gt;&lt;br&gt;</description>
            <author>info@productnews.com (ThomasNet News)</author>
            <pubDate>Fri, 06 Mar 2009 08:29:23 -0500</pubDate>
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