ThomasNet Home   |   Promote Your Business
Home  |   My ThomasNet News®  |   Industry Market Trends  |   Submit Release  |   Advertise  |   About Us May 26, 2012  
 Sections
Latest New Product News
Industry Market Trends
Green & Clean
Association & Government News
Adhesives and Sealants
Agricultural and Farming Products
Architectural and Civil Engineering Products
Automatic ID
Chemical Processing and Waste Management
Cleaning Products and Equipment
Communication Systems and Equipment
Computer Hardware and Peripherals
Construction Equipment and Supplies
Controls and Controllers
Display and Presentation Equipment
Electrical Equipment and Systems
Electronic Components and Devices
Explosives, Armaments and Weaponry
Fasteners and Hardware
Fluid and Gas Flow Equipment
Food Processing and Preparation
Health, Medical and Dental Supplies and Equipment
HVAC
Labels, Tags, Signage and Equipment
Laboratory and Research Supplies and Equipment
Lubricants
Machinery and Machining Tools
Material Handling and Storage
Materials and Material Processing
Mechanical Components and Assemblies
Mechanical Power Transmission
Mining, Oil Drilling & Refining
Mounting and Attaching Products
Non-Industrial Products
Optics and Photonics
Packaging Products & Equipment
Paints and Coatings
Plant Furnishings and Accessories
Portable Tools
Printing and Duplicating Equipment
Retail and Sales Equipment
Robotics
Safety and Security Equipment
Sensors, Monitors and Transducers
Services
Software
Test and Measuring Instruments
Textile Industry Products
Thermal and Heating Equipment
Timers and Clocks
Transportation Industry Products
Vision Systems
Waste Handling Equipment
Welding Equipment and Supplies
 Press Releases
Products in the News
Company News
Mergers & Acquisitions
People in the News
Literature & Websites
 Resources
News Delivery Options
AMT/IMTS
PROCESS EXPO/FPSA 2011
Browse Categories
Browse Companies
Mobile Edition
PR Resources
Licensing
Advertising
How to Write an effective Press Release
Trade Associations
Small Business Support
MEP
Test & Measuring Instruments -> Probes -> Others


Others




(Showing headlines 1 - 20)   more ....

Flying Lead Solder-Down Probe suits PCIe 3.0 protocol analysis.

Agilent Technologies, Inc.    Santa Clara, CA 95051
Apr 12, 2012 Used with U4301A protocol analyzer module, U4324A can be used for bidirectional lane widths as narrow as x2 and cleanly captures 8.0 GT/s traces from DUT. Probe provides additional line for connection to external reference clock, and it supports 2.5, 5, and 8 GT/s PCIe IO speeds. Designed to meet needs of silicon, system, and embedded PC connector testing, product works with replaceable N5426A ZIF (zero insertion force) tip kit that extend probe life via tip on-demand replacement.

Fiber-Optic NIR Transmission Probe has self-cleaning design.

Axiom Analytical, Inc.    Tustin, CA 92780
Mar 14, 2012 Accommodating applications that experience gradual build up of particulate or other residue on exposed surfaces, FPT-850SCN has integral spray nozzle that can direct pressurized stream of liquid solvent or vapor at probe windows. Sealing technique, involving direct sapphire to metal welded pressure seal, ensures chemical resistance; only materials in contact with process are sapphire, high nickel alloys, and thin flash of gold or PTFE. Also, there are no optical fibers in probe.

Ammonium Sensors suit water treatment applications.

Ammonium Sensors suit water treatment applications.

Electro-Chemical Devices, Inc.    Yorba Linda, CA 92887
Feb 07, 2012 Utilizing replaceable electrode cartridges, MVS10 and MVS17 Ammonium pIon Sensors measure activity of free ammonium ions in solution in concentrations from 0.1-14,000 ppm over pH range from 2-8 pH. Model MVS10 consists of insertion- or immersion-style sensor for use in pipe tees, while Model MVS17 features valve-retractable design for insertion into pipe without interrupting process flow. Constructed of 316 SS, sensors operate over temperature range of 32-104°F and pressure range of 0-50 psig.

PCI 3.0 Multi-Lead Probe utilizes Gen3 tapping technology.

LeCroy Corp.    Santa Clara, CA 95054
Feb 06, 2012 Available for Summit(TM) T3-16 and Summit T3-8 Protocol Analyzers, PCI Express® 3.0 multi-lead probe can be used by system developers to probe point-to-point bus signals or serial buses when there is no supported interposer card. Tool supports PCIe 3.0 specification, which includes data rates up to 8 GT/s, and is expandable to support x1-x16 PCIe lanes when using Summit protocol analyzer. Probe tips are flexible for tapping signals in narrow areas on circuit boards.

High-Transmission ATR Probe suits mid-IR spectroscopy.

Axiom Analytical, Inc.    Tustin, CA 92780
Nov 15, 2011 Designed to interface with small and flexible FTIR spectrometers, DPR-210XT Attenuated Total Reflectance Probe features broad mid-IR spectral response, providing detailed quantitative analysis based on specific chemical functional groups. When used with Bruker Alpha instrument and Axiom's SI-Alpha1 spectrometer interface, Model DPR-210XT exhibits 30% transmission. Applications include laboratory chemical development and process analysis and control.

Conductivity Transmitters have 10 point compensation curve.

Conductivity Transmitters have 10 point compensation curve.

G Instruments    San Diego, CA 92128
Jul 20, 2011 Offering 10 point curve for compensation throughout -20 to +120°C range, GCT20K and GCT20K-MB are fully programmable and have probe head constructed of Kynar PVDF. Curve is fully programmable at any time in field; GCT20K-MB also accommodates curve changes at any time over RS485 MODBUS RTU network. Platinum RTD promotes accurate temperature measurement and isolation, and proprietary circuits and algorithms make sure liquid is not polarized or changed.

Laser-Powered Electric Field Probe covers 2 MHz to 18 GHz range.

AR Worldwide    Souderton, PA 18964
Jul 13, 2011 Incorporating MPU-based linearization technology that provides 54 dB dynamic range, Model FL7218 is laser-powered to allow for continuous operation without recharging or battery replacement. Internal microprocessor provides linearization, temperature compensation, control, and communication functions, and noise reduction and temperature compensation features promote accurate measurements down to 2 V/m without zero adjustment.

Linear Position Sensors utilize magnetostrictive technology.

Macro Sensors    Pennsauken, NJ 08110 1334
Jan 14, 2011 Available in ranges of 11.8-39.4 in., MLW Series of Long Stroke Position Sensors provide absolute position measurement of displacements up to 1.2 m. Units are powered by 24 Vdc and have less than ±0.25% linearity and ±0.01% repeatability over full scale with analog voltage, current, and SSI outputs. Featuring self-contained electronics, stainless steel probe, and die cast probe head with IP66 rating, transducers are suited for hydraulic cylinder and actuator feedback applications.

Spectroscopy Probe analyzes polymer melts during extrusion.

Axiom Analytical, Inc.    Irvine, CA 92714
Nov 11, 2010 Extruder Access Optical Diffuse Reflectance Probe, FDR-755, brings NIR spectroscopy to extrusion processes by introducing diffuse reflectance probe that can be mounted in any of ˝-20 UNF Dynisco-compatible pressure transducer fittings available on polymer extruders. Use of diffuse reflectance minimizes required penetration into melt. This makes it compatible with any size extruder and allows accelerated attachment without modification to existing equipment.

Diffuse Reflectance Probe provides non-contact analysis.

Axiom Analytical, Inc.    Irvine, CA 92714
Nov 10, 2010 Operating in NIR and visible spectral regions, fiber optic-coupled Model FDR-825 analyzes powders, slurries, and other diffusely reflecting materials. Set of orifices around circumference of probe window are positioned to allow efficient flushing of window by solvent or dry vapor stream. With variable offset feature, optimum sample distances can be set anywhere from 30-100 mm. Probe is suited for chemical and pharmaceutical development as well as process monitoring applications.

Blast Pressure Sensors offer resonant frequencies to 500 kHz.

Blast Pressure Sensors offer resonant frequencies to 500 kHz.

PCB Piezotronics Inc.    Depew, NY 14043 2495
Nov 04, 2010 Series 137B quartz ICP® blast pressure pencil probes, featuring micro-second response time, offer high-level 5 V output signal capable of driving long cable runs hundreds of feet long to safe zone for data acquisition. Probe sensors can capture both peak pressure and total impulse calculations. Designed for range of explosion, blast, and shock wave testing, units are suited for applications like measuring blast pressure in free-field or closed bunker arenas.

Half-Size Mid-Bus Probe supports PCI Express 3.0.

LeCroy Corp.    Chestnut Ridge, NY 10977
Sep 21, 2010 Half-size mid-bus probe for Summit(TM) T3-16 Protocol Analyzer utilizes half-size connector that supports PCIe® x4 lanes at 8 GT/sec. Probe attaches to anchor connector mounted on top of mid-bus footprint that is laid out on test target system board. It can be used in conjunction with lane swizzling feature on Summit T3-16 Analyzer, which allows probe signals to be reorganized logically, to give developers flexibility in PCB layout.

5-Axis Touch-Trigger Probe Head has infinite-positioning axes.

5-Axis Touch-Trigger Probe Head has infinite-positioning axes.

Renishaw, Inc.    Hoffman Estates, IL 60192
Aug 04, 2010 Model PH20 utilizes infinite rotary positioning and unique head touch capability for high-speed point capture with minimal CMM movement. Additional time savings are achieved by synchronizing motion of head and CMM between measurements, and inferred calibration technique determines head orientation and probe position in single operation, allowing subsequent measurements at any head angle. Designed for use with TP20 touch-trigger probe, it fits machines using shank or quill mounting.

Radio Transmission Probing System offer global compatibility.

Marposs Corp.    Auburn Hills, MI 48326-2954
Aug 04, 2010 Suited for large or 5-axis machines, Mida WRS System features 2.4 GHz applied transmission frequency band that promotes worldwide applicability. Touch probing system offers 15 m operating range and has receiver interface with remote programming capability and 4-digit display. Automatic searching for best signal among radio channels ensures optimal probe/receiver communication. Additional sub-channels permit use of multiple probes on same machine by means of NC selection code.

Nitride Lever Probes enable high-resolution AFM imaging.

Nitride Lever Probes enable high-resolution AFM imaging.

Veeco Instruments Inc. Corporate Headquarters    Woodbury, NY 11797
May 12, 2010 Able to be used on any atomic force microscope (AFM), Sharp Nitride Lever (SNL) Probes feature tip that combines low spring constant softness of silicon nitride cantilever with sharpness of silicon tip. This results in radius of curvature as low as 2 nm. High resolution imaging in air and fluid is possible using Contact Mode and TappingMode(TM) operation, and there are 2 available configurations: NP/DNP levers and MLCT/MSCT levers. All products are built for extended lifetime.

IR Touch Probe for CNC Machines enhances productivity.

IR Touch Probe for CNC Machines enhances productivity.

Heidenhain Corp.    Schaumburg, IL 60173-5337
May 05, 2010 Designed for use with numerically controlled machine tools, TT 449 unit can be placed anywhere on work table and is rated for continuous duty at 200 hr typ with included lithium battery. Design eliminates need for cable, increasing mobility for tool measurement and inspection directly on machine. Suitable for applications where unlimited movements are necessary, IP67-rated tool also has rated break point that protects touch probe from damage due to operator error.

Radio Transmission Probe is 1.57 in. dia x 2.30 in. long.

Radio Transmission Probe is 1.57 in. dia x 2.30 in. long.

Renishaw, Inc.    Hoffman Estates, IL 60192
May 03, 2010 Suited for multi-axis and mill-turn machines where line-of-sight between inspection probe and its interface can become obstructed, RMP40 touch probe brings automated job set-up and in-process measurement to range of machine tools and difficult applications. Frequency-hopping spread spectrum (FHSS) radio transmission pairs with Radio Machine Interface (RMI) and utilizes 2.4 GHz frequency band, eliminating dead spots. Uni-directional probing repeatability is 0.00004 in.

Touch Probes aid lathe and turning center setup/inspection.

Renishaw, Inc.    Hoffman Estates, IL 60192
Mar 31, 2010 Respectively offering choice of radio or optical signal transmission technologies, RLP40 and OLP40 facilitate lathe and turning center part setup/inspection. Products measure 40 mm dia x 58.3 mm long and provide uni-directional repeatability of 1 µm. Both designs, hardened and sealed to IPX8, withstand extreme environments, and eyelid protection system prevents entry of swarf and chips. Range of shanks is available, including parallel and tapered designs.

LTE Network Probe System provides integrated drive test solution.

SwissQual    Zuchwil 4528  Switzerland
Mar 26, 2010 Using scanner component from PCTel®, Diversity probe generates RF measurements for LTE FDD standard, allowing operators to map out LTE cell coverage and quality. Application layer testing is provided by attached LTE device. Offering ±1 db resolution across dynamic range of 60 db, system takes 20 ms to scan top cells, which includes reference signal and synchronization channels assessment and individual values for each cell's transmit antenna branch.

Lathe Inspection Touch Probes transmit radio or optical signals.

Lathe Inspection Touch Probes transmit radio or optical signals.

Renishaw, Inc.    Hoffman Estates, IL 60192
Mar 25, 2010 Model RLP40 lathe inspection probes operate in 2.4 GHz frequency band and combine FHSS radio transmission with machine interface to deliver continuous communication with probe. Using modulated optical transmission to resist light interference, OLP40 units have 360° transmission systems for probe to operate in any orientation. Both probes provide unidirectional repeatability of 0.00004 in. and are IPX8-sealed. Eyelid protection system prevents contaminants from damaging inside of probes.




(Showing headlines 1 - 20)   more ....



 Latest Products in the News


SEICA Inc.  - March 30, 2012
Preview for the Print Media for Seica Inc for the Nepcon Shanghai Show, April 25th to 27th, Booth 1H70

SEICA Inc.  - March 30, 2012
Preview for Seica SpA for SMT Nuremberg 2012 for the Print Media - May 8th to 10th, 2012

Renishaw, Inc.  - March 19, 2012
Renishaw Announces Additional Exhibits at MACH 2012

Sensonics  - January 10, 2012
Continued Growth for Sensonics in China

Flexotherm  - March 28, 2010
Flexotherm® Launches New Line of Continuous Emission Monitoring Products

Malvern Instruments Inc.  - August 13, 2008
Malvern Continuous Particle Size Analyzers Give Ferrari Granulati a Competitive Edge

BIG Kaiser Precision Tooling, Inc.  - June 12, 2008
Visit BIG Kaiser at IMTS Booth F-2114 to See the Newest in Precision Tooling

SEICA Inc.  - February 1, 2007
Seica to Showcase its Line of Flying Probe Test Solutions at Nepcon Shanghai, Booth 4F11

Agilent Technologies, Inc.  - November 1, 2006
Agilent Technologies Introduces Deepest Memory Logic Analyzer with New Applications


More Products in the News...

Home  |  My ThomasNet News®  |  Industry Market Trends  |  Submit Release  |  Advertise  |  Contact News  |  About Us
Brought to you by Thomasnet.com        Browse ThomasNet Directory

Copyright © 2012 Thomas Publishing Company
Terms of Use - Privacy Policy