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Test & Measuring Instruments

RT-ZPR20 Power Rail Probe offers 1:1 attenuation.

February 1, 2017

Designed for power integrity measurements together with R&S RTE and R&S RTO2000 oscilloscopes, RT-ZPR20 Power Rail Probe offers 2GHz bandwidth and ± 60V DC offset voltage. Featuring high-precision DC voltmeter and 1:1 attenuation factor, RT-ZPR20 provide ± 850 mV dynamic voltage range. Used for IoT components with fast digital interfaces, fast memory chips and highly sensitive analog... Read More

Test & Measuring Instruments

HVFO103 Oscilloscope Probe comes with soft carrying case.

January 27, 2017

Designed to capture small floating signals on high voltage bus in power electronic designs, 60MHz HVFO103 Oscilloscope Probe reduces noise, overshoots and transients in measured signal. Available for various voltage ranges, probes come with transmitter, receiver, 1meter Fiber Optic Cable, set of three micro-grippers, and USB Charging Cable. Units come with single laser and optic cable to... Read More

Sensors Monitors & Transducers, Test & Measuring Instruments

XTP Series Transmitter Probes eliminate need for separate adapter fittings.

January 20, 2017

Available in 30, 50, 100, or 150mm insertion lengths and two integral male NPT 1/4-in. or 1/2-in. sizes, XTP Series Transmitter Probes feature stainless steel threaded thermowells. Using Pro-sense XT-Soft software, probes can be programmed in output, fault condition reaction and range limits of -58 to 302°F and is designed with M12 disconnection allows connection to 4-20mA output signal.

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Test & Measuring Instruments

Teledyne LeCroy Launches RP4030 Active Voltage Rail Probe and SPMI Decoder

November 9, 2016

A perfect fit with Teledyne LeCroy's 8-channel & 4-GHz High Definition Oscilloscopes for digital power management IC (PMIC), power sequencing, and power-integrity testing.

CHESTNUT RIDGE, N.Y., Nov. 2, 2016 - Teledyne LeCroy today launches two new products - the RP4030 active voltage rail probe and an industry first MIPI System Power Management Interface (SPMI) serial decoder. The... Read More

Test & Measuring Instruments

PicoConnect 900 Series Test Probes offer interchangeable probe heads.

October 31, 2016

With less than 0.4pF tip capacitance and ground-referred loading of 220 to 910 ohms, 900 Series Microwave/Gigabit Passive Test Probes can test broadband signals or data streams up to 9GHz or 18Gb/s, including USB 2 & 3, HDMI 1 & 2, Ethernet, PCIe, SATA and LVDS standards. Suitable for use with any measuring instrument with 50 ohm inputs, PicoConnect offer probe division ratios of ÷5, ÷10... Read More

Test & Measuring Instruments

Board Probes are available for routine AFM measurements.

September 21, 2016

Suitable for nearly all routine atomic force microscope (AFM) measurements, SurfRider™Â Econo Board™ probes are also suited for training or education and can be used for many advanced modes. Latter includes tapping, force modulation, contact, and nanoelectrical and nanomechanical characterization modes. Suited for all AFM brands and models, probes come in 8 PtIr coated and... Read More

Test & Measuring Instruments

Spectrometer Probe scans small sample features.

August 25, 2016

Featuring 3 mm spot size, oreXpress™ Miniprobe™ allows geologists in field or core shack to pinpoint features of interest on sample for identification. Probe has pushbutton trigger for data collection, 5 W halogen light source for built-in illumination, and metal clad fiber optic cable with quick-disconnect. ABS thermoplastic body features ergonomic, low reflectance, impact-resistant design.... Read More

Test & Measuring Instruments

Universal Touch Probe reduces SKU inventory, enhances versatility.

July 18, 2016

Model TS 642 is offered as universal replacement for all TS 6xx series touch probes. Original transceiver can remain in machine, all original cables can be used, and styluses are also compatible. After exchange, existing taper shank can continue to be used as well. While properties correspond to known touch probes, product offers service life of at least 5 million probes, flexible battery... Read More

Sensors Monitors & Transducers, Test & Measuring Instruments

Non-Contact Vision Probe enhances REVO measurement capabilities.

July 8, 2016

Intended for use with REVO® 5-axis measurement system on co-ordinate measuring machines (CMMs), RVP increases multi-sensor capability by adding non-contact inspection to existing touch-trigger, high-speed tactile scanning and surface finish measurement capability. Thin sheet metal parts or components with large numbers of holes as small as 0.5 mm as well as parts not suitable for tactile... Read More

Test & Measuring Instruments

Semi-Rigid Coax Test Probes operate to 6 GHz max.

June 17, 2016

Offered in 0.02, 0.034, and 0.047 in. dia and 3, 6, 9, and 12 in. lengths, semi-rigid test probes assist in testing microwave circuits. Soldering of outer conductor to signal ground and exposed center conductor to trace carrying signal of interest enables sampling measurement without separate subassembly circuit board or adding connector to circuit layout. Versions include straight-cut... Read More

Test & Measuring Instruments

Differential Probes meet IEC 61010-031 safety standard.

April 19, 2016

Compatible with oscilloscopes from all major manufacturers, Elditest High Voltage Differential Probes make safe, accurate measurements between 2 voltage points where neither point is referenced to ground. Probes offer input voltage of ±800 V, ±7.5 kV, or ±15 kV for both differential and common mode voltage, depending on probe chosen. Supplied in safety yellow housing, probes feature 2... Read More

Optics & Photonics, Test & Measuring Instruments

Video Borescope features 1.8 mm working channel.

April 6, 2016

Featuring tungsten braided probe with 6.5 or 10 ft working length, IRis DVRx-WC can operate as visual inspection device and repair tool. Optional alligator jaw, magnet, and measurement device can reach area under inspection through 1.8 mm working channel. With SDHC memory cards, users can store image and video files. Additional features include 4-way articulation with 360° rotation, 5 in.... Read More

Test & Measuring Instruments

Oscilloscope Probes work with smaller, faster designs.

March 21, 2016

Minimizing probe loading and improving access to small, densely packed test locations, TriMode™ P7700 series facilitates debugging of circuits found in mobile and enterprise designs. These probes, intended for use with Tektronix performance oscilloscopes, offer up to 20 GHz bandwidth and feature input amplifier <4 mm from connection point to minimize signal loss, probe tip capacitance,... Read More

Electrical Equipment & Systems, Test & Measuring Instruments

Hybrid Contactor supports high-frequency testing.

March 15, 2016

Used for testing high frequency semiconductors in high-volume production, mmWave Contactor combines traditional spring probe architecture for low frequency and power I/O’s with cantilever solution for peripheral high frequency transceiver I/O’s. Keeping interface from test equipment to device as short as possible while minimizing number of transitions enables broadband performance from DC... Read More

Laboratory and Research Supplies and Equipment, Sensors Monitors & Transducers, Test & Measuring Instruments

Micro Metrology Sensor measures small, fragile features.

February 25, 2016

Employing resonance as trigger mode, Feather Probe™ supports tips as small as 100 microns in diameter and trigger forces below 1 mg for measurement of extremely small features as well as fragile or easily deformed features. Dynamic Resonance Mode eliminates effects of such external influences as temperature, air motion, and vibration. Typically protected behind cover when not in use,... Read More

Test & Measuring Instruments

Semi-Rigid Probes facilitate microwave circuit testing.

February 22, 2016

Constructed of semi-rigid coax, probes feature SMA Female connectors and come in 3 diameters and 3 lengths from 3–12 in. to help when attaching unterminated end of probe to circuit board trace. Straight-cut probe ends for those that want to customize dimensions of center conductor and dielectric dimensions, while pre-stripped probe ends for immediate use. Products are 100% RF tested to... Read More

Test & Measuring Instruments

Acculogic Will Demonstrate the FLS980 Series III at APEX

February 22, 2016

Markham, ON – Acculogic Inc., a global leader in electronic production test solutions, announces that it will exhibit in Booth #1166 at the 2016 IPC APEX EXPO, scheduled to take place March 15-17, 2016 at the Las Vegas Convention Center. Company representatives will demonstrate the FLS980 Series III and new Scorpion Briz Test Programming station. The FLS980 Series III with the Ultimate... Read More

Test & Measuring Instruments

Source Measure Unit suits high-power device characterization.

January 18, 2016

With graphical touchscreen and open source scripting language, Keithley 2461 High Current SourceMeter SMU Instrument is used for creating 10 A/100 V, 1,000 W high-current pulses that minimize power device thermal effects and maintain device integrity. Dual 18-bit, 1 MSps digitizers enable SMU to measure and visualize actual device operation, waveforms, and transient events of current and voltage... Read More

Test & Measuring Instruments

Fine Pitch Probe is designed for WLP/WLCSP testing.

January 15, 2016

Qualified for both singulated and multisite WLP and WLCSP contacting/probing, Mercury 030 has 2 flat surfaces moving in surface-to-surface contact. RLC parasitics are suitable for full testing of wafer level packaged devices in DC, functional, and AC parametric domains. Geometry and components provide high bandpass (8 GHz @ -1 dB insertion loss) and low resistance (160 mΩ). Featuring... Read More

Test & Measuring Instruments

High Performance Spring Probes for In-circuit and Functional PCBA Test

January 12, 2016

ECT's EDGE probe combines leading architecture and materials for lead free applications Fontana, California – Everett Charles Technologies' (ECT) EDGE probes are the answer to poor first pass yield, short probe life and excessive cleaning cycles, when caused by oxide layer build up or debris, particularly in lead free applications. In volume manufacturing the impact worsens as cycle... Read More