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Test & Measuring Instruments

Universal Touch Probe reduces SKU inventory, enhances versatility.

July 18, 2016

Model TS 642 is offered as universal replacement for all TS 6xx series touch probes. Original transceiver can remain in machine, all original cables can be used, and styluses are also compatible. After exchange, existing taper shank can continue to be used as well. While properties correspond to known touch probes, product offers service life of at least 5 million probes, flexible battery support, and IR range up to 7 m. Integrated workpiece cleaning jets function with air or coolant. Read More

Sensors, Monitors & Transducers, Test & Measuring Instruments

Non-Contact Vision Probe enhances REVO measurement capabilities.

July 8, 2016

Intended for use with REVO® 5-axis measurement system on co-ordinate measuring machines (CMMs), RVP increases multi-sensor capability by adding non-contact inspection to existing touch-trigger, high-speed tactile scanning and surface finish measurement capability. Thin sheet metal parts or components with large numbers of holes as small as 0.5 mm as well as parts not suitable for tactile measurement can be fully inspected with this vision measurement probe. Read More

Test & Measuring Instruments

Semi-Rigid Coax Test Probes operate to 6 GHz max.

June 17, 2016

Offered in 0.02, 0.034, and 0.047 in. dia and 3, 6, 9, and 12 in. lengths, semi-rigid test probes assist in testing microwave circuits. Soldering of outer conductor to signal ground and exposed center conductor to trace carrying signal of interest enables sampling measurement without separate subassembly circuit board or adding connector to circuit layout. Versions include straight-cut probe ends and pre-stripped probe ends, and SMA connector interface meets 1.35:1 VSWR specification. Read More

Test & Measuring Instruments

Differential Probes meet IEC 61010-031 safety standard.

April 19, 2016

Compatible with oscilloscopes from all major manufacturers, Elditest High Voltage Differential Probes make safe, accurate measurements between 2 voltage points where neither point is referenced to ground. Probes offer input voltage of ±800 V, ±7.5 kV, or ±15 kV for both differential and common mode voltage, depending on probe chosen. Supplied in safety yellow housing, probes feature 2 attenuation settings as well as power and over-range indicators. Read More

Optics & Photonics, Test & Measuring Instruments

Video Borescope features 1.8 mm working channel.

April 6, 2016

Featuring tungsten braided probe with 6.5 or 10 ft working length, IRis DVRx-WC can operate as visual inspection device and repair tool. Optional alligator jaw, magnet, and measurement device can reach area under inspection through 1.8 mm working channel. With SDHC memory cards, users can store image and video files. Additional features include 4-way articulation with 360° rotation, 5 in. color display, CMOS camera chip, adjustable 3-step LED illumination, and built-in digital zoom. Read More

Test & Measuring Instruments

Probe Amplifier Browser Head offers 12 GHz of bandwidth.

March 23, 2016

Designed for use with InfiniiMax I/II Series probe amps, N2839A Differential Browser Head brings measurement fidelity of solder-in probe head to hand-held browsing. Spring-loaded probe tips ensure secure connection to DUT and can be adjusted to accommodate targets from 0–3 mm apart using thumbwheel. Low-inductance ground spring ensures that probe’s frequency response remains constant regardless of span range setting. N2839A provides extremely low probe loading with 0.21 pF input capacitance. Read More

Test & Measuring Instruments

Oscilloscope Probes work with smaller, faster designs.

March 21, 2016

Minimizing probe loading and improving access to small, densely packed test locations, TriMode™ P7700 series facilitates debugging of circuits found in mobile and enterprise designs. These probes, intended for use with Tektronix performance oscilloscopes, offer up to 20 GHz bandwidth and feature input amplifier <4 mm from connection point to minimize signal loss, probe tip capacitance, and noise. Signal path is fully characterized and automatically de-embedded from measurement results. Read More

Electrical Equipment & Systems, Test & Measuring Instruments

Hybrid Contactor supports high-frequency testing.

March 15, 2016

Used for testing high frequency semiconductors in high-volume production, mmWave Contactor combines traditional spring probe architecture for low frequency and power I/O’s with cantilever solution for peripheral high frequency transceiver I/O’s. Keeping interface from test equipment to device as short as possible while minimizing number of transitions enables broadband performance from DC to 81 GHz to be maintained. Typical applications include automotive radar, WiGig, and 5G backhaul devices. Read More

Laboratory and Research Supplies & Equipment, Sensors, Monitors & Transducers, Test & Measuring Instruments

Micro Metrology Sensor measures small, fragile features.

February 25, 2016

Employing resonance as trigger mode, Feather Probe™ supports tips as small as 100 microns in diameter and trigger forces below 1 mg for measurement of extremely small features as well as fragile or easily deformed features. Dynamic Resonance Mode eliminates effects of such external influences as temperature, air motion, and vibration. Typically protected behind cover when not in use, styli can be automatically deployed into measurement area whenever needed and retracted when not in use. Read More

Test & Measuring Instruments

Acculogic Will Demonstrate the FLS980 Series III at APEX

February 22, 2016

Markham, ON – Acculogic Inc., a global leader in electronic production test solutions, announces that it will exhibit in Booth #1166 at the 2016 IPC APEX EXPO, scheduled to take place March 15-17, 2016 at the Las Vegas Convention Center. Company representatives will demonstrate the FLS980 Series III and new Scorpion Briz Test Programming station. The FLS980 Series III with the Ultimate... Read More

Test & Measuring Instruments

Semi-Rigid Probes facilitate microwave circuit testing.

February 22, 2016

Constructed of semi-rigid coax, probes feature SMA Female connectors and come in 3 diameters and 3 lengths from 3–12 in. to help when attaching unterminated end of probe to circuit board trace. Straight-cut probe ends for those that want to customize dimensions of center conductor and dielectric dimensions, while pre-stripped probe ends for immediate use. Products are 100% RF tested to ensure cable assemblies operate to 6 GHz and that SMA connector interface meets 1.35:1 VSWR specification. Read More

Test & Measuring Instruments

Source Measure Unit suits high-power device characterization.

January 18, 2016

With graphical touchscreen and open source scripting language, Keithley 2461 High Current SourceMeter SMU Instrument is used for creating 10 A/100 V, 1,000 W high-current pulses that minimize power device thermal effects and maintain device integrity. Dual 18-bit, 1 MSps digitizers enable SMU to measure and visualize actual device operation, waveforms, and transient events of current and voltage simultaneously. DC and pulse source and sink performance foster in-depth insight. Read More

Test & Measuring Instruments

Fine Pitch Probe is designed for WLP/WLCSP testing.

January 15, 2016

Qualified for both singulated and multisite WLP and WLCSP contacting/probing, Mercury 030 has 2 flat surfaces moving in surface-to-surface contact. RLC parasitics are suitable for full testing of wafer level packaged devices in DC, functional, and AC parametric domains. Geometry and components provide high bandpass (8 GHz @ -1 dB insertion loss) and low resistance (160 mΩ). Featuring gold plating, product ensures required probing coplanarity matching vertical heights of WLCSP balls/lands.
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Electronic Components & Devices, Test & Measuring Instruments

Keysight Technologies Exhibits High-Speed Digital Design, Test Solutions at DesignCon

January 13, 2016

Solutions Focus on USB Type-CTM, Signal and Power Integrity, PAM-4, Latest Digital Standards Development Highlights:

  • Keysight experts will demonstrate the latest digital test solutions
  • Learn how to solve the toughest signal and power integrity, USB Type-C and PAM-4 design and test challenges
  • Keysight experts to teach eight Education Forum (KEF)... Read More

Test & Measuring Instruments

High Performance Spring Probes for In-circuit and Functional PCBA Test

January 12, 2016

ECT's EDGE probe combines leading architecture and materials for lead free applications Fontana, California – Everett Charles Technologies' (ECT) EDGE probes are the answer to poor first pass yield, short probe life and excessive cleaning cycles, when caused by oxide layer build up or debris, particularly in lead free applications. In volume manufacturing the impact worsens as... Read More

Test & Measuring Instruments

High Transmission ATR Probe aids mid-IR chemical process analysis.

January 11, 2016

Compatible with diverse instruments, DPR-212 ATR (Attenuated Total Reflectance) probe has straight, 30 cm long configuration designed to provide optical transmission of over 20%. Selection of interchangeable ATR materials, such as ZnSe, ZnS, AMTIR-1, and Germanium, provides coverage of full mid-IR fingerprint spectral region while allowing selection of optimum material for given chemical system. Use of metallic internal lightguides provides performance stability and long term reliability. Read More

Test & Measuring Instruments

Diamond ATR Probe suits mid-IR chemical process analysis.

January 11, 2016

Featuring 23 mm diameter, DMD-373 Attenuated Total Reflectance Probe is suitable for both laboratory and on-line process analytical applications. Mid-IR transmission of probe exceeds 10%, providing optimum performance when used with FTIR spectrometers employing room temperature IR detectors. With diamond ATR element, Hastelloy C-276 construction, and energized PTFE seals, probe can function over wide range of temperatures and pressures and with aggressive chemical systems. Read More

Sensors, Monitors & Transducers, Test & Measuring Instruments

Machine Tool Touch Probe employs pressure sensor.

November 27, 2015

Offering accuracy of <±1 µm with repeatability of 2σ ¯ = 0.25 µm at probing velocity of 0.25 m/min, TS 740 facilitates machined part verification. Trigger pulse is obtained via force analysis, and forces acting during probing are processed electronically. This enables consistent probe accuracy over 360°. Offering precise trigger characteristics in all directions, stylus deflection is measured by several pressure sensors arranged between contact plate and probe housing. Read More

Optics & Photonics, Test & Measuring Instruments, Thermal & Heating Equipment

In-Situ Electron Microscopy Tools foster real-time observation.

November 19, 2015

NanoEx™ holders enable materials scientists and engineers to observe, in real-time, changes at micro, nano, and atomic scale in morphology and dynamic properties of materials under mechanical, electrical, and thermal stimuli as well as environmental conditions mimicking actual use cases. Specific products include NanoEx i/v heating solution, which uses MEMS-based nanoheaters; NanoEx 3D Indenter; and NanoEx 3D STM/EP electric nanoprobing solution. All work with FEI TEM platforms. Read More

Laboratory and Research Supplies & Equipment, Services, Test & Measuring Instruments

Touchless 1-Pixel Laser Tracker Probe advances spatial metrology.

November 6, 2015

Pixel Probe, a recent invention within NIST CTL, features in 2015 Autumn Journal of the Coordinate Metrology Society Conference. Used with laser tracker, this spatial metrology probe allows resolution to 25 microns without physical contact. Three machine vision cameras project single pixel to one location in space that defines touch-less probe. Benefits derived from this probe will provide data from objects difficult or extremely challenging to measure using existing tracker probes. Read More