Contour Measuring Instruments

Sensors, Monitors & Transducers, Test & Measuring Instruments

Surface Measurement System offers dual profile analysis.

July 10, 2015

Based on low-noise metrology frame (<8 nm), high-precision manufactured datum, and software datum correction, Form Talysurf i-Series provides accurate and repeatable results with straightness specification of less than 0.15 µm. High-resolution gauge measures curved or flat surfaces for contour and surface finish, while i-Series’ measurement analysis package provides least squared line, arc, and polynomial form removal plus up-to-date filtering techniques. Read More

Sensors, Monitors & Transducers, Test & Measuring Instruments

Surface Testers measure roughness, contour, and finish.

May 14, 2015

Using diamond stylus that is drawn across part with motorized traverse mechanism, Surtronic Duo offers portable solution for shop floor and on-site measurement of multiple roughness parameters. One-button operation produces set of traceable measurement results including detailed profile graph. With 1 mm vertical range and 16 nm resolution, IntraTouch provides fundamental roughness and waviness parameters, contour and form error analysis, feature exclusion, zoom tool, and full programmability. Read More

Test & Measuring Instruments

Roundness, Cylindricity, and Contour Gauge aids QA operations.

May 6, 2014

Able to be used in all circumstances for workpiece evaluation to DIN ISO 1101, MarForm MMQ 400 comes in versions for high-precision, unusually long, and large/heavy workpieces. Precision Z and X measuring axes make it possible to perform any form measuring task. Modules can be used to customize unit to precise requirements: motor-driven or manual centering and tilting table; Z axis with measuring length of 35.4, 19.7, or 13.8 in.; and X axis with measuring length of 7.1 or 11.0 in. Read More

Laboratory and Research Supplies & Equipment, Test & Measuring Instruments

Metrology System measures surface and contour in single pass.

July 1, 2010

Featuring automated motorized operation and joystick control, MarSurf® UD 120 has magnetic probe mounting feature that not only prevents probe damage, but allows probe changes in seconds, without additional tools. Probe offers measuring range of 10-20 mm, while drive unit allows traversing lengths from 0.1-120 mm with drive speeds from 0.1-2 mm/s. Probe's motion is sensed by optical measuring system based on rocker-arm principal with stylus tip on one end and interferometer on other. Read More

Laboratory and Research Supplies & Equipment, Sensors, Monitors & Transducers, Test & Measuring Instruments

Metrology System measures roughness/contour simultaneously.

June 27, 2008

Able to measure roughness and contour of any shape in 1 pass, HOMMEL nanoscan can measure surfaces with stroke of 24 mm with resolution of 0.68 nm. Laser interferometer features resolution of 0.6 nm, allowing surface structures from submicrometer range to 24 or 48 mm to be recorded. CNC-controlled horizontal and vertical axes include digital scales providing resolution of 10 nm and probe arms are magnetically coupled on traverse unit to simplify handling, operation, and safety. Read More

Test & Measuring Instruments

Instruments record surface and contour data in one step.

September 11, 2006

Based on traditional roughness sensor, Surfcom 2000 has probing range of ±2.5 mm, while laser-controlled detector and stylus system on Surfcom 5000 delivers probing range up to ±6.5 mm at resolution of 0.31 nm. Surfcom 2000 can be reconfigured into fully automatic CNC measuring station with CNC table modules. Modular design of Surfcom 5000 permits expansion to topography measuring instrument that allows recording of surfaces in 3D mode. Read More

Sensors, Monitors & Transducers, Test & Measuring Instruments

Measuring System analyzes contour and surface roughness.

March 6, 2003

Formtracer® CS-Series generates contour and surface roughness analysis from single measurement of workpiece. Model CS-3000, for smaller workpieces, offers max measuring range of 10 mm and max resolution of 0.8 nm. Model CS-5000 provides laboratory level accuracy, employing Laser Holoscale(TM), which utilizes interference of diffracted light to achieve nanometer resolution. Formtracepak software provides analysis for dimensional/contour measurements such as radius, distance, and angle. Read More

Sensors, Monitors & Transducers, Test & Measuring Instruments

Gage measures contour and roughness in one stroke.

October 1, 2002

With traversing length of up to 4.72 in., MarSurf(TM) LD 120 utilizes single drive unit and laser interferometer. System includes PC with data acquisition card and menu-driven, Windows-based software. Using triangular support design, LD 120 incorporates tracing arm with .394 in. range and magnetic tracing arm mounts. It uses 2 µm (80 µin.) radius diamond stylus tip and provides ratio of measuring range to resolution of 1.25 million to 1. Read More

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