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Test & Measuring Instruments -> Measuring Instruments -> Contour Measuring Instruments


Contour Measuring Instruments




(Showing headlines 1 - 6)   
Roundness, Cylindricity, and Contour Gauge aids QA operations.

Roundness, Cylindricity, and Contour Gauge aids QA operations.

M & S Centerless Grinding, Inc.    Hatboro, PA 19040
May 06, 2014 Able to be used in all circumstances for workpiece evaluation to DIN ISO 1101, MarForm MMQ 400 comes in versions for high-precision, unusually long, and large/heavy workpieces. Precision Z and X measuring axes make it possible to perform any form measuring task. Modules can be used to customize unit to precise requirements: motor-driven or manual centering and tilting table; Z axis with measuring length of 35.4, 19.7, or 13.8 in.; and X axis with measuring length of 7.1 or 11.0 in.

Metrology System measures surface and contour in single pass.

Metrology System measures surface and contour in single pass.

Mahr Federal, Inc.    Providence, RI 02905
Jul 01, 2010 Featuring automated motorized operation and joystick control, MarSurf® UD 120 has magnetic probe mounting feature that not only prevents probe damage, but allows probe changes in seconds, without additional tools. Probe offers measuring range of 10-20 mm, while drive unit allows traversing lengths from 0.1-120 mm with drive speeds from 0.1-2 mm/s. Probe's motion is sensed by optical measuring system based on rocker-arm principal with stylus tip on one end and interferometer on other.

Metrology System measures roughness/contour simultaneously.

Metrology System measures roughness/contour simultaneously.

Detroit Precision Hommel    Rochester Hills, MI 48309
Jun 27, 2008 Able to measure roughness and contour of any shape in 1 pass, HOMMEL nanoscan can measure surfaces with stroke of 24 mm with resolution of 0.68 nm. Laser interferometer features resolution of 0.6 nm, allowing surface structures from submicrometer range to 24 or 48 mm to be recorded. CNC-controlled horizontal and vertical axes include digital scales providing resolution of 10 nm and probe arms are magnetically coupled on traverse unit to simplify handling, operation, and safety.

Instruments record surface and contour data in one step.

Instruments record surface and contour data in one step.

Zeiss, Carl, Industrial Measuring Technology (IMT) Corp.    Maple Grove, MN 55369
Sep 11, 2006 Based on traditional roughness sensor, Surfcom 2000 has probing range of ±2.5 mm, while laser-controlled detector and stylus system on Surfcom 5000 delivers probing range up to ±6.5 mm at resolution of 0.31 nm. Surfcom 2000 can be reconfigured into fully automatic CNC measuring station with CNC table modules. Modular design of Surfcom 5000 permits expansion to topography measuring instrument that allows recording of surfaces in 3D mode.

Measuring System analyzes contour and surface roughness.

Measuring System analyzes contour and surface roughness.

Mitutoyo America Corp.    Aurora, IL 60504 9176
Mar 06, 2003 Formtracer® CS-Series generates contour and surface roughness analysis from single measurement of workpiece. Model CS-3000, for smaller workpieces, offers max measuring range of 10 mm and max resolution of 0.8 nm. Model CS-5000 provides laboratory level accuracy, employing Laser Holoscale™, which utilizes interference of diffracted light to achieve nanometer resolution. Formtracepak software provides analysis for dimensional/contour measurements such as radius, distance, and angle.

Gage measures contour and roughness in one stroke.

Gage measures contour and roughness in one stroke.

Mahr Federal, Inc.    Providence, RI 02905
Oct 01, 2002 With traversing length of up to 4.72 in., MarSurf™ LD 120 utilizes single drive unit and laser interferometer. System includes PC with data acquisition card and menu-driven, Windows-based software. Using triangular support design, LD 120 incorporates tracing arm with .394 in. range and magnetic tracing arm mounts. It uses 2 µm (80 µin.) radius diamond stylus tip and provides ratio of measuring range to resolution of 1.25 million to 1.




(Showing headlines 1 - 6)   


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