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Test & Measuring Instruments ->
Analyzers ->
Mechanical Analyzers
Mechanical Analyzers
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 Automated CNC Measuring System handles large, complex parts.Detroit Precision Hommel
Rochester Hills, MI 48309
May 10, 2012
With up to 7 CNC axes, Jenoptik Wavemove measures and evaluates complex shaft or prismatic parts. Workpieces are positioned in tilt fixture mounted on rotary table on granite base. With traverse length of 120 or 200 mm, system performs roughness and contour measurement using intelligent arrangement of probing systems. Detailed, exportable analyses of measuring results provide exact statements about quality of production process, based on many parameters from automotive industry.
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Angular Vibration Table has bench-top compatible design.Acutronic USA, Inc.
Pittsburgh, PA 15222
Mar 19, 2012
Used for testing of inertial sensors and other electromechanical devices, portable 105-AVT features low-noise linear amplifier, ultra-high fidelity motion, and virtually no structural dynamics. Various Units Under Test (UUTs) can be attached to flexible mounting pattern on tabletop. Along with angular acceleration sensor and safe operation detection, features include greater than 1,000 radians/sec² peak acceleration, ±5° displacement, and flat acceleration response.
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 Digital Cap Torque Tester features variable grip sizes.Mark-10 Corp.
Copiague, NY 11726
Jan 13, 2012
Series TT01 Digital Cap Torque Testers tests manual cap torque in laboratory or production environments. Tester features adjustable posts and alternate gripping attachments are available for unique container profiles. Torque capacities of 12 lb-in., 50 lb-in, and 100 lb-in. are available. With data output via USB, RS-232, Mitutoyo, and analog voltage, reporting and analysis of test data via PC or other data collectors, TT01 can calculate statistics and store up to 1,000 readings.
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Vibration Spectrum Analyzers feature ruggedized design.Datastick Systems Inc.
Santa Clara, CA 95050
Dec 26, 2011
Utilizing IP67-rated Meazura MEZ-1500 handheld computer, VSA-3300 Series detects and diagnoses problems in rotating and reciprocating machinery before breakdowns occur. Units include Datastick Spectrum v2.0 software, which provides file management system, integrated acoustical signal output, and dual view that enables user to see different transforms and different segments of same signal on screen simultaneously. Microsoft-Excel-compatible Datastick Reporting System is also included.
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Surface Defect Detection System targets steel plate industry.ULVAC
Kanagawa 253-8543 Japan
Oct 12, 2011
Model MSC90000 addresses technical requirements of steel plate industry related to coil center lines, including slitter and shear lines. Line sensor cameras repeatedly shoot different rows in accordance with movement of line using pulse generator signals to create images. In addition to automatic illuminance tuning, system offers automatic mask setting function, which determines area to be targeted for inspection based on processed images of inspection objects.
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 Rotary Torque Measurement System uses digital telemetry technology.Honeywell International, Inc.
Morristown, NJ 07960
Sep 14, 2011
Featuring non-contact design, TMS 9250 eliminates mechanical interference by measuring torque wirelessly. Modular design enables it to be adapted or customized to fit into different types of test stands to meet specific application requirements. Quick-attach wiring connectors accelerate installation, while parameters readily accessible via software system facilitate setup and adjustments. Mechanical configurations include DIN, SAE, integral coupling, shaft-to-shaft, and custom mounting.
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Wafer Defect Review System is designed for 20 nm node.KLA-Tencor Corp.
San Jose, CA 95134
Aug 19, 2011
Suitable for chip manufacturing at 20 nm device nodes and below, eDR(TM)-7000 electron-beam (e-beam) wafer defect review system addresses defect imaging and classification challenges at leading edge or located at bottom of deep trench/hole. System can drive directly to site of defect at high resolution, enabling review of multiple defects per second. Features include stage and vibration-isolation system as well as reticle defect review and voltage-contrast imaging modes.
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Quality Management System meets steel manufacturers' needs.ISRA VISION
Deutschland Germany
Aug 17, 2011
Based on Enterprise Production Management Intelligence architecture, QMS real-time quality monitoring and alarming solution provides intelligent tools needed in decision-making process and works on individual production lines, on several consecutive lines, and throughout entire company. All process data can be synchronized for analysis, corrective action, and decision making for production planning and optimization. Also, real-time alarming is available for any metric.
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 Wafer Inspection System incorporates deep UV illumination.KLA-Tencor Corp.
San Jose, CA 95134
Jul 19, 2011
Leveraging DUV wavelength, special apertures, and multiple illumination and collection channels, Surfscan SP3 addresses stringent 28 nm node requirements for defect detection and classification on blanket films at production speeds. System helps manufacture substrates for 28 nm devices and below that are nearly atomically smooth and free from polish marks, crystalline pits, terracing, voids, or other defects that disrupt electrical integrity of transistor.
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 Surface Roughness Measuring System serves on production lines.Detroit Precision Hommel
Rochester Hills, MI 48309
Jul 18, 2011
Using array of probes and accessories, ergonomically designed Hommel-Etamic W5 can track 5 separate measurement programs, up to 100 separate profiles, with total storage capacity of up to 10,000 completed measurements. Integrated click wheel and color display with GUI facilitate operation, while support prism centers workpieces reliably on correct measuring position and protects probe for measurements in bores from 12 mm dia. All necessary connection are made via USB interface.
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 Pass-Through Receiver promotes precision laser alignment.Pinpoint Laser Systems
Peabody, MA 01960
Jun 28, 2011
Used for aligning machinery and equipment, Microgage 2D Transparent Receiver allows laser beam to pass clearly through it while measuring position with precision of 0.0005 in. Unit operates over distances of 100 ft or more, and instructions guide operator through alignment project. Several accessories allow for alignment of straightness, runout, parallelism, squareness, roll and web alignment, shaft and bore alignment, flatness measuring, and more.
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 Four-Axis Receiver solves industrial alignment problems.Pinpoint Laser Systems
Peabody, MA 01960
Jun 28, 2011
Used for evaluating and correcting machinery alignment problems, 4D Microgage Receiver measures 2 linear axes (X and Y) and their 2 angular components' yaw and pitch. Linear axes show how well machinery is aligned along common centerline, while angular readouts show if parallelism problems are present. Able to operate over distances of 100 ft or more, product incorporates digital display and delivers measuring precision of 0.0005 in. and 0.002°.
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 Automated Macro Defect Inspection System suits TSV processes.Rudolph Technologies, Inc.
Flanders, NJ 07836
Jun 13, 2011
Designed for packaging processes that use through silicon vias (TSV) to connect multiple die in one package, NSX® 320 provides inspection capabilities for edge trimming metrology, wafer alignment during bonding processes, sawn wafers on film frames, and other processes. Incorporated XSoft(TM) system software capabilities include high-speed staging and on-the-fly image capture as well as range of sensor and objective options. Additionally, system can flip wafers for front/back inspection.
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Defect Analysis System is suited for PV cell manufacturers.KLA-Tencor Corp.
San Jose, CA 95134
Jun 13, 2011
FabVision(TM) Solar utilizes ICOS® PVI-6 data through range of analysis and monitoring features, captures wafer/cell images and data from PVI-6, and allows navigation that simplifies image review. Users can review in-line data at any point, and reports are generated automatically with optical inspection measurement results from multiple inspection modules across multiple manufacturing lines. Rules can be configured and set by proximity, defect type, and frequency of occurrence.
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 Bore Alignment Kit makes measurements over 150 ft range.Pinpoint Laser Systems
Peabody, MA 01960
Jun 09, 2011
Suited for industrial applications, Microgage Bore Alignment Kit consists of cylindrical laser that can be adapted to bores of all sizes. Laser reference beam is projected to digital receiver held in reversible bore mount, allowing receiver to detect laser beam coming either through bore or entering bore. Measurement readings, as small as 0.0001 in., are transmitted to handheld display and define bore or shaft's alignment, guiding user to what changes are needed for optimal performance.
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 Laser Alignment Kit checks production line machinery.Pinpoint Laser Systems
Peabody, MA 01960
May 16, 2011
Comprised of laser transmitter, digital receiver, and handheld display, Laser Microgage 2D Kit can measure and realign misaligned rolls and web systems, uneven travel on CNC machine tools, and poorly aligned bore tubes. Rotating base helps align and check flat planes, while right angle beam bender squares machinery. Readings are shown on LCD screen in 0.0001 in. increments or millimeters. To store readings and generate printouts, Microgage connects to laptop or PC via interface cable.
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Form/Surface Measurement System utilizes optimized controller.Mahr Federal Inc.
Providence, RI 02905
Feb 03, 2011
MarForm MMQ 400-2 Formtester samples data with spacing as tight as 0.005 microns. Integrated controller optimizes machine's speed and resolution while allowing measurement of surface finish characteristics to ISO, ASME, and JIS standards. Supplied with skidded probe roughness package, software-controlled solution offers manual or motorized center and tilt tables; vertical Z-axis lengths of 350, 500, or 900 mm; and horizontal X-axis of 180 or 280 mm.
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Wafer Edge Inspection System finds defects as small as 2 microns.Altatech
MONTBONNOT-SAINT-MARTIN 38330 France
Dec 02, 2010
AltaSight EyeEdge® inspection system can image defects along edges of 300 mm semiconductor wafers with throughput of 100 wafers/hr. Enabling single-pass inspection, unit's 3 high-speed optical sensors collect data to define size, shape, and location of defects anywhere within 1.5 mm of wafer's edge. System then generates 3D image of each surface anomaly. Optional 4th sensor analyzes programmable crown area on wafer's frontside edge to enable layer-overlapping control.
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 Bore Alignment Kit takes measurements over 150 ft range.Pinpoint Laser Systems
Peabody, MA 01960
Nov 08, 2010
Consisting of cylindrical laser that can be adapted to bores of all sizes, Microgage Bore Alignment Kit projects laser reference beam to digital receiver that is held in mount with similar precision bore diameter. Measurement readings as small as 0.0001 in. are transmitted to handheld display to define bore or shaft's alignment and guide user to what changes are needed. Using computer interface, Microgage can store readings and connect to common programs and spreadsheets.
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 Shaker Head Expanders allow testing of multiple items at once.Bruel & Kjaer
Norcross, GA 30071
Sep 24, 2010
Cast in magnesium alloy, LDS head expanders have Finite Element Analysis design that ensures products are usable over large frequency range. Expanders, when coupled with shaker system, enable vibration testing on many different applications, such as helicopter gearboxes, aircraft engines, and performance car components. Units also offer lifting capabilities to ensure user's safety.
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(Showing headlines 1 - 20) more ....
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Latest Products in the News |
Brüel & Kjær - May 1, 2012 Carlisle Interconnect Technologies' Vibration Test System Gives Quick Return on Investment
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Renishaw, Inc. - March 19, 2012 Renishaw Announces Additional Exhibits at MACH 2012
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Analog Devices Inc - October 21, 2011 Leading Sports Motion Research Center Adopts Analog Devices' MEMS Sensor Technology to Train Competitive Rowers
Rudolph Technologies, Inc. - October 12, 2011 Rudolph Receives First Orders for 450 mm Defect Inspection and Thin Film Metrology Systems
J. P. Sercel Associates (JPSA) - September 26, 2011 JPSA to Collaborate with University of Delaware, and MIT for SunShot Initiative
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