Electrical & Optical Analyzers

Test & Measuring Instruments, Automatic ID

Site Analyzer detects passive intermodulation over CPRI.

August 26, 2015

Portable and rugged with 12 in. touchscreen, PIM Site Analyzer-alpha provides multi-function on-site tests and measurements of active and passive elements — whether outdoor or indoor systems, RF or fiber optic. Plug-and-play modular and broadband design with exchangeable band filter units ensures flexibility and future-proofs system. Operating from battery and 110/220 Vac, analyzer provides antenna isolation measurement, DTF measurement, and VSWR/Return loss measurement. Read More

Test & Measuring Instruments

High-Fidelity PCIe Digitizer supports RF, wireless measurements.

August 25, 2015

U5303A 12-bit PCIe® digitizer supports BB1 application option that enhances performance by compensating ADC and front-end distortion, minimizing interleaves spurs, and reducing overall noise bandwidth. This results in improved and uniform measurement fidelity across useful bandwidth to benefit RF and wireless frequency domain measurements. Also, post processing compensation lends to optimized SFDR and intermodulation product specifications. Achievable DAQ length is up to 64 MS/channel. Read More

Optics & Photonics, Sensors, Monitors & Transducers, Test & Measuring Instruments

Microscopy System analyzes multi-scale and multi-modal images.

August 11, 2015

Consisting of hardware and software package, ZEISS Atlas 5 extends capacity of SEMs and FIB-SEMs. System streamlines automatic image acquisition, enabling navigation and correlation of images from any source including light and X-ray microscopes. Users can acquire large sets of 2D or 3D microscope images for hours, or even days, without operator supervision. Correlative workspace brings together images from multiple sources: zooming in from full macroscopic view down to nanoscale details. Read More

Optics & Photonics, Test & Measuring Instruments, Services

EMI Receiver enhances emissions diagnostics with RTSA option.

August 10, 2015

Standards-compliant MXE EMI receiver with real-time spectrum analysis (RTSA) option enables labs to observe and diagnose transient and wideband emissions during EMC compliance and precompliance testing. Specifically, RTSA mode enables MXE to provide real-time analysis bandwidth up to 85 MHz below 3.6 GHz and up to 40 MHz above 3.6 GHz. Frequency mask trigger (FMT) capability, included with RTSA, allows users to trigger on signals with durations as short as 17.4 µsec. Read More

Test & Measuring Instruments, Materials & Material Processing

Power Analyzer accelerates accurate early assessments.

August 7, 2015

Built on multi-threaded architecture, Cadence® Joules™ RTL Power Solution lets SoC designers analyze power consumption during design exploration. Rapid prototype technology enables this register-transfer level (RTL) power analysis solution to analyze designs of up to 20 million instances with gate-level accuracy within 15% of final power as signed off in Cadence Voltus™ IC Power Integrity Solution. Also, additional integration fosters system-level power analysis and optimization. Read More

Test & Measuring Instruments

Multi-Parameter Analyzers are available with fieldbus interfaces.

July 31, 2015

Stratos Evo DP, Stratos Pro PA, and Stratos Pro FF, respectively featuring integrated bus interfaces for PROFIBUS DP, PROFIBUS PA, and FF, integrate into new and existing host systems. Stratos Pro devices for PROFIBUS PA or Foundation technology come in versions for hazardous and non-hazardous areas, while Stratos Evo DP for PROFIBUS DP only works outside of hazardous areas. All settings can be configured directly on device or with standardized engineering tools via Enhanced EDD or DTM. Read More

Computer Hardware & Peripherals, Test & Measuring Instruments

Network Analyzer accelerates root-cause discovery.

July 29, 2015

Available for rental, Fluke Networks OptiView® XG Network Analysis Tablet enables IT and network engineers to analyze wired/wireless network versus application issues when problems occur or during initial set-up. Tablet finds devices, networks, and problems within seconds to get to root-cause, while network monitoring with performance health checks helps optimize critical infrastructure and applications on track for smooth running. Read More

Optics & Photonics, Test & Measuring Instruments

Signal/Spectum Analyzer covers 2 Hz to 85 GHz range in one sweep.

July 14, 2015

Offering touchscreen operation, R&S FSW85 enables users to test baseband and RF with one analyzer. No external harmonic mixers are required, which facilitates test setup, and internal preselection suppresses image frequency and other spurious emissions that typically occur during harmonic mixing. Optionally, instrument can be equipped with internal analysis bandwidth of 500 MHz. When combined R&S FSW-B2000 option and R&S RTO oscilloscope, analysis bandwidth of 2 GHz can be achieved. Read More

Test & Measuring Instruments

Signal Analyzer offers modular stimulus response measurement.

July 8, 2015

With built-in tracking generator, M9290A CXA-m PXIe Signal Analyzer offers 3, 7.5, 13.6, and 26.5 GHz options, making it suitable for characterizing behavior of components or subsystems, including frequency response, conversion loss, and insertion loss/gain, as well as analyzing and identifying unknown signals. VXA measurement application provides CXA-m with vector signal analysis mode that supports wide range of measurements, demodulation types, and filters for comprehensive signal analysis. Read More

Test & Measuring Instruments

Graphical Power Analyzer validates power-critical designs.

July 6, 2015

Integrating wideband waveform digitizer and 7 in. color LCD, PA900 Precision Power Analyzer delivers waveform visualization and measurement results necessary to validate performance of power-critical designs. Unit offers intuitive touchscreen operation with built-in data history, scope mode, and waveform zoom. Equipped with USB flash drive port and 2 GB of internal memory, PA900 can be fitted with 3 different types of channel cards, and can measure and graphically display up to 500 harmonics. Read More

Test & Measuring Instruments

Video Quality Monitor supports HEVC/H.265 encoded streams.

July 2, 2015

Available with version 9.3 software, Sentry provides scalable HEVC solution for monitoring quality of service (QoS) and quality of experience (QoE). Support for 4K/UHD, which lets VSPs and network operators detect critical issues in real-time, and in-depth reporting enable continual network improvements. Supporting transition to 4K, monitors also feature digital program insertion monitoring capabilities that support blackout descriptor tags specified in SCTE-35 2012. Read More

Test & Measuring Instruments

Impedance Analyzer accelerates production testing.

July 1, 2015

With enhanced measurement speed option, E4990A enables passive component manufacturers to realize fast sweep speeds at low frequency. Specifically, operators can use said option with 10, 20, 30, or 50 MHz options for accelerated measurement. Typical basic accuracy is 0.045% over impedance range with 40 V built-in DC bias source, and equivalent circuit analysis function, which supports 7 different multi-parameter models, lets engineers simulate equivalent component parameter values. Read More

Test & Measuring Instruments, Sensors, Monitors & Transducers

TBT Verification Tool simplifies safety compliance testing.

June 24, 2015

Fluke® PRV240 Proving Unit provides safe method for 3-point test before touch (TBT) verification of electrical test tools without placing electrician or technician in potentially hazardous electrical environments generally involving known live voltage sources. Use reduces risk of shock and arc flash and does not require personal protective equipment. Able to source 240 V of AC and DC steady-state voltage, unit can perform up to 5,000 tests per set of 4 AA batteries. Read More

Test & Measuring Instruments, Optics & Photonics, Machinery & Machining Tools

Laser Beam Monitoring System supports dynamic measurements.

June 24, 2015

Featuring magnification optics for measuring beams with spot sizes down to 55 µm, non-contact BeamWatch® 2.0 monitors high-power (up to 100 kW) YAG, fiber, and diode lasers in 980–1,080 nm range used in industrial material processing applications. Unit takes measurements every 60 msec, providing instant readings of focus spot size and beam position as well as dynamic measurements of focal plane location during process start-up. Dual axis measurement support is available Read More

Computer Hardware & Peripherals, Test & Measuring Instruments

Test Bed supports network function virtualization.

June 11, 2015

With TeraVM Elastic Test Bed, network function vendors and service providers can share lab assets between facilities. This enables engineers to create virtual test pods to stress test network functions. Traffic generation resources can be dynamically reallocated to where they are needed most, bringing agility and scalability to test operations. Elastic test bed enhances TeraVM IP traffic emulation tool by enabling test pods which can scale to terabits per second of application traffic. Read More

Communication Systems & Equipment, Test & Measuring Instruments

Video Testers perform HDMI 2.0 compliance tests.

June 11, 2015

Supporting additional tests, R&S VTC/VTE/VTS Series provides in-depth assessment of 4K/UltraHD consumer electronics equipment for compliance with HDMI 2.0 interface standards. These include tests for HDMI sources on devices such as media players or mobile phones as well as for HDMI sinks including TVs, AVV receivers, or projectors. Certified 6G tests include: Source TMDS Protocol, Source Video Timing, Source AVI InfoFrame and GCP, Sink Video Timing, and Sink Pixel Decoding.  Read More

Test & Measuring Instruments

Refracto-Polarimeters feature compact, portable design.

May 29, 2015

Comprising 5 models, RePo Series combines measurement of refractive index and angle of optical rotation. With as little as 3 mL sample, instruments can measure both brix and optical rotation of sample. Purity, international sugar scale, specific rotation, and concentration can be displayed with press of button. Users can also set upper and lower measurement limit. Indicator light alerts user if measurement value is within limits, allowing for optimal efficiency. Read More

Test & Measuring Instruments, Optics & Photonics

Phase Noise Analyzer/VCO Tester supports functional upgrades.

May 22, 2015

Covering frequency range up to 50 GHz, R&S FSWP phase noise tester can measure spectral purity of such signal sources as generators, synthesizers, and VCOs. Phase noise of local oscillator, coupled with cross-correlation, facilitates signal source measurement. In addition to being able to measure phase noise of pulsed sources as well as residual phase noise under pulsed conditions, unit can also be upgraded to signal and spectrum analyzer. Read More

Computer Hardware & Peripherals, Test & Measuring Instruments

Test Kit combines network, cable, and voltage testing.

May 20, 2015

Combining network testing (physical layer and link), IP device address mapping, cable troubleshooting, and PoE voltage testing in handheld tester with full-color display, Net Prowler™ Pro Test Kit can save and print test results from PC. System will display wire map, numbered ID remotes, and any faults. Using TDR technology, Net Prowler™ measures cable length and generates tone levels for signal tracing and cable identification on all pairs, selected pair, or selected pin. Read More

Test & Measuring Instruments, Optics & Photonics, Computer Hardware & Peripherals

Microwave VNAs support integrated spectrum analysis capability.

May 20, 2015

PNA and PNA-X Series microwave vector network analyzers (VNAs) support spectrum analyzer capability, which simplifies system connections and conserves time by instilling high-speed spurious measurements in instruments used to characterize S-parameters, compression, and distortion. Also, VNAs can perform simultaneous spectrum measurements on all test ports, while in-fixture and on-wafer measurements gain benefits of VNA calibration and de-embedding. Read More