Qualitest International Inc
Fort Lauderdale, FL 33308
Mar 05, 2009 Designed for on-site analysis, EDX Pocket III Handheld X-Ray Fluorescence (XRF) Spectrophotometer features electronically refrigerated Si-PIN detectors that eliminate need for liquid nitrogen and allow standalone use in temperatures from -4 to +122°F. Product, available with software packages for different application fields, provides laboratory-quality analysis of high- and low-alloy steel, minerals, precious metals, RoHS elements, and soil as well as light elements.

Qualitest International Inc
Fort Lauderdale, FL 33308
Mar 02, 2009 Advanced dynamic mechanical rheological test instrument, RPA 8000 Rubber Process Analyzer can measure properties of polymer and rubber compounds prior to, while, and after curing. It has range of oscillation angle, oscillation frequency, torque, and temperature, and can read differences in rheological, rheometric and dynamic viscoelastic properties of tested material. Compliant with ASTM D6204, D5289 and D6601, product includes software with pre programmed test methods.

SensComp, Inc.
Livonia, MI 48150
Feb 19, 2009 Connected to PC, X1 Ranging Module Pro(TM) lets users view critical sensor parameters for instruction, analysis, alignment, and gain calibration. It combines all standard functions of ultrasonic ranging module as well as multi-channel, USB-based oscilloscope feature. Analog output is 0-5 Vdc, with pushbutton Min and Max range setting of 6 in. to 20 ft. Along with X1 module, developers kit includes electrostatic ultrasonic transducer (with housing), power supply, USB cable, and software.

Edmund Optics
Barrington, NJ 08007
Feb 02, 2009 Designed to create surface that diffusely reflects light back, Diffuse Reflectance Grid Distortion Targets allow user to avoid glare across image surface. Units feature chrome pattern on substrate and produce no glare with either on- or off-axis lighting sources. They are available in 2 x 2 in. configuration with dot sizes of 0.0625, 0.15, or 0.25 mm, as well as 3 x 3 in. configuration in dot sizes of 0.125, 0.25, and 0.5 mm.

Skyray XRF
Georgetown, DE 19947
Jan 23, 2009 Based on silicon-pin detector system, Pocket-III offers expanded element range of sulfur to uranium and is designed for steel and alloy testing, hazardous substance detection, geological mining applications, and precious metal analysis. Unit includes laser light alignment feature and ability to automatically adjust various filters. Software uses removable PDA for short-term data storage and Bluetooth technology to transfer results for long-term storage and analysis.

Porous Materials, Inc.
Ithaca, NY 14850
Dec 16, 2008 Passing vapor through sample held in sample chamber, PMI capillary condensation flow porometer measures pore size by pressure at which vapor condenses into pores, and determines pore distribution from vapor flow rate due to small imposed pressure gradient. It measures pore diameter of nanopore samples without using any toxic materials or extreme pressures and temperatures. Unit is suited for characterization of porous membranes used in industries such as biotechnology and healthcare.

MOCON
Minneapolis, MN 55428 1010
Dec 12, 2008 Offering manual and automatic sampling, benchtop PAC CHECK® Model 450 EC measures O2 concentration from 0-100% in package types ranging from small blisters to large pouches. Flo Smart(TM) sensing system knows when blockage has occurred in testing line and notifies operator. Utilizing ambient air and electronic controls, 1-button Cal-Smart(TM) feature performs 2-point calibration. Applications include nitrogen-flushed products such as case-ready meats, cheese, and snacks, plus certain pharmaceuticals.

Skyray XRF
Georgetown, DE 19947
Dec 05, 2008 Featuring top-down measurement system that allows for sample stage with 3D movement, Thick-800 XRF can provide measurements of single-layer, multi-layer, thin-film coatings, and solders with composition. It utilizes electro-cooled Silicon-PIN semiconductor detection system offering resolution of 149-160 eV and does not require liquid nitrogen. Developed with color-camera sample viewing system and double laser position technology, unit ensures sample alignment accuracy.

Solar Metrology
Holbrook, NY 11714
Dec 02, 2008 Designed for in-line film composition and thickness control of CIGS and CdTe film stacks, SMX-ILH can measure rigid glass substrates as well as flexible stainless steel and polyimide roll-to-roll substrates. It provides process control of active, contact, and TCO layers and is capable of insertion into printed, electrochemical, and thermal deposited film processes. Optional proprietary Thermal shield allows for film control at panel temperatures of up to 300°C.

PANalytical, Inc.
Westborough, MA 01581
Nov 18, 2008 Axios FAST wavelength dispersive X-ray fluorescence spectrometer allows simultaneous fixed-channel measurements of up to 28 elements and incorporates 4 kW SST-mAX X-ray tube with ZETA-technology, which promotes stable tube output. Sample loading turret mechanism allows introduction of new samples even while measurement is in progress, while externally mounted measuring channels give users access for routine maintenance, addition or removal of channels, and initial alignment.

Matrix Metrologies, Inc.
Holbrook, NY 11741
Nov 18, 2008 XRay ComPact eco Benchtop XRF system provides non-destructive measurement of total Pb, Hg, Cr, Br, and Cd in materials. XRF spectrometers can be configured with gas-proportional, Si-PIN, or Silicon Drift type detectors and primary beam filtration. System provides Pb sensitivity and measurement confidence required at 1,000 ppm action level. Mechanical or optical X-ray beam collimation, in conjunction with video camera alignment, allows confirmation of specific analysis areas and features.

Agilent Technologies, Inc
Santa Clara, CA 95051
Nov 12, 2008 Agilent B1505A Power Device Analyzer/Curve Tracer can characterize semiconductor devices at up to 3,000 V and 20 A. Key features include accurate measurement of breakdown voltage and leakage currents at high voltage, evaluation of low on-resistance of power devices at high current, and troubleshooting for failure analysis of these devices and power electronic circuitry. Windows(TM) PC-based device includes EasyEXPERT software for operation and data management.

Agilent Technologies, Inc
Santa Clara, CA 95051
Nov 12, 2008 Agilent L4532A 2-channel and L4534A 4-channel stand-alone LXI digitizers offer simultaneous sampling at up to 20 MS/sec with 16-bit resolution. Isolated input channels measure up to ±250 V and are designed to handle applications requiring electromechanical device control for product test or characterization. Digitizers include on-board measurements such as Vmin/Vmax, Vp-p, frequency, and rise/fall time that can be applied to selected portion or overall waveform.

Photovac Inc.
Waltham, MA 02451 1166
Oct 28, 2008 Voyager Portable Gas Chromatograph offers on-site capability for measuring critical sulfur species to establish sulfur and VOC content in natural gas, thereby allowing production companies to determine corrective measures for scrubbing and removal of contamination. Datalogging capability enables readings to be stored in instrument and downloaded to computer for analysis and recordkeeping. Voyager is intrinsically safe for operations in hazardous environments.

Emerson Process Management
Austin, TX 78754
Oct 23, 2008 Model 1057 combines up to 3 measurements, heterogeneously selectable from pH, ORP, and contacting conductivity/resistivity. Additionally, four 4-20 mA current outputs allow live measurement data, along with process temperature, to be communicated to SCADA, PLC, or DSC host monitoring systems. Modular design allows in-field signal input board replacement, while Quick Start programming screens, measurement board auto-recognition, and menu screens facilitate setup/use.

Fluke Corp.
Everett, WA 98203
Oct 15, 2008 Designed for maintenance specialists who keep automation and process plant equipment operational, Fluke Color ScopeMeter® 225C (200 MHz, 2.5 GS/s) and 215C (100 MHz, 1 GS/s) verify electrical integrity of bus and network by performing physical layer tests. They perform signal validation of all critical signal parameters, such as amplitude and noise, and have floating and fully isolated inputs for true differential signal measurements on 2-wire differential bus systems.

Oxford Instruments Analytical
High Wycombe HP12 3SE  United Kingdom
Oct 02, 2008 Combining silicon drift detector with 45 kV X-ray tube and traceable Empirical Calibration, Model X-MET5100 enables light elements such as Mg, Al, and Si to be measured. X-MET5100 assures laboratory quality analysis of aluminum and titanium alloys, as well as copper, nickel, and steel. Restricted elements, lead in toys, contaminants in soil, and small concentrations in ores can be measured down to ppm level. Device is IP54 approved for dust and water splash protection.

Radiometer America, Inc.
Westlake, OH 44145
Sep 23, 2008 Measuring pH, blood gases, electrolytes, and glucose parameters, ABL80 FLEX CO-OX uses CO-oximetry technology that utilizes multiwavelength technology for high measurement performance combined with ultrasonic hemolyzation process. Device allows cartridge-based testing and includes self-cleaning sample inlet, automatic QC with automated corrective actions, and connectivity to HIS/LIS.

Thermo Fisher Scientific
Waltham, MA 02454
Sep 10, 2008 Designed to increase productivity for users in HPLC and Fast LC analyses, Thermo Scientific Hypersil GOLD columns, packed with 1.9 µm particles, are available in 2 dimensions. Utilized for dissolution tests, reaction monitoring, and main band assays, Thermo Scientific Hypersil GOLD 1.9 µm Javelin(TM) HTS 10 mm column enables analysis times as rapid as 8 sec to be achieved. Javelin HTS column format utilizes low dead volume and direct-connect hardware to minimize dispersion.

EDAX, Inc.
Mahwah, NJ 07430
Sep 02, 2008 Available with mono-capillary optics or as a PC with high-intensity poly-capillary optic, Orbis micro-XRF elemental analyzer incorporates motorized turret that integrates video and x-ray optics for coaxial sample view and x-ray analysis over rough sample topography without sacrificing signal intensity. Users can make elemental analyses on small samples such as particles, fragments, and inclusions, or conduct automated multi-point and elemental imaging analysis on larger samples.