Agilent Technologies, Inc.
Palo Alto, CA 94304
Jun 13, 2003 InfiniiMax E2696A 6 GHz active differential probe allows users of spectrum and network analyzers to make high-impedance measurements on differential signals and quickly validate differential signal designs. It offers low 320 fF differential input capacitance for minimal reactive loading and disturbance of signals in system under test. Variable spacing and Z-axis compliant tips make it easy to probe differential signals on variety of target configurations.

E Instruments
Trenton, NJ 08638
May 07, 2003 Accurate up to 0.006% of reading, MicroCal 20 Documenting Process Calibrator ensures compliance of measuring and test equipment with quality calibration standards. Unit simultaneously performs measurement and simulation of 7 different parameters in addition to pressure calibration with 2 internal pressure sensors up to 300 psi FS or one external pressure sensor up to 10,000 psi. Offerings include data logging, HART protocol and built-in environmental module.

ILX Lightwave Corp.
Bozeman, MT 59771 6310
Feb 13, 2003 Model LPA-9080 laser diode controller and power meter includes SPA-9000 software with Test Edit Wizard for creating flexible laser diode test setups. Software enables customization of screen-based and printed output, while built-in Microsoft Access® database allows for data analysis, report generation, and export of data to other applications. Software also includes Manual Control mode for operating LPA-9080 unit as laser diode controller with internal power meter.

ILX Lightwave Corp.
Bozeman, MT 59771 6310
Jan 09, 2003 Model OMH-6780B or 6790B Power/Waveheads with OMM-6810B Optical Multimeter or LPA-9080 Series Parameter Analyzer measure up to 10 W and wavelength within 0.2 nm. Fiber exit port allows connection to OSA to make spectral measurements.

Nikon, Inc. Instrument Group Div.
Melville, NY 11747
Jul 26, 2002 NRM-3000 provides automatic measurement of overlay and NSR focus marks. Illumination system is bright and optically matched to imaging system. It employs fiber optic delivery system to quartz-halogen lamps. System utilizes actively damped stage and EGA alignment control technology to assure correct measurements. Software offers recipe management functions. Waferless recipe creation offers automatic recognition of stepper alignment marks and other unique patterns.

TA Instruments
New Castle, DE 19720
Apr 25, 2002 SDT 0600 materials characterization analyzer simultaneously provides heat flow measurement from ambient temperature to 1,500 deg C and weight change. It has dual balance mechanism, bifiliar found furnace, and horizontal purge gas system with mass flow control and gas switching capability. Platinum/platinum-rhodium thermocouple embedded in each beam ensures accurate and precise transition and differential temperature measurements.

Kernco Instruments Co., Inc.
El Paso, TX 79927 7338
Feb 06, 2002 Digital LCD Oxygen Analyzer uses galvanic sensor to measure percent oxygen in air and ppm of dissolved oxygen in aqueous solutions, with accuracy of +/-5.0% saturation and +/-0.2 ppm, and precision of 0.1%. It is temperature compensated for air calibration and follows Henry's Law for indication of ppm dissolved oxygen. Oxygen sensor is maintenance free, does not require membrane replacements, and has expected life of 18 months.

Luna Technologies
Blacksburg, VA 24060
Dec 18, 2001 OVA 1550 checks optical components used in high-bit-rate applications. It measures insertion loss, polarization mode dispersion, polarization dependent loss, group delay, chromatic dispersion, second-order PMD and crosstalk/isolation. It uses laser interferometric technique that makes complete optical analysis in single sweep in less than 300 msec per nanometer. Most components can be tested in less than 30 sec.