Electronic Microscopes

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Optics & Photonics, Test & Measuring Instruments, Vision Systems

Digital 2D Microscope operates without PC.

October 7, 2016

Delivering video-image quality at 60 fps, Omni HD 2D Digital Microscope and Measurement System can remain in calibration over entire zoom range, making it suitable for quality control, testing, rework, assembly, and inspection tasks. Custom-designed mouse or GUI provides intuitive operation of entire system. To ensure sharp, high-contrast imaging, separate camera control station allows manual adjustments for auto and manual focus, exposure, gain, brightness, and white balance. Read More

Optics & Photonics, Test & Measuring Instruments

ZEISS Highlights Latest Microscopy Innovations and Advancements at International Manufacturing Technology Show

August 29, 2016

Visit Booth # E-5502 for demonstrations of the newest microscope instruments for manufacturing applications ZEISS announces they will be showcasing the latest microscopy innovations and advancements at the International Manufacturing Technology Show (IMTS), September 12-17, 2016, at McCormick Place, in Chicago, IL. ZEISS experts will be on hand at Booth # E-5502 to highlight and demonstrate... Read More

Optics & Photonics

Ergonomic 120 kV S/TEM targets life and materials sciences.

August 25, 2016

Offering users access to scientific results regardless of experience, Talos™ L120C transmission/scanning transmission electron microscope (S/TEM) provides Hi-Res, 3D imaging and analysis capabilities. Automation and directed workflows foster facilitated adoption path and accelerate results without compromising performance. Along with ultra-stable optics, this 120 kV LaB6 S/TEM features MAPS™ software and Smartcam screening camera. Latter permits remote operation. Read More

Optics & Photonics, Sensors, Monitors & Transducers

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

July 27, 2016

Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields Hillsboro, Ore. and Ithaca, NY — FEI (NASDAQ: FEIC) and Cornell University have entered an agreement to commercialize a new high dynamic range detector for FEI’s electron microscopes. It promises to enable new kinds of multichannel... Read More

Optics & Photonics

Automated S/TEM delivers high-performance imaging, analysis.

July 18, 2016

Themis™ Z scanning/transmission electron microscope (S/TEM) offers system stability and automated tuning routines that promote reproducible image resolution at high and low beam energies in both STEM and TEM modes. Energy dispersive x-ray systems let users configure system based on primary characterization needs, and iDPC detector, by using up to 90% of transmitted electrons, offers high sensitivity to lighter elements while preserving atomic-scale resolution and direct image interpretation. Read More

Chemical Processing & Waste Management, Laboratory and Research Supplies & Equipment, Optics & Photonics, Plant Furnishings & Accessories

Microscopy Systems support materials science applications.

June 29, 2016

Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous generation. With Auto Slice & View 4.0 software, unattended FIB nanotomography is possible. Read More

Chemical Processing & Waste Management, Machinery & Machining Tools, Optics & Photonics, Test & Measuring Instruments

FEI Launches Three New Tools for Next-Generation Semiconductor Manufacturing

June 20, 2016

New solutions are designed to address the challenges of 7nm technology node metrology and defect/failure analysis.  Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node, and all are designed to allow manufacturers... Read More

Optics & Photonics, Software

FIB/SEM Systems utilize 3D reconstruction software.

June 17, 2016

Designed to work with all DualBeam focused ion beam/scanning electron microscope platforms, Auto Slice & View v4.0 software enables 3D structure and composition of samples at nanometer scale. Imaging can be combined with analytical capabilities, such as energy dispersive x-ray spectrometry and electron backscatter diffraction, to ensure that no information is lost in sectioning of sample. Algorithms help to ensure uniform thickness of slices and precise and reproducible placement of each cut.
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Optics & Photonics

Scanning Electron Microscope supports diverse applications.

May 5, 2016

With compound final lens, Apreo™ offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sample even if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually addressed to optimize for angular contrast or signal intensity and extract important information. Read More

Optics & Photonics

FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm

April 28, 2016

Developed in the frame of University Ulm's SALVE project, the microscope provides high-contrast, atomic-scale imaging of radiation-sensitive samples, such as graphene and organic materials. Hillsboro, Ore. and Heidelberg, Germany — FEI (NASDAQ: FEIC) and CEOS announced today that they have delivered the first sub-Ångstrom, low-voltage electron (SALVE) microscope to the University of... Read More

Optics & Photonics, Test & Measuring Instruments

Digital Microscope offers full-HD 360-degree rotating views.

April 28, 2016

Designed for quality control, testing, inspection, and documentation, rotating viewer accessory for EVO Cam Digital Microscope delivers oblique view of subject that can be rotated 360° around central point. User can seamlessly switch between 360° rotating view to conventional direct top view. Then, with touch of button, capture full-HD images. EVO Cam provides live video streaming, 1080p/60 fps image quality, LED ring light illumination, and ability to save images to USB memory stick. Read More

Optics & Photonics, Test & Measuring Instruments, Vision Systems

Portable USB Microscope offers reflection-free surface imaging.

March 2, 2016

Connecting to PC via USB, MC-TLD6182 offers 20X–200X magnification to determine fine structure of surfaces. Digital camera, included, lets operator take 2.0 MP pictures, which can be interpolated to 5.0 MP pictures. Used in direct contact to surface or at larger distances, microscope also features 8 integrated, adjustable-strength, white LED lights and software for editing and making videos that also lets users determine object length, width, height, and angle to radius.
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Chemical Processing & Waste Management, Optics & Photonics

TEM Sample Preparation System aids failure analysis labs.

November 5, 2015

Available in FX and HX models, Helios™ G4 DualBeam Series offers 7 nm TEM lamella preparation solution for semiconductor manufacturing and failure analysis applications. Flexible FX system delivers STEM resolution down to sub-three Ångströms and enables images to be obtained within minutes of completing lamella. HX model, geared specifically for high-throughput TEM lamella production, features automated QuickFlip holder that minimizes sample preparation times. Read More

Optics & Photonics, Sensors, Monitors & Transducers, Test & Measuring Instruments

Microscopy System analyzes multi-scale and multi-modal images.

August 11, 2015

Consisting of hardware and software package, ZEISS Atlas 5 extends capacity of SEMs and FIB-SEMs. System streamlines automatic image acquisition, enabling navigation and correlation of images from any source including light and X-ray microscopes. Users can acquire large sets of 2D or 3D microscope images for hours, or even days, without operator supervision. Correlative workspace brings together images from multiple sources: zooming in from full macroscopic view down to nanoscale details. Read More

Optics & Photonics

ZEISS Highlights Range of Microscopes and Imaging Solutions at M&M 2015

August 3, 2015

Visit Booth 638 to discover new insights to real world questions ZEISS announces it will be highlighting a wide range of precision microscopes, imaging solutions, and software at MM 2015, the Microscopy Microanalysis 2015 Meeting, which will be held August 2-6, 2015 at the Oregon Convention Center in Portland, Oregon. On display at Booth #638 will be the ZEISS GeminiSEM field emission... Read More

Optics & Photonics, Thermal & Heating Equipment

Edge Heating System optimizes TEM performance.

August 3, 2015

Combining Aduro semiconductor-based thermal sample supports with redesigned TEM holder, Aduro with Edge technology optimizes thermal accuracy and uniformity for in situ heating experiments while minimizing thermal drift. Edge technology maximizes performance of Transmission Electron Microscope by allowing scientists to visualize materials at nano and atomic scale while at accurate and uniform temperatures. It provides 99.5% temperature uniformity of imaging area with 95% thermal accuracy. Read More

Optics & Photonics

ZEISS and University of California Berkeley Launch Public-Private Partnership to Support Brain Microscopy Innovation Center

June 17, 2015

Microscopy tools optimized for use with emerging neurotechnologies provided for researchers Jena/Germany, Berkeley/USA – ZEISS announces that it is participating in a new public-private partnership with UC Berkeley as part of the Brain Microscopy Innovation Center (BrainMIC), a component of the Berkeley BRAIN Initiative. The Brain Research through Advancing Innovative Neurotechnologies... Read More

Optics & Photonics

ZEISS Highlights Scanning Electron Microscopes at EIPBN 2015

May 27, 2015

Visit Booth 113 to learn about ZEISS GeminiSEM and ZEISS MultiSEM 505 technology ZEISS announces they will be highlighting a range of scanning electron microscope (SEM) technology at EIPBN, the 59th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication, May 26-29, 2015, at the Manchester Grand Hyatt in San Diego, CA, Booth # 113. Stop by and learn more... Read More

Laboratory and Research Supplies & Equipment, Optics & Photonics

FEI Partners with the George Washington University to Equip New Science and Engineering Hall

April 30, 2015

Suite of new high-performance microscopes will be used for cutting-edge experiments at GW’s new research facility. WASHINGTON – FEI (NASDAQ: FEIC) and the George Washington University (GW) are pleased to announce that they are partnering to install several new high-performance microscopes at GW’s Science and Engineering Hall. The new, $275 million, 500,000-square-foot research facility... Read More

Optics & Photonics, Vision Systems

Wireless Microscopy Instruments enhance classroom interactivity.

April 29, 2015

While Leica EZ4 W consists of educational stereo microscope with built-in wireless camera, Leica ICC50 W digital camera can be added to educational compound microscopes. Both Wi-Fi®-capable systems transfer HD images directly to mobile devices; iOS- and Android-compatible AirLab App allows capture, annotation, sharing, and organization of images to foster interactivity within biology, anatomy, chemistry, geology, and material sciences classrooms. Read More