With integrated silicon-drift X-ray detector, digital multichannel analyzer, and intuitive software, Model 8500B allows users to perform quantitative elemental analysis on arbitrary points, on continuous line scan, or in user-defined regional map. Energy Dispersive Spectroscopy results are analyzed and displayed in real-time and researchers can export data for further off-line analysis. Patented event-streamed spectrum imaging saves full spectrum at every pixel for analysis and display. Read More
Integrating SEM with VolumeScope™ in-chamber microtome and analytical software, Teneo VS™ provides fully automated, large-volume reconstructions with optimized Z-axis resolution. VolumeScope uses serial block face imaging to acquire 3D volume from block of tissue or cells. ThruSight multi-energy deconvolution resolves features at different depths within each slice, while MAPS software uses tiling and stitching to acquire high-resolution composite images that are larger than single field of view. Read More
Able to identify and localize biological molecules of interest even in challenging specimens, LSM 880 offers optimal resolution in all spatial dimensions, 140 nm laterally and 400 nm axially, as well as sensitivity that promotes image quality and speed. Multichannel area detector with 32 elements collects all light from Airy disk simultaneously. Knowing beam path and spatial distribution of each Airy disk enables light-efficient imaging; researchers can use all photons that objective collected. Read More
Utilizing plasma focused ion beam, Helios™ PFIB DualBeam™ delivers rapid 3D imaging and analysis for metals research as well as delamination of paints and coatings and analysis of grain boundaries, thin films, interfaces, and adhesion layers. Teneo™ Scanning Electron Microscope, featuring non-immersion objective lens, provides high-resolution, high-contrast images on magnetic materials. Energy dispersive spectrometry and EBSD are supported by high-beam current and full 90° stage tilt. Read More
Incorporating optical engine with zoom, overview camera, and coaxial illumination, Smartzoom 5 uses macro recording mode to optimize workflow for repeat sample analyses in step-by-step manner. QA/QC GUI combines with gesture control to support seamless macro-to-detail workflow. System's guided workflow, in combination with calibrated components, supports user-independent measurement results and can export reports of routine measurements, as well as failure analysis, to Word templates. Read More
Equipped with 90 µm AFM closed-loop scanner, Agilent 7500 achieves low-noise performance, enabling atomic-resolution imaging. Design includes built-in environmental chamber with 6 inlet/outlet ports as well as precision temperature and humidity sensors. Inverted Light Microscope system supports MAC Mode for gentle imaging of fluids, while Scanning Tunneling Microscope system provides stable imaging at pA and sub-pA currents to resolve individual atoms and molecules. Read More
AFM-enabled Scanning Electrochemical Microscopy (SECM) mode, using Agilent atomic force microscope, lets scientists perform scanning electrochemical microscopy with nanoscale resolution on conductive and insulating samples. Enabling immediate data collection, EC SmartCart cartridge combines nanoelectrode with pre-mounted AFM tip. Features include bi-functional probes, in situ research capabilities, built-in potentiostat, dual-chamber glove box, and Agilent PicoView software. Read More
Providing Hi-Res, large depth-of-field imaging and integrated 2D/3D measurement, VHX-5000 can capture any area in complete focus without user adjustment. CMOS camera, imaging at 50 fps, and graphics engine allow microscope to provide fully-focused images in as little as 1 sec. High Dynamic Range algorithm, which enhances contrast and reduces over/under saturated areas on target, can be used with Super High Resolution imaging mode that uses short-wavelength light and pixel shift technology. Read More
Offering resolution finer than 0.05 µm, M-LSM Series delivers 25 mm travel along X/Y/Z axes, 0.5 kg load capacity, 14 mm/s speed, and up to 15 N thrust. Unit features adjustable probe holder than can mount probes with diameters from 2–13 mm. Using holder, probes can be rotated full 360° and locked in position. Mounting to metric or imperial optical breadboards with options for right- or left-hand orientation, M-LSM Series offers plug and play connectivity to T-JOY joystick. Read More
Cyclops, supplied with 4x objective lens (10x optional), lets users see magnified views via direct connection to HD monitor via HDMI output or computer via USB output. In HDMI mode, magnification is 15x–270x on 21.5 in. HD monitor. Magnification increases up to 534x if USB cable is used for PC viewing. Adaptable instrument, featuring 5 MP CMOS sensor and 30 LEDs, lets operators see 30 fps video or single frames. Also included, image capture software provides measurement and editing tools.
Accommodating R&D engineers who need to measure sound pressure in confined areas, Model 377B26 comprises microphone, preamplifier, housing, and probe tips of different lengths. Max operating temperature of 800°C suits HVAC manufacturers and test engineers performing leak detection tests. With 0.050 in. dia probe tip that allows near field measurements with minimal disturbance of sound field, prepolarized design can be powered by ICP® or any 2–20 mA constant current supply. Read More
Intended for material and life sciences applications, EVO Series delivers workflow automation, reducing typical workflow from over 400 steps to just 15. Workflow productivity is also improved by automated image settings such as beam alignment, magnification, and focus. Mid-column click-stop aperture changer ensures reproducible results, while beam deceleration technology and high definition BSE detector provide images rich in topographical information.
DualBeam focused ion beam/scanning electron microscope (FIB/SEM) systems provide imaging and analysis of diverse samples. With electron optics suited for investigating such challenging materials as insulating or magnetic materials, Scios™ DualBeam™ is positioned for accelerated 2D and 3D characterization. Helios NanoLab™ 660 DualBeam, with its patterning engine, MultiChem™ gas delivery system, and Tomahawk™ ion optics, provides capabilities for fabricating prototypes of complex nanodevices. Read More
Available with Paint, Print, and Textile modules, DPM Series features integrated LED illumination that can be switched on/off, allowing external illumination for special investigations. With instrument placed directly upon surface, focus wheel has two positions for different magnification levels. Included software provides dimension calibration, background correction, and image enhancements. Captured images are stored in database together with comments and manual measurements. Read More
Combining high-resolution scanning electron microscope with focused ion beam milling, Helios NanoLab™ 660 DualBeam™ is used to investigate structure and function of materials at nanometer scale, create prototypes of micro and nano electro-mechanical systems, and prepare ultrathin samples for atomic scale imaging and analysis in TEM. NanoBuilder™ 2.0 nanoprototyping toolset automatically fabricates 3D prototypes of nano- and microscale devices from computer-generated models. Read More
Incorporating one-shot 3D algorithm, VR-3000 Series enables 3D surface measurements such as height, angles, and radii to be taken simultaneously. Irregularities like waviness, curvature, and warpage can also be measured. System features magnification range from 12–160x and includes high-resolution digital camera for capturing images up to 9 megapixels. Three double-telecentric lenses minimize distortion and ensure accurate measurements throughout field-of-view. Read More
With automated front opening universal pod, Helios NanoLab™ 1200AT DualBeam™ System can be located inside semiconductor wafer lab, where SEM imaging and focused ion beam milling are used to extract ultrathin samples of targeted structures for examination in TEM. System can create site-specific TEM samples thin enough to capture single transistor at 10 nm node, from wafers up to 300 mm in diameter. By moving 1200AT close to wafer process line, process development and ramp are accelerated. Read More
With coded optics and FlexAperture™ technology for consistent illumination throughout zoom range, Leica DMS1000 is suited for R&D and quality control. DMS300, featuring swing-arm stand and LED ring-light, performs digital inspection and documentation tasks in industrial applications. Up to 30 images/sec minimize image delay, while zoom optics provide natural reproduction without eyepiece. Images are provided by digital camera via HDMI interface on HD monitor or on computer screen via USB interface. Read More
Combining scanning electron microscope and X-ray spectrometer, ASPEX CleanCHK™ Analyzer monitors automotive part cleanliness by providing particulate data within minutes. Advanced software routines automatically detect and count particles and analyze particle size, shape, and composition. Designed for use on production floor, analyzer offers automated sample set-up, calibration, and analysis; menu-based operation; and ability to report results in several industry standard formats. Read More
Part of integrated workflow, Tecnai Arctica™ incorporates automation, pioneered on FEI’s flagship Titan Krios™ TEM, to elucidate 3D structure of biological macromolecules and molecular complexes. Cryo-sample autoloader, combined automated target identification, and low dose imaging enable unattended acquisition of large SPA data sets. UI and automation of routine operations and set up procedures lower threshold of operator expertise.