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Optics & Photonics -> Optical Measuring Devices, Sensors & Tools -> Scopes -> Electronic Microscopes


Electronic Microscopes



Sub-Categories
Scanning




(Showing headlines 1 - 20)   more ....
Motorized Micromanipulator positions probes under microscope.

Motorized Micromanipulator positions probes under microscope.

Zaber Technologies Inc.    Richmond, BC V7E2J1
Mar 07, 2014 Offering resolution finer than 0.05 µm, M-LSM Series delivers 25 mm travel along X/Y/Z axes, 0.5 kg load capacity, 14 mm/s speed, and up to 15 N thrust. Unit features adjustable probe holder than can mount probes with diameters from 2–13 mm. Using holder, probes can be rotated full 360° and locked in position. Mounting to metric or imperial optical breadboards with options for right- or left-hand orientation, M-LSM Series offers plug and play connectivity to T-JOY joystick.

Digital Inspection Microscope has HDMI and USB outputs.

Digital Inspection Microscope has HDMI and USB outputs.

Aven, Inc.    Ann Arbor, MI 48108
Feb 28, 2014 Cyclops, supplied with 4x objective lens (10x optional), lets users see magnified views via direct connection to HD monitor via HDMI output or computer via USB output. In HDMI mode, magnification is 15x–270x on 21.5 in. HD monitor. Magnification increases up to 534x if USB cable is used for PC viewing. Adaptable instrument, featuring 5 MP CMOS sensor and 30 LEDs, lets operators see 30 fps video or single frames. Also included, image capture software provides measurement and editing tools.

Probe Microphone can be used in small, hard-to-reach areas.

PCB Piezotronics, Inc.    Depew, NY 14043 2495
Jan 22, 2014 Accommodating R&D engineers who need to measure sound pressure in confined areas, Model 377B26 comprises microphone, preamplifier, housing, and probe tips of different lengths. Max operating temperature of 800°C suits HVAC manufacturers and test engineers performing leak detection tests. With 0.050 in. dia probe tip that allows near field measurements with minimal disturbance of sound field, prepolarized design can be powered by ICP® or any 2–20 mA constant current supply.

Scanning Electron Microscope delivers high definition imaging.

Zeiss, Carl, Industrial Measuring Technology (IMT) Corp.    Maple Grove, MN 55369
Dec 24, 2013 Intended for material and life sciences applications, EVO Series delivers workflow automation, reducing typical workflow from over 400 steps to just 15. Workflow productivity is also improved by automated image settings such as beam alignment, magnification, and focus. Mid-column click-stop aperture changer ensures reproducible results, while beam deceleration technology and high definition BSE detector provide images rich in topographical information.
 

FIB/SEM Systems facilitate imaging of challenging materials.

FIB/SEM Systems facilitate imaging of challenging materials.

FEI Co.    Hillsboro, OR 97124
Jul 23, 2013 DualBeam focused ion beam/scanning electron microscope (FIB/SEM) systems provide imaging and analysis of diverse samples. With electron optics suited for investigating such challenging materials as insulating or magnetic materials, Scios™ DualBeam™ is positioned for accelerated 2D and 3D characterization. Helios NanoLab™ 660 DualBeam, with its patterning engine, MultiChem™ gas delivery system, and Tomahawk™ ion optics, provides capabilities for fabricating prototypes of complex nanodevices.

Digital Pocket Microscopes deliver 1280 x 1024 resolution.

Digital Pocket Microscopes deliver 1280 x 1024 resolution.

Paul N. Gardner Co., Inc.    Pompano Beach, FL 33060 6608
Jul 15, 2013 Available with Paint, Print, and Textile modules, DPM Series features integrated LED illumination that can be switched on/off, allowing external illumination for special investigations. With instrument placed directly upon surface, focus wheel has two positions for different magnification levels. Included software provides dimension calibration, background correction, and image enhancements. Captured images are stored in database together with comments and manual measurements.

FIB SEM System investigates materials at nanometer scale.

FIB SEM System investigates materials at nanometer scale.

FEI Co.    Hillsboro, OR 97124
Jul 09, 2013 Combining high-resolution scanning electron microscope with focused ion beam milling, Helios NanoLab™ 660 DualBeam™ is used to investigate structure and function of materials at nanometer scale, create prototypes of micro and nano electro-mechanical systems, and prepare ultrathin samples for atomic scale imaging and analysis in TEM. NanoBuilder™ 2.0 nanoprototyping toolset automatically fabricates 3D prototypes of nano- and microscale devices from computer-generated models.

Macroscope completes instant, non-contact 3D measurements.

Macroscope completes instant, non-contact 3D measurements.

Keyence Corp.    Itasca, IL 60143
Jun 18, 2013 Incorporating one-shot 3D algorithm, VR-3000 Series enables 3D surface measurements such as height, angles, and radii to be taken simultaneously. Irregularities like waviness, curvature, and warpage can also be measured. System features magnification range from 12–160x and includes high-resolution digital camera for capturing images up to 9 megapixels. Three double-telecentric lenses minimize distortion and ensure accurate measurements throughout field-of-view.

Wafer Analysis System quickly diagnoses root cause of defects.

Wafer Analysis System quickly diagnoses root cause of defects.

FEI Co.    Hillsboro, OR 97124
Jun 13, 2013 With automated front opening universal pod, Helios NanoLab™ 1200AT DualBeam™ System can be located inside semiconductor wafer lab, where SEM imaging and focused ion beam milling are used to extract ultrathin samples of targeted structures for examination in TEM. System can create site-specific TEM samples thin enough to capture single transistor at 10 nm node, from wafers up to 300 mm in diameter. By moving 1200AT close to wafer process line, process development and ramp are accelerated.

Digital Microscopes provide inspection and measurement.

Leica Microsystems, Inc.    Buffalo Grove, IL 60089
Jun 07, 2013 With coded optics and FlexAperture™ technology for consistent illumination throughout zoom range, Leica DMS1000 is suited for R&D and quality control. DMS300, featuring swing-arm stand and LED ring-light, performs digital inspection and documentation tasks in industrial applications. Up to 30 images/sec minimize image delay, while zoom optics provide natural reproduction without eyepiece. Images are provided by digital camera via HDMI interface on HD monitor or on computer screen via USB interface.

Particulate Analyzer monitors automotive part cleanliness.

Particulate Analyzer monitors automotive part cleanliness.

FEI Co.    Hillsboro, OR 97124
Apr 02, 2013 Combining scanning electron microscope and X-ray spectrometer, ASPEX CleanCHK™ Analyzer monitors automotive part cleanliness by providing particulate data within minutes. Advanced software routines automatically detect and count particles and analyze particle size, shape, and composition. Designed for use on production floor, analyzer offers automated sample set-up, calibration, and analysis; menu-based operation; and ability to report results in several industry standard formats.

Transmission Electron Microscope aids structural biology research.

Transmission Electron Microscope aids structural biology research.

FEI Co.    Hillsboro, OR 97124
Feb 05, 2013 Part of integrated workflow, Tecnai Arctica™ incorporates automation, pioneered on FEI’s flagship Titan Krios™ TEM, to elucidate 3D structure of biological macromolecules and molecular complexes. Cryo-sample autoloader, combined automated target identification, and low dose imaging enable unattended acquisition of large SPA data sets. UI and automation of routine operations and set up procedures lower threshold of operator expertise.

Confocal Laser Scanning Microscope minimizes phototoxicity.

Confocal Laser Scanning Microscope minimizes phototoxicity.

Olympus Europa Holding GmbH    Hamburg 20097  Germany
Dec 05, 2012 Suited for life science applications such as FRAP, FLIP, and photo-activation, FluoView FV1200 boosts sensitivity of laser scanning microscopy with living cells or unstable fluorophores. System combines accuracy of IX83 frame with fluorescence sensitivity and simultaneous laser stimulation of cells. Reflective, silver-coated galvanometer scanning mirrors and dual-channel GaAsP FluoView PMT module maximize light transfer and detection, allowing for laser power reduction.

Dual Beam System provides semiconductor failure analysis.

Dual Beam System provides semiconductor failure analysis.

FEI Co.    Hillsboro, OR 97124
Nov 26, 2012 Combining scanning electron microscope for imaging and focused ion beam for milling and deposition, Helios NanoLab™ 450 F1 DualBeam™ System provides semiconductor manufacturers with optimal images of device architectures. STEM detector delivers material contrast, while FlipStage™ 3 flips sample between thinning and STEM viewing positions, and rotation axis permits viewing from either side. To support automated lift-out, EasyLift™ nanomanipulator provides precise motorized sample manipulation.

FIB/SEM Systems support TEM sample preparation.

FIB/SEM Systems support TEM sample preparation.

FEI Co.    Hillsboro, OR 97124
Aug 31, 2012 Respectively accommodating up to 100 mm samples and full 300 mm wafers, Helios NanoLab(TM) 450HP and 1200HP DualBeam(TM) systems meet requirements for semiconductor process development at 28 nm device geometry node and below. Systems can prepare 15 nm thick samples with less than 2 nm damage layer in 90 min. QuickFlip grid holders facilitate inverted sample preparation, and iFast(TM) automation software optimizes usability while ensuring consistency among multiple operators and systems.

Scanning Electron Microscopes  come in 3 configurable models.

Scanning Electron Microscopes come in 3 configurable models.

Carl Zeiss Jena GmbH Zeiss Gruppe Mikroskopie      Germany
Aug 14, 2012 Featuring plug-and-play design, MERLIN Compact, MERLIN VP Compact, and MERLIN allow users to add and change detectors to handle tasks ranging from simple image capture to extensive material analysis. Frame store of 32 k x 24 k pixels allows imaging of very large areas. In addition to in-situ 3D surface reconstruction and calculation of 3D data from 2D data, FE-SEMs include in-lens Duo detector offering both high resolution imaging and extensive materials information.

HD Imaging Microscope achieves resolutions down to 1 nm.

HD Imaging Microscope achieves resolutions down to 1 nm.

Carl Zeiss Jena GmbH Zeiss Gruppe Mikroskopie      Germany
Aug 14, 2012 With its electronics, detectors, and chamber design, SIGMA HD Field Emission Scanning Electron Microscope (FE-SEM) accelerates imaging and facilitates sample navigation for nanoscale analytics. High vacuum and variable pressure modes of operation are available, and 5-axis eucentric stage aids sample navigation using translational and tilted movement. Also included, diametrically opposite chamber ports facilitate mounting of 2 energy dispersive X-ray spectroscopy detectors.

Portable Digital Microscope comes with measurement software.

Vitiny    Dashu Township   Taiwan
Aug 13, 2012 Integrating color 2.7 in. TFT LCD screen and 4 ultra white LEDs, VT300 can be used for real-time observation and recording. Scale is shown on display, and zoom options include 10x and 42x (optical) as well as smart zoom (digital); max magnification is 196x. Images/video can be saved to built-in 2G memory, and scale value changes with magnification size. Also included, software for PC covers angle, line, diameter, and chamfer measurement, image comparison, and video control.

Scanning Electron Microscope offers sub-nanometer resolution.

Scanning Electron Microscope offers sub-nanometer resolution.

FEI Co.    Hillsboro, OR 97124
Aug 08, 2012 Verios(TM) XHR SEM provides resolution and contrast needed for precise measurements on beam-sensitive materials in semiconductor manufacturing and materials science applications. When combined with IC3D(TM) software, instrument can provide measurements needed to control processes at 22 nm technology node and below. User can switch between operating conditions, maintain sample cleanliness, and obtain sub-nanometer resolution at any accelerating voltage from 1-30 kV.

Electron Microscope images dynamic processes at atomic scale.

FEI Co.    Hillsboro, OR 97124
Jul 31, 2012 Titan(TM) ETEM G2 enables time-resolved, in-situ studies of processes and materials exposed to reactive gases and elevated temperatures. With this environmental transmission electron microscope (ETEM), developers of energy and environmental products can study relationships between structure and performance by observing atomic scale processes and gas-solid interactions under conditions that mimic operational environment. UI accelerates switching between ETEM and high vacuum modes.




(Showing headlines 1 - 20)   more ....



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