Olympus America, Inc.    Center Valley, PA 18034
May 10, 2012 Intended for inspection, test, and quality control facilities, DSX Series Micro-Imaging and Metrology Systems capture clear images, acquire traceable measurements, and perform high-level analyses with tap of touchscreen. Units accommodate samples of all shapes and sizes to produce 2D, 3D, and panorama results. Built to resist ambient vibration with image stabilization technology, DSX systems are compatible with Stream image-processing software for measurement, analysis, and reporting.

Keyence Corporation of America    Itasca, IL 60143
Apr 27, 2012 To streamline testing as well as increase inspection speed and efficiency, VHX-2000 integrates zoom optics with CCD camera, 17 in. LCD monitor, light source, controller, and analysis/reporting software. Magnification range is 0.1x-5000x, and various lighting techniques are supported. In addition to optional motorized XY stage and Z-axis lens control, features include color filter wheel, super resolution mode, and image stitching function.

Tescan USA, Inc    Cranberry Township, PA 16066
Oct 11, 2011 FERA3 XMH high resolution Schottky Field Emission scanning electron microscope (FESEM) integrates plasma source focused ion beam. Along with electron and ion columns, unit can be configured with gas injection systems, nano-manipulators, and detectors/microanalyzers. Use of Xenon plasma source for focused ion beam enables system to satisfy high-resolution FIB requirements (imaging, fine milling/polishing) as well as achieve ion currents greater than 1 µA for ultra-fast material removal rates.

Saelig Co., Inc.    Pittsford, NY 14534
Aug 25, 2011 Featuring white LED illumination and color 2 MP sensor, MV200UM captures magnified images and video for display on Windows®-based PC via USB 2.0 connection. Dual interchangeable clear ring-stands of different heights allow separation from objects, providing up to 200x magnification on 17 in. monitor with 1,280 x 1,024 resolution. Unit can also be handheld at distances of 8-200 mm for inspecting parts at lower magnification, and fields of view can range from 1.9 x 1.5 mm to 82 x 65 mm.

Aven, Inc.    Ann Arbor, MI 48108
Aug 16, 2011 With magnification range of 15x-200x and optical zoom capability of 10x or 40x, iLoupe XL2 displays enlarged views on 2.8 in. color LCD screen. Still or video images are captured by 2 MP CMOS sensor and stored in flash memory drive with 2 GB capacity. Using included measurement program, users can record length, perimeter, angle, and surface area of examined objects. Rechargeable battery-powered instrument may also be used as webcam by linking to computer via USB cable.

FEI Company    Hillsboro, OR 97124
Aug 11, 2011 Combining electron optics with analytical sensitivity of ChemiSTEM Technology, Titan(TM) G2 80-200 provides atomic resolution elemental mapping over entire accelerating voltage range of 200-80 kV. System includes X-FEG high brightness gun and DCOR probe corrector, achieving spatial resolution of 0.8 Angstroms in STEM and 0.9 Angstroms in TEM. Large tilt-range, when combined with ChemiSTEM's symmetrically distributed 4-silicon-drift x-ray detector architecture, permits EDX Tomography.

FEI Company    Hillsboro, OR 97124
Aug 11, 2011 Capable of providing high resolution, 3D imaging and analysis on range of sample types, Versa 3D(TM) DualBeam(TM) system lets users adapt capabilities to specific requirements. Configurable platform, available with high-vacuum only or high- and low-vacuum electron imaging hardware, combines Schottky field emission electron beam and high-throughput ion beam technologies. It may also be configured with environmental scanning electron microscopy (ESEM) for in-situ analysis.

Keyence Corporation of America    Itasca, IL 60143
Jul 06, 2011 Utilizing short-wavelength laser, VK-X Series provides non-contact profile, roughness, and thickness measurements, even on surfaces with highly angular surfaces. System features 0.5 nm Z-axis resolution with magnification range from 200-24,000x and ability to capture images at up to 21.6 MP. By combining laser with 16-bit photomultiplier, VK-X Series can obtain image and measurement on nearly any type of material. AI-Scan function enables users to image and measure target with click of mouse.

Keyence Corporation of America    Itasca, IL 60143
Jun 24, 2011 Incorporating CMOS sensor, light source, LED monitor, analysis software, and PC components, Model VW-9000 records up to 230,000 fps and can capture video for up to 13 hours. Recorded footage can be edited and analyzed directly on controller. Microscope automatically tracks moving objects in recorded footage to quantify speed, acceleration, distance, and angle. By graphically displaying changes in target's movement, Motion Graph function minimizes time needed to search for events of interest.

Ametek, Inc.    Wallingford, CT 06492
May 24, 2011 Intended for range of micro and nanoanalytical applications, SXFiveFE offers full automation for long-term unattended operation and features combination of field emission electron column and CAMECA spectrometers. Field emission source and electron column result in versatile microanalyzer with capabilities for quantitative microanalysis and x-ray imaging at sub-micron spatial resolution. Configurations include SXFive with W and LaB6 sources and SXFiveFE with FE source.

Olympus    Waltham, MA 02453
May 19, 2011 FluoView FV1000 confocal laser scanning microscopes and FV1000MPE multiphoton excitation systems are available with FV10-ASW v3.0 software, which incorporates high dynamic range imaging and minimizes signal to noise ratios to produce clear, highly resolved images. Other functionality includes partial stitching with multi area time lapse imaging to allow analysis of specific regions of interest. Channel un-mixing feature, usedwith FV1000MPE, allows spectral un-mixing of multi-color samples.

FEI Company    Hillsboro, OR 97124
Feb 18, 2011 Combining scanning electron microscope and focused ion beam technologies with gas chemistries, detectors, and manipulators, Helios NanoLab(TM) DualBeam(TM) System analyzes production characteristics of unconventional gas reservoirs. System images kerogen, porosity, and microstructures in 3D with nanometer-scale resolution. Data are essential to determining potential of reservoir, optimizing extraction procedures, and designing simulators of nanoscale pore structure.

FEI Company    Hillsboro, OR 97124
Dec 09, 2010 Magellan(TM) extreme resolution scanning electron microscope (SEM), for life science imaging, allows users to view entire organization of cell in its natural, fully-hydrated state. Featuring cryogenic sample preparation and handling, device is able to vitrify and transfer samples to vacuum chamber in same unit. It provides high-throughput, sub-nanometer resolution, even at voltages below 1-30 kV, minimizing damage to biological samples and optimizing resolution on light element materials.

Nikon Metrology, Inc.    Rochester Hills, MI 48309
Sep 27, 2010 Used for inspecting, observing, measuring, and recording Hi-Res images of samples, ShuttlePix P-400R handheld microscope has 17 in. touchscreen monitor and can also connect to standard PC or laptop running dedicated 3D image reconstruction software. Microscope interfaces seamlessly with motorized stand for stationary use, and zoom head has built-in, 4-section LED ring illumination. Other features include 20x zoom, with magnification range of 20x-400x on monitor.

Aven, Inc.    Ann Arbor, MI 48108
Sep 10, 2010 Featuring 2 handheld digital microscopes with 200x and 500x magnification, polarizer, and 2 accessories for hands-free operation, Mighty Scope Pro Pack provides inspection, analysis, and measurement of magnified images that can be captured and sent to any Windows PC. Each Mighty Scope has 1.3-megapixel camera with 1/3 in. color CMOS image sensor, Microtouch shutter control, 6 adjustable white LEDs, and USB 2.0 output. Units provide video capture at up to 30 fps.

Agilent Technologies, Inc.    Santa Clara, CA 95051
Aug 12, 2010 Agilent 8500 field emission scanning electron microscope features continuously variable imaging voltage tunable from 500-2,000 V. Four-segment microchannel plate detector enables topographic imaging along 2 orthogonal directions to enhance surface detail, and Schottky field emission electron source provides high-brightness and consistent performance. The 8500 allows nanoscale features to be observed on wide variety of nanostructured materials, including polymers, thin films, and biomaterials.

FEI Company    Hillsboro, OR 97124
Aug 10, 2010 Equipped with 16-bit scan engine, Nova(TM) NanoSEM 50 Series uses retractable and in-lens detectors for SE, BSE, and STEM signal collection and filtering. Nova NanoSEM 450, featuring 110 mm stage with up to 75° motorized tilt, is suited for advanced material science applications. Equipped with 150 mm piezo-electric stage, Nova NanoSEM 650 provides 100% coverage of 6 in. wafers or masks. Both provide 1 nm resolution at 15 kV, 1.4 nm at 1 kV, and beam currents up to 200 nA.

Keyence Corporation of America    Itasca, IL 60143
May 12, 2010 With 16-bit imaging resolution, 65,536 brightness levels, and over 2.8 trillion colors, VHX-1000 Series performs real-time, on-screen measurement of distance, radius, angle, and area of target. DOUBLE'R automatic lens/zoom recognition system enables unit to recognize, in real-time, which lens is mounted to camera as well as current magnification. Compact 3CCD Camera includes pixel-shift actuator, achieving sharp, ultra-high resolution images of up to 54 million pixels.

FEI Company    Hillsboro, OR 97124
May 06, 2010 Helios NanoLab(TM) x50 DualBeam(TM) Series includes Helios 650, for academic and industrial research centers, and Helios 450(S) series for advanced semiconductor labs. Devices integrate high-resolution scanning electron microscope and focused ion beam (FIB) that optimizes imaging/milling and speeds material removal on large structures. High-quality 3D data helps understand material characteristics such as particle/porosity distribution and crack propagation.

Dazor Mfg. Corp.    St. Louis, MO 63146
Oct 28, 2009 Incorporating microscope, camera, computer monitor, and Windows XP OS into one piece of equipment, speckFINDER HD allows users to work with and store images in multiple digital formats and network as needed. With 3 USB outputs and 1 video output, users can also output files to flash drive or project live images to overhead screen. Flat panel display offers 160° horizontal and vertical viewing angle, allowing multiple users to view at once.