Optics & Photonics, Test & Measuring Instruments, Vision Systems

Titan's Omni HD Digital Microscope features GUI.

October 24, 2016

Operating without a PC, Omni HD digital microscope System can provide 60 frames per second video-image quality using its image processing and control engine. Staying calibrated over the entire zoom period, Omni is suitable for quality control, testing, rework, assembly, inspection and documentation tasks. Camera control station allows manual adjustments. Read More

Optics & Photonics, Test & Measuring Instruments, Vision Systems

Aven Mighty Cam Auto 2M Inspection Camera features 1080p resolution images at 60FPS.

October 19, 2016

Compatible with C/CS-mount microscopes or lenses, Aven Mighty Cam Auto 2M Inspection Camera produces high definition images through microscope or video system. With 1080p resolution of images at 60FPS, the camera is ideal for inspecting layered objects like PCBs. Using HDMI cable, Auto 2M can be connected to the HD monitor to view images at 60FPS. Mighty Cam features manual focus and instant auto focus eliminating the need to readjust lens and focus often. Read More

Optics & Photonics, Test & Measuring Instruments

Optical Inspection System offers plug-and-play operation.

October 18, 2016

Available as complementary partner to Optilia AB line of Inspection Systems, INSPECTIS High Definition Optical Inspection System consists of plug-and-play HD camera microscope housed in all-in-one ergonomic package. System is suited for optical inspection, quality control, electronics PCB inspection, and non-contact measurements. Read More

Optics & Photonics, Test & Measuring Instruments, Vision Systems

Digital 2D Microscope operates without PC.

October 7, 2016

Delivering video-image quality at 60 fps, Omni HD 2D Digital Microscope and Measurement System can remain in calibration over entire zoom range, making it suitable for quality control, testing, rework, assembly, and inspection tasks. Custom-designed mouse or GUI provides intuitive operation of entire system. To ensure sharp, high-contrast imaging, separate camera control station allows manual adjustments for auto and manual focus, exposure, gain, brightness, and white balance. Read More

Cleaning Products & Equipment, Materials & Material Processing, Optics & Photonics, Test & Measuring Instruments, Vision Systems

Ascentech to Exhibit Optilia Inspection, GEN3 Systems Solutions at SMTAI 2016 in Booth #219

September 12, 2016

Chester, Connecticut, USA – Ascentech, LLC will exhibit and demonstrate new test and process optimization instruments and solutions at the upcoming SMTA International Conference and Exhibition in Rosemont, IL, Sep. 25 - 29, 2016. Ascentech will exhibit these new products in booth #219.  Products will include the Solder Saver Solder/Dross separation tool, award-winning GENSONIC Ultra-Sonic... Read More

Optics & Photonics, Test & Measuring Instruments

ZEISS Highlights Latest Microscopy Innovations and Advancements at International Manufacturing Technology Show

August 29, 2016

Visit Booth # E-5502 for demonstrations of the newest microscope instruments for manufacturing applications ZEISS announces they will be showcasing the latest microscopy innovations and advancements at the International Manufacturing Technology Show (IMTS), September 12-17, 2016, at McCormick Place, in Chicago, IL. ZEISS experts will be on hand at Booth # E-5502 to highlight and demonstrate... Read More

Optics & Photonics

Ergonomic 120 kV S/TEM targets life and materials sciences.

August 25, 2016

Offering users access to scientific results regardless of experience, Talos™ L120C transmission/scanning transmission electron microscope (S/TEM) provides Hi-Res, 3D imaging and analysis capabilities. Automation and directed workflows foster facilitated adoption path and accelerate results without compromising performance. Along with ultra-stable optics, this 120 kV LaB6 S/TEM features MAPS™ software and Smartcam screening camera. Latter permits remote operation. Read More

Optics & Photonics

DIY Modular Microscopy Platform accepts wide component range.

August 22, 2016

To construct imaging system tailored to specific applications, Cerna optomechanical platform can be combined with choice of optical, electronic, motion control, and vision parts. Throat depth of 7.74 in. maximizes working volume for sample apparatuses as well as working space around optical path. Each rail side incorporates 95 mm wide dovetail that mates directly with microscope modules, and circular dovetails provide compatibility with optical components. Read More

Optics & Photonics, Sensors, Monitors & Transducers

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

July 27, 2016

Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields Hillsboro, Ore. and Ithaca, NY — FEI (NASDAQ: FEIC) and Cornell University have entered an agreement to commercialize a new high dynamic range detector for FEI’s electron microscopes. It promises to enable new kinds of multichannel... Read More

Optics & Photonics

Automated S/TEM delivers high-performance imaging, analysis.

July 18, 2016

Themis™ Z scanning/transmission electron microscope (S/TEM) offers system stability and automated tuning routines that promote reproducible image resolution at high and low beam energies in both STEM and TEM modes. Energy dispersive x-ray systems let users configure system based on primary characterization needs, and iDPC detector, by using up to 90% of transmitted electrons, offers high sensitivity to lighter elements while preserving atomic-scale resolution and direct image interpretation. Read More

Optics & Photonics

How PCE Instruments' Borescopes Can Help Cut Machine-Failure Costs

July 5, 2016

Jupiter, Fla. - Machine failure is costly. Beyond the immediate machine repair and replacement expenses lie lost profits resulting from manufacturing downtime. The good news is, by using PCE Instruments’ borescopes for machine condition monitoring, manufacturers can identify changes indicative of a machine fault and take corrective action prior to critical machine failure. In effect, PCE... Read More

Chemical Processing & Waste Management, Laboratory and Research Supplies & Equipment, Optics & Photonics, Plant Furnishings & Accessories

Microscopy Systems support materials science applications.

June 29, 2016

Featuring advanced scanning electron microscope and focused ion beam technology, Helios™ G4 DualBeam Series offers automated sample preparation for transmission electron microscopy and 3D sample characterization. Phoenix FIB column offers low-voltage performance for ultra-low sample damage, while Elstar electron column with UC+ technology offers 4x more monochromated current than previous generation. With Auto Slice & View 4.0 software, unattended FIB nanotomography is possible. Read More

Optics & Photonics

Micro Video Borescope navigates through tiny bores.

June 29, 2016

Equipped with flexible, 0.748 in. diameter probe protected by black ETFE casing, MICRON Videoscope is suited for inspection of very small bores. Lens located at distal tip of probe features cold fiber optic light, which illuminates inspection area. Image resolution delivered by CIS CMOS sensor is 400 x 400 pixels. Field of view is 90°, while direction of view is 0°. With USB output, control unit connects to computer, enabling live inspection to be visualized on computer monitor. Read More

Chemical Processing & Waste Management, Machinery & Machining Tools, Optics & Photonics, Test & Measuring Instruments

FEI Launches Three New Tools for Next-Generation Semiconductor Manufacturing

June 20, 2016

New solutions are designed to address the challenges of 7nm technology node metrology and defect/failure analysis.  Hillsboro, Ore. - FEI (NASDAQ: FEIC) announced today the release of three new tools for process control and defect/failure analysis in advanced semiconductor manufacturing. Two of the tools are specifically targeted at the 7nm node, and all are designed to allow manufacturers... Read More

Optics & Photonics, Software

FIB/SEM Systems utilize 3D reconstruction software.

June 17, 2016

Designed to work with all DualBeam focused ion beam/scanning electron microscope platforms, Auto Slice & View v4.0 software enables 3D structure and composition of samples at nanometer scale. Imaging can be combined with analytical capabilities, such as energy dispersive x-ray spectrometry and electron backscatter diffraction, to ensure that no information is lost in sectioning of sample. Algorithms help to ensure uniform thickness of slices and precise and reproducible placement of each cut.
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Optics & Photonics, Test & Measuring Instruments

Weather Station offers GPS and compass readings.

May 20, 2016

With GPS and compass readings, Magellan MX™ is useful for vehicle and mobile applications requiring real-time meteorological data, such as incident command centers and hazmat vehicles. Depending on model, meteorological sensors can include ultrasonic wind speed and direction, temperature, RH, barometric pressure, and optical precipitation gauge. Data can be monitored with WeatherMaster Software, touchscreen Weather Display console, and/or Weather MicroServer for Internet and SCADA protocols. Read More

Optics & Photonics, Vision Systems

High Definition Telescope offers narrow band imaging.

May 10, 2016

Utilizing Extra-Low Dispersion Glass for rigid surgical endoscopy, FDA-cleared OES Elite 4mm HD Telescope can be used for urological procedures in resection, including transurethral resection of bladder tumor procedures, which are used both to visualize bladder cancer and to remove cancerous tissue. Narrow Band Imaging works by filtering white light into specific light wavelengths that are absorbed by hemoglobin, providing enhanced visualization of capillary networks and mucosal morphology. Read More

Optics & Photonics

Scanning Electron Microscope supports diverse applications.

May 5, 2016

With compound final lens, Apreo™ offers resolution down to 1.0 nm at 1 kV, without need for beam deceleration, for optimal performance on sample even if it is tilted or topographic. Backscatter detection is offered at lowest beam currents, at any tilt angle, on sensitive samples, and at TV-rate imaging to maximize materials contrast, and detector segments can be individually addressed to optimize for angular contrast or signal intensity and extract important information. Read More

Optics & Photonics, Test & Measuring Instruments, Vision Systems

Mahr Federal to Feature MarVision MM 320 and MarVision QM 300 Video Measuring Microscopes with Image Processing at MD&M EAST 2016

May 2, 2016

Also on display will be the MarShaft™ SCOPE 250 plus flexible optical system for shop floor measurement PROVIDENCE, RI – Mahr Federal will feature the MarVision MM 320 and the MarVision QM 300 video measuring microscopes with image processing capability at MDM EAST, June 14-16, 2016, Jacob K. Javits Convention Center, New York, NY, Booth #2121. Designed for the measurement and/or... Read More

Optics & Photonics

FEI and CEOS Deliver First Sub-Angstrom, Low-Voltage Electron (SALVE) Microscope to the University of Ulm

April 28, 2016

Developed in the frame of University Ulm's SALVE project, the microscope provides high-contrast, atomic-scale imaging of radiation-sensitive samples, such as graphene and organic materials. Hillsboro, Ore. and Heidelberg, Germany — FEI (NASDAQ: FEIC) and CEOS announced today that they have delivered the first sub-Ångstrom, low-voltage electron (SALVE) microscope to the University of... Read More