Detroit Precision Hommel    Rochester Hills, MI 48309
Jul 18, 2011 Using array of probes and accessories, ergonomically designed Hommel-Etamic W5 can track 5 separate measurement programs, up to 100 separate profiles, with total storage capacity of up to 10,000 completed measurements. Integrated click wheel and color display with GUI facilitate operation, while support prism centers workpieces reliably on correct measuring position and protects probe for measurements in bores from 12 mm dia. All necessary connection are made via USB interface.

Ophir Optronics, Inc.    Wilmington, MA 01887
Mar 24, 2011 Combining NanoScan near-field profiler with dedicated M² measurement hardware and software, NanoModeScan enables quantitative measurement and viewing of high-power CO2 laser beams in as little as 20 sec. System also reports beam waist diameter and location, divergence, and beam's Rayleigh range for each axis. With update rate of 20 Hz, system is suitable for CO2 laser-based material processing, machining, and marking applications where laser performance needs to be adjusted in real time.

CML USA, Inc.    Davenport, IA 52804
Jan 25, 2011 Designed to accept large radius tooling to 15¾ in. CLR, Giga Bender Mandrel Model GB90 can bend tube, pipe, square, and rectangular profiles to center line radius as tight as 1D. Users can program multiple bend angles to 180° with independent material spring back setting for each bend. Available with up to 6-axis NC control, machine includes USB port for unlimited program memory storage, touchscreen display with ABS or INC modes, multiple language capability, and system diagnostics.

Vernon Tool Co.    Oceanside, CA 92054
Sep 28, 2010 Suited for small- to medium-sized fabricators of tube frame assemblies, MasterPipe(TM) Profiler (MPP) 2-axis, CNC pipe cutting machine is powered by Windows®-based OS and operated via touchscreen. It consolidates setup, programming, and cutting into one operation, and pre-loaded cut library optimizes pipe configuration flexibility. Capable of performing range of standard cuts, machine handles 1-12 in. OD pipe in lengths up to 40 ft.

Veeco Instruments Inc. Corporate Headquarters    Woodbury, NY 11797
Jul 21, 2010 ContourGT(TM)-X8 PSS is optimized for characterizing high-brightness light emitting diode (HB-LED) patterned sapphire substrates (PSS). Combination of non-contact 3D measurement capabilities with Veeco PSS metrology hardware and software technology, as well as Wafer Automation System Developer's Kit (SDK) provides tailored solution for PSS QA/QC applications requiring high throughput and repeatability. TCP/IP-based remote control capabilities are also standard.

Veeco Instruments Inc. Corporate Headquarters    Woodbury, NY 11797
Jun 09, 2010 ContourGT(TM)-K0 non-contact, 3D optical surface profiler combines streamlined architecture and functionality with measurement and computing hardware and software. Dual-LED illumination, combined with optimal vertical resolution, accommodates difficult applications and environments. In addition to Vision64(TM) Operation and Analysis Software, system features intuitive, modular nterface that offers user-level customization capabilities.

Taylor Hobson Ltd    Leicester   United Kingdom
Apr 22, 2010 As combined thin film and dimensional optical profiler, CCI SunStar merges non-contact dimensional measurement capability with thin and thick film technology. Integral 4 million pixel camera enables Hi-Res imaging, and film thickness measurement is possible from 5 µ down to 300 nm or less. While auto-range and auto-fringe-find functionality facilitates use, single mode of operation over all scan ranges lends to data reliability. Closed loop Z scanning mechanism is also standard.

Veeco Instruments Inc. Corporate Headquarters    Woodbury, NY 11797
Apr 16, 2010 Based on white light interferometry (WLI) technology, ContourGT(TM) Surface Metrology Product Family addresses range of production QA/QC and R&D precision machining and manufacturing applications within high brightness LED, solar, ophthalmic, semiconductor, medical device, and academic research markets. High brightness dual-LED illumination facilitates precision, non-contact, 3D surface metrology, while Vision64 operating and analysis software provides user-level-customization capabilities.

Nikon Instruments Inc.    Melville, NY 11747-3064
Oct 05, 2009 Model BW-H501 3D surface profile system features high-speed X-Cycle Imager allowing image capture of 900 fps with output/display of height images at 5 fps. It also integrates BridgeElements software which supports simultaneous capture of multiple images, allowing real-time image comparison. By utilizing fringe cycle method, system can achieve height resolution of 100 nm and perform surface profiling in as little as 200 ms for height of 40 µm.

Photon, Inc.    San Jose, CA 95119
Sep 25, 2009 Operating under BeamProfiler Software in MS Windows®, USBeamPro CCD provides NIST-traceable measurements of ISO Standard laser beam profile parameters - laser beam diameter, centroid, power/energy - for CW, pulsed, and single-shot lasers. USB 2.0 interface facilitates use and promotes portability, while ½ in. format 1,360 x 1,024 array with 4.65 µm square pixels offers total imaging area of 6.32 x 4.76 mm. Camera dimensions (70 x 95 x 33 mm) aid placement into typical optical paths.

CML USA, Inc.    Davenport, IA 52804
Sep 17, 2009 Capable of handling large diameter pipe, tube, squares, rectangular, solids, and other profiles, Model TB90 offers bending capacity to 4 in. and bends to centerline radius as small as 2D. Touch screen control offers access to automatic and manual operating modes, programming, system diagnostics, multiple language capability, and digital display of counterbend die axis and bend angle. Other features include Class 3 safety hand-held remote control and unlimited program storage via USB.

CML USA, Inc.    Davenport, IA 52804
May 12, 2009 Designed to accept large radii tooling to 16 in. CLR, GB90/GB100 Semi-Automatic Giga Bender Mandrel Machine bends tube, pipe, square and rectangular profiles to center radius as tight as 1.5D. System offers programmable bend angles with independent material springback setting for each bend, and interactive PLC touch screen for access to auto and manual operating modes, system diagnostics, and multiple language capability. USB enables unlimited program memory storage and communication.

Ophir-Spiricon Inc.    Logan, UT 84321
Apr 21, 2009 Designed to verify performance and reduce changeover time for industrial parts manufacturers, ModeCheck(TM) enables quantitative measurement and viewing of high-power CW and pulsed lasers in 8-30 µm range with intensities up to 30 W/cm². Industrial solution measures key characteristics of laser beam profile in real-time and stores mode images for later recall and comparison. Over time, user will be able to measure laser degradation and predict and schedule downtime for maintenance.

Coherent Inc., Laser Group    Santa Clara, CA 95054-1112
Dec 12, 2008 Operating over 190-355 nm spectral range, LaserCam-HR-UV records beam characteristics at third (355 nm), fourth (266 nm), and fifth (213 nm) harmonics of Nd:YAG lasers, as well as output of most excimer lasers. LaserCam-HR-InGaAs measures infrared laser beams from 900-1,700 nm, and is compatible with eye safe military lasers, telecom sources, and Nd:YAG fundamental. Both units are powered through single BeamView(TM)-USB 2.0 cable connection.

Ambios Technology Inc.    Santa Cruz, CA 95060
Nov 05, 2008 Offered as fully integrated solution, Q-View White Light Interferometer/SPM system combines benefits of white light interferometry and SPM technologies. Q-View Interferometric Module integrates seamlessly onto Q-Scope SPM platform. It uses optical profiler technology to render and measure areas as large as 500 µm within seconds. Users can switch to SPM mode and characterize surface structures at sub-angstrom level.

CML USA, Inc.    Davenport, IA 52804
Aug 19, 2008 Suited for bending large diameter pipe, tube, squares, rectangular, solids, and other profiles, Top Bender Model TB80 features touchscreen display with auto, manual, and simple bend programming modes as well as system diagnostics and multiple languages. Handheld dead man switch controls bend, return, and emergency stop functions. Offering unlimited program storage with USB device, TB80 accepts 1-3 in. quick change hex mount tooling and is capable of bends to CLR as small as 2D without mandrel.

Taylor Hobson, Inc.    Rolling Meadows, IL 60008 4274
Jul 31, 2008 Based around Coherence Correlation Interferometry technique, Talysurf CCI Lite provides non-contact 3D surface texture, step height, and micro dimensional measurement. All types of rough, smooth, or highly reflective materials, including glass, metal, photo resist, polymer, liquid inks, and pastes, can be measured. System also provides automatic pattern measurement as well as X, Y, and Z stitching. Z stage is closed loop over full 100 mm range for high accuracy.

Ophir-Spiricon Inc.    Logan, UT 84321
Jul 28, 2008 Supplied with LBA beam analysis software, USB L11058 Large Format Beam Profiling Camera has 4,008 x 2,672 pixel format that allows profiling of UV laser beams up to 24 x 36 mm without requiring reduction optics. It measures CW laser beams over 190-1,100 nm spectral range and has wide dynamic range of 59 dB. While global shutter allows simultaneous integration of entire pixel array, integrated USB 2.0 digital interface allows data transfer to laptop/desktop PCs.

CML USA, Inc.    Davenport, IA 52804
Jun 10, 2008 Model TB76 produces bends to centerline radii as tight as 2x material diameter in tube, pipe, and profiles up to 3 in. in diameter. Tooling is supplied for tube, pipe, and conduit, with special tooling available for squares, solids, and other profiles. Features include 2-speed gear box that accommodates work piece centerline bend radii up to 15 in. and programmable control with digital display that stores 30 individual programs with 9 separate bend angle and material spring back values.

GE Sensing    Billerica, MA 01821
May 21, 2008 Weld profile visualization system delivers online, real-time picture of scarfed ERW pipe IDs and ODs during manufacturing process. By identifying events such as tool drift and edging as they occur, system makes it is possible to affect real-time control of scarfing process and reduce scrap. Ultrasonic phased array transducer electronically simulates scanning action required to provide weld profile information, and resulting information is fed into UTxx digital flaw detection platform.