Profile Rolling Machines

Machinery & Machining Tools, Sensors, Monitors & Transducers, Test & Measuring Instruments

Surface Profiling Sensor uses interferometric technology.

May 10, 2016

Used for surface contour measurement, TeleStar® Probe scans up to 500 data points/sec with 1.0 micron accuracy and 0.1 micron repeatability. This self-contained, off-axis, partial coherence interferometric range sensor, offering measured point resolution in sub-micron (< 0.1 micron) range, has 25 mm constant working distance and is compatible with specular and light-scattering diffuse surfaces. Return angle allows measurement deep inside bores and blind holes. Read More

Machinery & Machining Tools, Optics & Photonics, Robotics, Test & Measuring Instruments, Vision Systems

Pyroelectric Cameras use beam propagation software.

February 18, 2016

Available for Pyrocam™ laser beam profiling cameras, M2 Beam Propagation software incorporates M2 calculations that predict how laser will focus and beam propagation parameters that describe how laser diverges as function of beam waist width. Program allows manual collection of 2D laser beam profiles for CW and pulsed lasers from 13–350 nm and from 1–3,000 µm. Other calculations include: beam width, divergence angle, Rayleigh length, astigmatism, asymmetry ratio, average power, and spot size. Read More

Machinery & Machining Tools, Optics & Photonics, Test & Measuring Instruments

Scanning Slit Laser Beam Profiler offers sub-micron measurement.

November 5, 2015

Using moving slits, NIST-calibrated NanoScan™ 2s measures beam position and size with sub-micron precision for CW and kilohertz pulsed lasers. Offering of silicon, germanium, or pyroelectric detectors allows profiling lasers of any wavelength, from UV to far infrared, to 100 µm and beyond. Digital controller, by providing 16-bit digitization of signal for dynamic range up to 35 dB power, enables measurement of beam size and pointing with 3-sigma precision to several hundred nanometers. Read More

Machinery & Machining Tools, Optics & Photonics, Test & Measuring Instruments

Laser Beam Monitoring System supports dynamic measurements.

June 24, 2015

Featuring magnification optics for measuring beams with spot sizes down to 55 µm, non-contact BeamWatch® 2.0 monitors high-power (up to 100 kW) YAG, fiber, and diode lasers in 980–1,080 nm range used in industrial material processing applications. Unit takes measurements every 60 msec, providing instant readings of focus spot size and beam position as well as dynamic measurements of focal plane location during process start-up. Dual axis measurement support is available Read More

Machinery & Machining Tools, Optics & Photonics, Test & Measuring Instruments, Vision Systems

CCD Camera profiles large laser beams.

February 20, 2015

Measuring 43 x 43 x 65 mm, LT665 USB 3.0 Large Array Beam Profiling Camera features USB 3.0 interface that delivers 6 MP at up to 27 fps. Large, 1 in. format provides active area with 4.5 µm square pixels (2752 x 2192 array). Camera works with BeamGage beam profiling software, which includes all algorithms and calculations needed to make accurate, ISO-approved laser beam measurements, including beam size, shape, uniformity, divergence, and mode content. Read More

Machinery & Machining Tools, Optics & Photonics, Test & Measuring Instruments, Vision Systems

Pyroelectric Laser Beam Profiling Camera serves OEM applications.

February 17, 2015

Along with 80 µm pixel pitch, Pyrocam IIIHR has 160 x 160 pixel image array for profiling beams up to ½ in. without reduction optics. Pulsed and CW lasers, including CO2 and telecom NIR lasers and THz sources, can be measured from 13–355 nm and 1.06 to >3,000 µm. Interface to GigE camera supports high-speed applications, 16-bit ADC promotes reliable measurement and analysis of large and low level signals in wings of laser beam, and SNR of 1000:1 facilitates viewing of 30 mW/cm² beams. Read More

Machinery & Machining Tools, Optics & Photonics, Sensors, Monitors & Transducers, Test & Measuring Instruments

Non-Contact Industrial Beam Monitoring Systems offer 2D views.

February 17, 2015

Without requiring contact with beam, BeamWatch® instantly measures focus spots down to 80 µm dia in 60 msec intervals and position for YAG, disc, fiber, and diode lasers from 980–1,080 nm. Rayleigh scatter measurement allows monitoring at frequent intervals without shutting down or disrupting process, and 2D viewing of beams determines roundness or presence of astigmatism. Able to be run in Technician or Operator Mode, industrial laser beam profilers serve material processing applications. Read More

Machinery & Machining Tools, Sensors, Monitors & Transducers

Five-Axis Profiler offers high-speed metal removal.

May 8, 2014

Suited for aerospace titanium machining, 5-Axis Cincinnati XT super profiler offers 100 in.³/min metal removal rate (MRR). Cross rail and spindle design enable performance at high rate on sustained basis, and 5-axis gantry design utilizes high-stiffness frame. A/B rotary axes on each spindle can be independently calibrated and controlled to enhance accuracy. Gantries have 145 in. Y-axis range, with Z-axis travel of 28 in., and each spindle’s angular A and B axes can travel ±30°. Read More

Laboratory and Research Supplies & Equipment, Machinery & Machining Tools, Optics & Photonics, Sensors, Monitors & Transducers, Test & Measuring Instruments

Metrology System offers non-destructive, 3D surface profiling.

February 20, 2014

Combining lateral resolution up to 140 nm via confocal microscopy and vertical resolution up to 0.1 nm with interferometry, Leica DCM8 provides surface analysis of materials and components. Instrument is also suitable for color documentation of samples. Wide choice of Leica objectives, together with 4 LED light sources and integrated CCD camera, deliver true-to-life color images. With XY topography-stitching mode, users can obtain seamless, precise model of larger area. Read More

Machinery & Machining Tools, Optics & Photonics, Software

Laser Beam Profiler uses optimized computation engine.

February 17, 2014

Leveraging computation engine that improves cycle time and UI responsiveness while also enhancing ability to work with apertures and partitions, BeamGage® v6.1 performs data acquisition and analysis of laser beam parameters. Solution can analyze different beams or sources of light and incorporates strip chart function that allows for zooming and panning as well as charting of partitions and storage of 10,000+ data points. Solution also includes 55+ measurements and calculations. Read More

Machinery & Machining Tools, Sensors, Monitors & Transducers

Benchtop 3D Optical Profilers offer enhanced metrology abilities.

February 12, 2014

Based on non-contact optical technology and powered by Mx™ software, NewView™ 8000 series meets metrology requirements of applications in scientific research, product/process development, and manufacturing. Modular platform provides hundreds of surface results and analyses, including ISO 25178 area surface texture parameters for quantitative analysis. Features include surface visualization and surface detection algorithms and real-time interactive analysis with 2D and 3D plotting technology. Read More

Controls & Controllers, Fluid & Gas Flow Equipment, Machinery & Machining Tools, Optics & Photonics

Metso's Neles® Capping Valves Give Stora Enso Nymölla Mill an Automated Solution for Its Demanding Batch Cooking Process

November 14, 2013

Stora Enso Fine Paper’s Nymölla mill in Sweden selected Metso as the supplier of new capping valves for its batch digester line 1. In total, Metso will deliver 5 Neles PZ-series capping valves to replace the mill’s old hydraulic cappers. This gives Stora Enso an automated solution for its digesters replacing old valves and actuators that needed manual assistance in the chip filling phase... Read More

Machinery & Machining Tools, Optics & Photonics, Test & Measuring Instruments

Laser Beam Profiling Camera has large array, GigE interface.

February 13, 2013

With 320 x 320 pixel pyroelectric array that can profile beams up to 25 mm without reduction optics, Pyrocam IV measures pulsed and CW (continuous wave) lasers from 13–355 nm and 1.06 to greater than 3,000 µm. Electronics control design includes interface to GigE (Gigabit Ethernet) cameras, and integral focal plane chopper is included for CW beams and thermal imaging. Other features include 14-bit ADC, SNR of 1,000:1, and Ultracal® baseline algorithm. Read More

Machinery & Machining Tools, Optics & Photonics

Scanning Slit Laser Beam Profiler features USB2 interface.

February 11, 2013

Using moving slits, NIST-calibrated NanoScan 2 measures continuous wave (CW) and pulsed beams across spectral range from UV to far IR. Beam size and beam pointing can be measured with 3 sigma precision of several hundred nanometers. While USB2 interface provides deep, 12-bit digitization of signal for dynamic range up to 35 dB power, digital controller improves accuracy and stability of measurements. Software can measure 1–16 beams in NanoScan aperture, all with sub-micron precision. Read More

Machinery & Machining Tools, Optics & Photonics

Laser Beam Profiling System measures widths to 35 mm.

February 7, 2013

Along with 4008 x 2672 pixel format that allows profiling of beams up to 24 x 36 mm without requiring reduction optics, L11059 USB Large Format Beam Profiling Camera features 50 mm ND filters that provide max power density measurements to 15 mW/cm² without additional attenuation. Frame rates of up to 3.1 fps are supported at full resolution (up to 17 Hz in 4x4 binning mode). Featuring 59 dB dynamic range, camera can measure CW laser beams over spectral range from 190–1,100 nm. Read More

Machinery & Machining Tools, Optics & Photonics

Laser Beam Profiling System measures quality in real-time.

January 24, 2013

Working with CW and pulsed lasers down to single shot rates, Photon M2-1780 automatically measures M2 beam propagation ratio and all associated ISO 11146 parameters instantaneously at video rates over 20 Hz. CCD camera-based system, sensitive to wavelengths from ~250–1,100 nm, automatically measures with NIST-traceable accuracy to better than 2%. This translates to M2 measurements with accuracy to -5%. System works in conjunction with FireWire BeamPro Acquisition and Analysis software. Read More

Machinery & Machining Tools, Optics & Photonics, Sensors, Monitors & Transducers, Test & Measuring Instruments

G-S PLASTIC OPTICS Expands Metrology Capabilities with Bruker® Interferometric Optical Microscope

January 21, 2013

Rochester, NY - G-S PLASTIC OPTICS, a business unit of the Germanow-Simon Companies, is pleased to announce its acquisition of a Bruker® ContourGT®-K1 3D Interferometric Optical Microscope. This unique metrology system is optimized for characterizing the micro-structure of molded plastic optical elements, and the single point diamond-turned mold inserts that determine the surface structure of... Read More

Laboratory and Research Supplies & Equipment, Machinery & Machining Tools, Optics & Photonics, Sensors, Monitors & Transducers, Test & Measuring Instruments

Bruker Wins Over $7 Million in SP9900+ 3D Optical Microscope Orders

December 14, 2012

Instrument Breaks the Throughput Barrier for HDI Substrate Metrology<4444>TUCSON, AZ - Bruker announced today that it has already received more than $7 million in orders for its new Bruker SP9900+ high-throughput high density interconnect (HDI) substrate metrology system, and has begun shipping the product in volume. The SP9900+ Large Format 3D Optical Microscope is specially designed for the... Read More

Machinery & Machining Tools, Sensors, Monitors & Transducers

Bruker Nano Surfaces Division Ships 100th DektakXT Stylus Profiler

April 19, 2012

Growth in Asia Markets Aid Rapid Acceptance as Industry Standard for Thin Film Metrology<4444>Bruker Nano Surfaces Division (Tucson, AZ) has shipped 100 DektakXT(TM) Stylus Surface Profiling System since the product launched last April. The DektakXT features improved ease of use and the industry's best step height repeatability of better than 5 angstroms, 1 sigma. These and other performance... Read More

Machinery & Machining Tools, Sensors, Monitors & Transducers, Test & Measuring Instruments

Surface Roughness Measuring System serves on production lines.

July 18, 2011

Using array of probes and accessories, ergonomically designed Hommel-Etamic W5 can track 5 separate measurement programs, up to 100 separate profiles, with total storage capacity of up to 10,000 completed measurements. Integrated click wheel and color display with GUI facilitate operation, while support prism centers workpieces reliably on correct measuring position and protects probe for measurements in bores from 12 mm dia. All necessary connection are made via USB interface. Read More