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Machinery & Machining Tools -> Thread Producing & Profile Rolling Machines -> Profile Rolling Machines

Profile Rolling Machines

(Showing headlines 1 - 20)   more ....
Metrology System offers non-destructive, 3D surface profiling.

Metrology System offers non-destructive, 3D surface profiling.

Leica Microsystems, Inc.    Buffalo Grove, IL 60089
Feb 20, 2014 Combining lateral resolution up to 140 nm via confocal microscopy and vertical resolution up to 0.1 nm with interferometry, Leica DCM8 provides surface analysis of materials and components. Instrument is also suitable for color documentation of samples. Wide choice of Leica objectives, together with 4 LED light sources and integrated CCD camera, deliver true-to-life color images. With XY topography-stitching mode, users can obtain seamless, precise model of larger area.

Laser Beam Profiler uses optimized computation engine.

Ophir Optronics, Inc.    Wilmington, MA 01887
Feb 17, 2014 Leveraging computation engine that improves cycle time and UI responsiveness while also enhancing ability to work with apertures and partitions, BeamGage® v6.1 performs data acquisition and analysis of laser beam parameters. Solution can analyze different beams or sources of light and incorporates strip chart function that allows for zooming and panning as well as charting of partitions and storage of 10,000+ data points. Solution also includes 55+ measurements and calculations.

Benchtop 3D Optical Profilers offer enhanced metrology abilities.

Zygo Corp.    Middlefield, CT 06455
Feb 12, 2014 Based on non-contact optical technology and powered by Mx™ software, NewView™ 8000 series meets metrology requirements of applications in scientific research, product/process development, and manufacturing. Modular platform provides hundreds of surface results and analyses, including ISO 25178 area surface texture parameters for quantitative analysis. Features include surface visualization and surface detection algorithms and real-time interactive analysis with 2D and 3D plotting technology.

Laser Beam Profiling Camera has large array, GigE interface.

Ophir Optronics, Inc.    Wilmington, MA 01887
Feb 13, 2013 With 320 x 320 pixel pyroelectric array that can profile beams up to 25 mm without reduction optics, Pyrocam IV measures pulsed and CW (continuous wave) lasers from 13–355 nm and 1.06 to greater than 3,000 µm. Electronics control design includes interface to GigE (Gigabit Ethernet) cameras, and integral focal plane chopper is included for CW beams and thermal imaging. Other features include 14-bit ADC, SNR of 1,000:1, and Ultracal® baseline algorithm.

Scanning Slit Laser Beam Profiler features USB2 interface.

Scanning Slit Laser Beam Profiler features USB2 interface.

Ophir Optronics, Inc.    Wilmington, MA 01887
Feb 11, 2013 Using moving slits, NIST-calibrated NanoScan 2 measures continuous wave (CW) and pulsed beams across spectral range from UV to far IR. Beam size and beam pointing can be measured with 3 sigma precision of several hundred nanometers. While USB2 interface provides deep, 12-bit digitization of signal for dynamic range up to 35 dB power, digital controller improves accuracy and stability of measurements. Software can measure 1–16 beams in NanoScan aperture, all with sub-micron precision.

Laser Beam Profiling System measures widths to 35 mm.

Ophir Optronics, Inc.    Wilmington, MA 01887
Feb 07, 2013 Along with 4008 x 2672 pixel format that allows profiling of beams up to 24 x 36 mm without requiring reduction optics, L11059 USB Large Format Beam Profiling Camera features 50 mm ND filters that provide max power density measurements to 15 mW/cm² without additional attenuation. Frame rates of up to 3.1 fps are supported at full resolution (up to 17 Hz in 4x4 binning mode). Featuring 59 dB dynamic range, camera can measure CW laser beams over spectral range from 190–1,100 nm.

Laser Beam Profiling System measures quality in real-time.

Ophir-Spiricon, Inc.    Logan, UT 84321
Jan 24, 2013 Working with CW and pulsed lasers down to single shot rates, Photon M2-1780 automatically measures M2 beam propagation ratio and all associated ISO 11146 parameters instantaneously at video rates over 20 Hz. CCD camera-based system, sensitive to wavelengths from ~250–1,100 nm, automatically measures with NIST-traceable accuracy to better than 2%. This translates to M2 measurements with accuracy to -5%. System works in conjunction with FireWire BeamPro Acquisition and Analysis software.

Surface Roughness Measuring System serves on production lines.

Surface Roughness Measuring System serves on production lines.

Detroit Precision Hommel    Rochester Hills, MI 48309
Jul 18, 2011 Using array of probes and accessories, ergonomically designed Hommel-Etamic W5 can track 5 separate measurement programs, up to 100 separate profiles, with total storage capacity of up to 10,000 completed measurements. Integrated click wheel and color display with GUI facilitate operation, while support prism centers workpieces reliably on correct measuring position and protects probe for measurements in bores from 12 mm dia. All necessary connection are made via USB interface.

Laser Beam Propagation Analyzer measures M² at any wavelength.

Ophir Optronics, Inc.    Wilmington, MA 01887
Mar 24, 2011 Combining NanoScan near-field profiler with dedicated M² measurement hardware and software, NanoModeScan enables quantitative measurement and viewing of high-power CO2 laser beams in as little as 20 sec. System also reports beam waist diameter and location, divergence, and beam's Rayleigh range for each axis. With update rate of 20 Hz, system is suitable for CO2 laser-based material processing, machining, and marking applications where laser performance needs to be adjusted in real time.

Tube and Pipe Bender includes quick-change tooling.

Tube and Pipe Bender includes quick-change tooling.

CML USA, Inc.    Davenport, IA 52804
Jan 25, 2011 Designed to accept large radius tooling to 15¾ in. CLR, Giga Bender Mandrel Model GB90 can bend tube, pipe, square, and rectangular profiles to center line radius as tight as 1D. Users can program multiple bend angles to 180° with independent material spring back setting for each bend. Available with up to 6-axis NC control, machine includes USB port for unlimited program memory storage, touchscreen display with ABS or INC modes, multiple language capability, and system diagnostics.

Pipe Cutting Machine also includes profiling capabilities.

Vernon Tool Co.    Oceanside, CA 92054
Sep 28, 2010 Suited for small- to medium-sized fabricators of tube frame assemblies, MasterPipe(TM) Profiler (MPP) 2-axis, CNC pipe cutting machine is powered by Windows®-based OS and operated via touchscreen. It consolidates setup, programming, and cutting into one operation, and pre-loaded cut library optimizes pipe configuration flexibility. Capable of performing range of standard cuts, machine handles 1-12 in. OD pipe in lengths up to 40 ft.

Optical Surface Profiler suits automated HB-LED production QA/QC.

Optical Surface Profiler suits automated HB-LED production QA/QC.

Veeco Instruments Inc. Corporate Headquarters    Woodbury, NY 11797
Jul 21, 2010 ContourGT(TM)-X8 PSS is optimized for characterizing high-brightness light emitting diode (HB-LED) patterned sapphire substrates (PSS). Combination of non-contact 3D measurement capabilities with Veeco PSS metrology hardware and software technology, as well as Wafer Automation System Developer's Kit (SDK) provides tailored solution for PSS QA/QC applications requiring high throughput and repeatability. TCP/IP-based remote control capabilities are also standard.

3D Surface Metrology System has tabletop form factor.

3D Surface Metrology System has tabletop form factor.

Veeco Instruments Inc. Corporate Headquarters    Woodbury, NY 11797
Jun 09, 2010 ContourGT(TM)-K0 non-contact, 3D optical surface profiler combines streamlined architecture and functionality with measurement and computing hardware and software. Dual-LED illumination, combined with optimal vertical resolution, accommodates difficult applications and environments. In addition to Vision64(TM) Operation and Analysis Software, system features intuitive, modular nterface that offers user-level customization capabilities.

Hybrid Profiler combines thin film, optical capabilities.

Hybrid Profiler combines thin film, optical capabilities.

Taylor Hobson Ltd    Leicester   United Kingdom
Apr 22, 2010 As combined thin film and dimensional optical profiler, CCI SunStar merges non-contact dimensional measurement capability with thin and thick film technology. Integral 4 million pixel camera enables Hi-Res imaging, and film thickness measurement is possible from 5 µ down to 300 nm or less. While auto-range and auto-fringe-find functionality facilitates use, single mode of operation over all scan ranges lends to data reliability. Closed loop Z scanning mechanism is also standard.

3D Optical Surface Profiler suits wide range of applications.

3D Optical Surface Profiler suits wide range of applications.

Veeco Instruments Inc. Corporate Headquarters    Woodbury, NY 11797
Apr 16, 2010 Based on white light interferometry (WLI) technology, ContourGT(TM) Surface Metrology Product Family addresses range of production QA/QC and R&D precision machining and manufacturing applications within high brightness LED, solar, ophthalmic, semiconductor, medical device, and academic research markets. High brightness dual-LED illumination facilitates precision, non-contact, 3D surface metrology, while Vision64 operating and analysis software provides user-level-customization capabilities.

Surface Profile System offers high-precision 3D inspection.

Nikon Instruments, Inc.    Melville, NY 11747-3064
Oct 05, 2009 Model BW-H501 3D surface profile system features high-speed X-Cycle Imager allowing image capture of 900 fps with output/display of height images at 5 fps. It also integrates BridgeElements software which supports simultaneous capture of multiple images, allowing real-time image comparison. By utilizing fringe cycle method, system can achieve height resolution of 100 nm and perform surface profiling in as little as 200 ms for height of 40 µm.

CCD-Based Laser Beam Profiler delivers 12-bit resolution.

CCD-Based Laser Beam Profiler delivers 12-bit resolution.

Photon, Inc.    San Jose, CA 95119
Sep 25, 2009 Operating under BeamProfiler Software in MS Windows®, USBeamPro CCD provides NIST-traceable measurements of ISO Standard laser beam profile parameters - laser beam diameter, centroid, power/energy - for CW, pulsed, and single-shot lasers. USB 2.0 interface facilitates use and promotes portability, while ½ in. format 1,360 x 1,024 array with 4.65 µm square pixels offers total imaging area of 6.32 x 4.76 mm. Camera dimensions (70 x 95 x 33 mm) aid placement into typical optical paths.

Programmable Bender features PLC touch screen control.

Programmable Bender features PLC touch screen control.

CML USA, Inc.    Davenport, IA 52804
Sep 17, 2009 Capable of handling large diameter pipe, tube, squares, rectangular, solids, and other profiles, Model TB90 offers bending capacity to 4 in. and bends to centerline radius as small as 2D. Touch screen control offers access to automatic and manual operating modes, programming, system diagnostics, multiple language capability, and digital display of counterbend die axis and bend angle. Other features include Class 3 safety hand-held remote control and unlimited program storage via USB.

Tube and Pipe Bender features heavy steel structure.

Tube and Pipe Bender features heavy steel structure.

CML USA, Inc.    Davenport, IA 52804
May 12, 2009 Designed to accept large radii tooling to 16 in. CLR, GB90/GB100 Semi-Automatic Giga Bender Mandrel Machine bends tube, pipe, square and rectangular profiles to center radius as tight as 1.5D. System offers programmable bend angles with independent material springback setting for each bend, and interactive PLC touch screen for access to auto and manual operating modes, system diagnostics, and multiple language capability. USB enables unlimited program memory storage and communication.

Portable Beam Profiler works with high-power CO2 lasers.

Ophir-Spiricon, Inc.    Logan, UT 84321
Apr 21, 2009 Designed to verify performance and reduce changeover time for industrial parts manufacturers, ModeCheck(TM) enables quantitative measurement and viewing of high-power CW and pulsed lasers in 8-30 µm range with intensities up to 30 W/cm². Industrial solution measures key characteristics of laser beam profile in real-time and stores mode images for later recall and comparison. Over time, user will be able to measure laser degradation and predict and schedule downtime for maintenance.

(Showing headlines 1 - 20)   more ....

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