Pattern Generators

Electronic Components & Devices

Test Pattern Generator cuts ATPG runtime from days to hours.

July 14, 2016

Built on test generation, fault simulation, and diagnosis engines that are extremely fast, TetraMAX® II ensures patterns are ready when early silicon samples are first available for testing. Pattern reduction enables designers to shorten time of testing, while memory efficiency enables utilization of all server cores regardless of design size. Reuse of design modeling and rule checking infrastructure, as well as user and tool interfaces, ensures designers can quickly deploy TetraMAX II risk-free. Read More

Electronic Components & Devices, Optics & Photonics, Software, Test & Measuring Instruments

PC-Based Test Instrument features 8-in-1 functionality.

April 4, 2016

Featuring 3 x 5 in. pocket-size design, Model SF880 combines 100 dB dynamic range frequency response analyzer, 1 GHz oscilloscope, spectrum analyzer, arbitrary waveform generator, data logger, frequency and phase meter with 10 Hz to 1 GHz range, logic analyzer, and pattern generator. Data recorder time base range is 500 nS to 365 days. Instrument works with any Windows computer with USB port, with no need for external power supply. Read More

Electronic Components & Devices

FEV Shows ASM Box at 2015 SAE World Congress

April 24, 2015

ASM Box provides efficient OBD signal manipulation for homologation and certification AUBURN HILLS, Mich. - FEV North America, Inc. (FEV) a leading developer of vehicle systems and advanced powertrain technologies, will be showing its Actuator Sensor Manipulation (ASM) Box at the 2015 SAE World Congress, April 21 - 23 at Cobo Center in Detroit, Mich. The ASM Box is part of FEV's... Read More

Electronic Components & Devices, Test & Measuring Instruments

Mixed Signal Oscilloscope features fanless design.

September 18, 2014

Measuring analog and digital signals simultaneously, R&S HMO1002 offers 1 MPts of memory depth, 1 GSa/s real-time sampling rate, vertical sensitivity of 1 mV/div, and integrated 128 Kpoint FFT. Integrated pattern generator enables professional embedded developers to program protocol messages at up to 50 Mbps, while digital voltmeter makes it possible to perform voltage measurement simultaneously on both analog channels with 2 user-definable parameters each. Read More

Communication Systems & Equipment, Electronic Components & Devices

Video Test Pattern Generator calibrates digital displays.

April 3, 2014

Portable and battery-powered, MONTEST-3GSDI 3G-SDI supports audio testing at 1 KHz tone and maximum 148.5 MHz pixel frequency. Unit features 8 video test patterns and 7 timings up to HDTV 1080p. SDI standard transfer signals are uncompressed and are self-synchronizing between source (transmitter) and destination (receiver). Measuring 3.66 x 5.71 x 1.30 in., in-field tester supports protocols SMPTE 424M, SMTPE 274M, SMPTE 296M, and ITU-R BT.601, with bit rate of 2.97 Gbps. Read More

Communication Systems & Equipment, Electronic Components & Devices

Video Test Pattern Generator features portable design.

January 8, 2014

Powered by 4.8 V, 2300 mAh Ni-MH battery, MONTEST-CMP generates video test patterns for evaluating HDTV YPbPr component video displays. Unit features 36 static and dynamic video test patterns and 10 timings up to 1080p, including patterns such as color bar, gray, grid, and block. MONTEST-CMP supports Bi-Level (EIA) and Tri-Level (STMPTE) sync, and up to 148.5 MHz pixel frequency. Compatible with any component interface, 3 female RCA output connectors support cable lengths up to 16 ft. Read More

Communication Systems & Equipment, Electronic Components & Devices

Video Test Pattern Generator evaluates VGA displays.

November 7, 2013

Powered by 4.8 V, 2,300 mAh rechargeable Ni-MH battery, MONTEST-VGA generates video test patterns for evaluating color performance and linearity of VGA displays. Portable unit provides 36 static and dynamic video test patterns and 38 timings up to WUXGA 1920 x 1200, including patterns such as color bar, gray, grid, and block. Controlled via front panel buttons and 16 x 2 LCD, MONTEST-VGA supports H/V sync and sync on green, and up to maximum 162 MHz pixel frequency. Read More

Electronic Components & Devices, Test & Measuring Instruments

Agilent Technologies to Showcase Bit Error Ratio Tester at OFC/NFOEC

March 22, 2013

New Options Enable 32-Gb/s ASIC Component and Optical Transceiver Designs SANTA CLARA, Calif.- Agilent Technologies Inc. (NYSE: A) today announced it will demonstrate a 32-Gb/s bit error ratio tester with four-tap de-emphasis at the Optical Fiber Communication Conference and Exposition (OFC) and National Fiber Optic Engineers Conference (NFOEC), March 19-21, at the Anaheim Convention... Read More

Communication Systems & Equipment, Electronic Components & Devices, Sensors, Monitors & Transducers, Test & Measuring Instruments

Agilent Technologies to Demonstrate Test and Measurement Solutions at OFC/NFOEC for 100G and Beyond

March 20, 2013

High-Speed Testing along Entire Value Chain of Data Centers and Cloud Computing SANTA CLARA, Calif. - Agilent Technologies Inc. (NYSE: A) today announced it will demonstrate test and measurement solutions for high-speed communication at the Optical Fiber Communication Conference and Exposition (OFC) and National Fiber Optic Engineers Conference (NFOEC), March 19-21, at the Anaheim Convention... Read More

Electronic Components & Devices, Test & Measuring Instruments

System Evaluation Kit tests high-speed data converters.

March 20, 2013

With HSDC-SEK-10, users can minimize evaluation time for host of demanding applications in which high-speed data converters are key system performance drivers, such as test and measurement, communications, defense, and medical equipment. System components include: pattern capture card with capture buffer of 64 K samples, pattern generator card, low-jitter programmable clock source, clean 10 MHz signal source, and multi-output regulated power supply. Read More

Computer Hardware & Peripherals, Electronic Components & Devices, Software, Test & Measuring Instruments

Agilent Technologies' Network Analyzer and Oscilloscope Approved for SATA Gen 3 Certification Testing

March 1, 2011

SANTA CLARA, Calif.- Agilent Technologies Inc. (NYSE: A) today announced that the Serial ATA International Organization (SATA-IO) has approved Agilent's 90000 X-Series oscilloscope and E5071C network analyzer with Option TDR (time-domain reflectometry) to provide SATA Gen 3 Interoperability Program Revision 1.4 product testing and certification. The instruments cover the transmitter, return loss... Read More

Electronic Components & Devices, Software, Test & Measuring Instruments

Agilent Technologies' Test Solutions Chosen by Allion Test Labs for USB 3.0, HDMI 1.4, DisplayPort Compliance Testing

November 23, 2010

SANTA CLARA, Calif. -- Agilent Technologies Inc. (NYSE: A) today announced that Allion Test Labs, Shenzhen, China, has selected Agilent's test solutions for USB 3.0 and DisplayPort compliance and certification testing.<4444>Agilent also announced that Allion Test Labs, Taipei, Taiwan, upgraded its Agilent HDMI 1.3 test solution to HDMI 1.4 and added the J-BERT N4903B's new symbol and frame error... Read More

Electronic Components & Devices, Software, Test & Measuring Instruments

USB Electronic System Analyzer speeds system-on-board development.

January 19, 2010

Featuring ADWG (Arbitrary Digital Waveform Generator) and logic analyzer capabilities, GP-24100 PC-controlled USB 2.0 high speed device enables stimulation and analysis of digital interfaces. It streams data to/from PC to 16 data lines at up to 10 MHz, with 6 additional control lines for repetitive sequence generation, in/out clocking, or trigger definition. Along with max sustained throughput via USB of 30 MBps, device comes with 8 MB embedded memory buffer and 8PI Control Panel Software. Read More

Communication Systems & Equipment, Computer Hardware & Peripherals, Electronic Components & Devices, Software, Test & Measuring Instruments

Agilent Technologies' HDMI CTS 1.4 Test Solution Selected by Simplay Labs

December 14, 2009

SANTA CLARA, Calif., -- Agilent Technologies Inc. (NYSE: A) today announced that Simplay Labs, LLC, the company operating four of the eight global HDMI Authorized Test Centers (ATCs), has selected Agilent Technologies as its High-Definition Multimedia Interface (HDMI) test solution provider. Agilent's test solution meets, or exceeds, the requirements of the HDMI Compliance Test Specification... Read More

Electronic Components & Devices

Arbitrary Noise Generator supports pulses up to 120 MHz.

May 28, 2009

Combining pattern generator and pulse function arbitrary noise generator, Model 81150A can test analog, digital, and mixed signal devices. Device facilitates debugging, characterization, and compliance tests, and supports various bus standards, including Flexray, with 3 level signals, initialization sequences, and long patterns. Pattern generator supports each development phase for sine waves up to 240 MHz, 14-bit and 2 GSa/s arbitrary waveforms, and PRBS up to 231. Read More

Electronic Components & Devices

Pattern Generators complement high-speed applications.

May 1, 2009

Featuring dc coupled differential output programmable from 250 mV to 2.0 V, 8 GHz Model 12040 and 12.5 GHz Model 12050 are designed to address test requirements at higher data rates. Both units are fully programmable, with adjustable frequency, amplitude, offset, and crossing point. Users may also select from pre-defined PRBS patterns or programmable user-defined data (up to 512 kb). Front panel touch screen GUI and USB computer control options are available. Read More

Communication Systems & Equipment, Electronic Components & Devices, Optics & Photonics, Test & Measuring Instruments

Communication Analyzer features smart post processing.

April 10, 2009

Addressing requirements of optical transceiver manufacturers, PXIT N2100B DCA is available with PXIT 10G Digital Communication Analyzer (DCA), Passive Optical Network (PON) filter rate options, and smart post processing. It supports data acquisition rates to 160 MS/s and also enables transceiver manufacturers to capture multiple sets of eye diagrams under different test conditions and then process it during downtime. Read More

Electronic Components & Devices, Machinery & Machining Tools, Printing & Duplicating Equipment, Services

NIST Fabrication Facility adds electron beam lithography system.

February 27, 2009

NanoFab (nanoscale fabrication facility) at NIST is expanding its capabilities to serve those specializing in development of nanotechnology-related products and processes. Managed by NIST's Center for Nanoscale Science and Technology (CNST), national user facility is adding second high-voltage, large-field electron-beam lithography system into operation in April. Recently, center added Heidelberg DWL-66FS laser pattern generator, Oxford FlexALRPT, and 2 ICP reactive ion etch systems. Read More

Electronic Components & Devices

Handheld Pulse/Pattern Generator produces ultra-low jitter.

January 6, 2009

Generating data signals up to 1.5 GHz, Model SK-1500ULJ features rms jitter of less than 0.5 ps, suited for low-noise reference clocks. Unit offers 5-digit frequency resolution, 180 ps rise/fall time, and amplitude range of 100 mV to 3 V, as well as touch-screen control interface and built-in PRBS or customer data patterns. Frequency range is 2 MHz to 1.5 GHz. Read More

Electronic Components & Devices

Pulse Pattern Generators offer programmable capabilities.

October 14, 2008

Suited for serial data, semiconductor, and general purpose high-speed pulse testing, 12000 Series includes 165 MHz/20 Vpp Model 12000, 800 MHz/2.5 Vpp Model 12010, and 1.6 GHz/2.5 Vpp Model 12020. Featuring up to 40 V output, Model 12000 offers adjustable risetime, amplitude, offset, period, duration, delay, load impedance, and source impedance. Models 12010 and 12020 include 16 Mbit memory depth per channel, option for built-in jitter insertion, and spread spectrum clocking capability. Read More