Pattern Generators

Electronic Components & Devices

Test Pattern Generator cuts ATPG runtime from days to hours.

July 14, 2016

Built on test generation, fault simulation, and diagnosis engines that are extremely fast, TetraMAX® II ensures patterns are ready when early silicon samples are first available for testing. Pattern reduction enables designers to shorten time of testing, while memory efficiency enables utilization of all server cores regardless of design size. Reuse of design modeling and rule checking... Read More

Electronic Components & Devices, Optics & Photonics, Software, Test & Measuring Instruments

PC-Based Test Instrument features 8-in-1 functionality.

April 4, 2016

Featuring 3 x 5 in. pocket-size design, Model SF880 combines 100 dB dynamic range frequency response analyzer, 1 GHz oscilloscope, spectrum analyzer, arbitrary waveform generator, data logger, frequency and phase meter with 10 Hz to 1 GHz range, logic analyzer, and pattern generator. Data recorder time base range is 500 nS to 365 days. Instrument works with any Windows computer with USB port,... Read More

Electronic Components & Devices

FEV Shows ASM Box at 2015 SAE World Congress

April 24, 2015

ASM Box provides efficient OBD signal manipulation for homologation and certification AUBURN HILLS, Mich. - FEV North America, Inc. (FEV) a leading developer of vehicle systems and advanced powertrain technologies, will be showing its Actuator Sensor Manipulation (ASM) Box at the 2015 SAE World Congress, April 21 - 23 at Cobo Center in Detroit, Mich. The ASM Box is part of FEV's... Read More

Communication Systems & Equipment, Electronic Components & Devices

Video Test Pattern Generator calibrates digital displays.

April 3, 2014

Portable and battery-powered, MONTEST-3GSDI 3G-SDI supports audio testing at 1 KHz tone and maximum 148.5 MHz pixel frequency. Unit features 8 video test patterns and 7 timings up to HDTV 1080p. SDI standard transfer signals are uncompressed and are self-synchronizing between source (transmitter) and destination (receiver). Measuring 3.66 x 5.71 x 1.30 in., in-field tester supports protocols... Read More

Communication Systems & Equipment, Electronic Components & Devices

Video Test Pattern Generator features portable design.

January 8, 2014

Powered by 4.8 V, 2300 mAh Ni-MH battery, MONTEST-CMP generates video test patterns for evaluating HDTV YPbPr component video displays. Unit features 36 static and dynamic video test patterns and 10 timings up to 1080p, including patterns such as color bar, gray, grid, and block. MONTEST-CMP supports Bi-Level (EIA) and Tri-Level (STMPTE) sync, and up to 148.5 MHz pixel frequency. Compatible with... Read More

Communication Systems & Equipment, Electronic Components & Devices

Video Test Pattern Generator evaluates VGA displays.

November 7, 2013

Powered by 4.8 V, 2,300 mAh rechargeable Ni-MH battery, MONTEST-VGA generates video test patterns for evaluating color performance and linearity of VGA displays. Portable unit provides 36 static and dynamic video test patterns and 38 timings up to WUXGA 1920 x 1200, including patterns such as color bar, gray, grid, and block. Controlled via front panel buttons and 16 x 2 LCD, MONTEST-VGA supports... Read More

Electronic Components & Devices, Test & Measuring Instruments

Agilent Technologies to Showcase Bit Error Ratio Tester at OFC/NFOEC

March 22, 2013

New Options Enable 32-Gb/s ASIC Component and Optical Transceiver Designs SANTA CLARA, Calif.- Agilent Technologies Inc. (NYSE: A) today announced it will demonstrate a 32-Gb/s bit error ratio tester with four-tap de-emphasis at the Optical Fiber Communication Conference and Exposition (OFC) and National Fiber Optic Engineers Conference (NFOEC), March 19-21, at the Anaheim Convention Center... Read More

Electronic Components & Devices, Test & Measuring Instruments

System Evaluation Kit tests high-speed data converters.

March 20, 2013

With HSDC-SEK-10, users can minimize evaluation time for host of demanding applications in which high-speed data converters are key system performance drivers, such as test and measurement, communications, defense, and medical equipment. System components include: pattern capture card with capture buffer of 64 K samples, pattern generator card, low-jitter programmable clock source, clean 10 MHz... Read More

Communication Systems & Equipment, Electronic Components & Devices, Sensors Monitors & Transducers, Test & Measuring Instruments

Agilent Technologies to Demonstrate Test and Measurement Solutions at OFC/NFOEC for 100G and Beyond

March 20, 2013

High-Speed Testing along Entire Value Chain of Data Centers and Cloud Computing SANTA CLARA, Calif. - Agilent Technologies Inc. (NYSE: A) today announced it will demonstrate test and measurement solutions for high-speed communication at the Optical Fiber Communication Conference and Exposition (OFC) and National Fiber Optic Engineers Conference (NFOEC), March 19-21, at the Anaheim Convention... Read More

Electronic Components & Devices, Software, Test & Measuring Instruments

USB Electronic System Analyzer speeds system-on-board development.

January 19, 2010

Featuring ADWG (Arbitrary Digital Waveform Generator) and logic analyzer capabilities, GP-24100 PC-controlled USB 2.0 high speed device enables stimulation and analysis of digital interfaces. It streams data to/from PC to 16 data lines at up to 10 MHz, with 6 additional control lines for repetitive sequence generation, in/out clocking, or trigger definition. Along with max sustained throughput... Read More

Electronic Components & Devices

Arbitrary Noise Generator supports pulses up to 120 MHz.

May 28, 2009

Combining pattern generator and pulse function arbitrary noise generator, Model 81150A can test analog, digital, and mixed signal devices. Device facilitates debugging, characterization, and compliance tests, and supports various bus standards, including Flexray, with 3 level signals, initialization sequences, and long patterns. Pattern generator supports each development phase for sine waves up... Read More

Electronic Components & Devices

Pattern Generators complement high-speed applications.

May 1, 2009

Featuring dc coupled differential output programmable from 250 mV to 2.0 V, 8 GHz Model 12040 and 12.5 GHz Model 12050 are designed to address test requirements at higher data rates. Both units are fully programmable, with adjustable frequency, amplitude, offset, and crossing point. Users may also select from pre-defined PRBS patterns or programmable user-defined data (up to 512 kb). Front panel... Read More

Communication Systems & Equipment, Electronic Components & Devices, Optics & Photonics, Test & Measuring Instruments

Communication Analyzer features smart post processing.

April 10, 2009

Addressing requirements of optical transceiver manufacturers, PXIT N2100B DCA is available with PXIT 10G Digital Communication Analyzer (DCA), Passive Optical Network (PON) filter rate options, and smart post processing. It supports data acquisition rates to 160 MS/s and also enables transceiver manufacturers to capture multiple sets of eye diagrams under different test conditions and then... Read More

Electronic Components & Devices, Machinery & Machining Tools, Printing & Duplicating Equipment, Services

NIST Fabrication Facility adds electron beam lithography system.

February 27, 2009

NanoFab (nanoscale fabrication facility) at NIST is expanding its capabilities to serve those specializing in development of nanotechnology-related products and processes. Managed by NIST's Center for Nanoscale Science and Technology (CNST), national user facility is adding second high-voltage, large-field electron-beam lithography system into operation in April. Recently, center added Heidelberg... Read More

Electronic Components & Devices

Handheld Pulse/Pattern Generator produces ultra-low jitter.

January 6, 2009

Generating data signals up to 1.5 GHz, Model SK-1500ULJ features rms jitter of less than 0.5 ps, suited for low-noise reference clocks. Unit offers 5-digit frequency resolution, 180 ps rise/fall time, and amplitude range of 100 mV to 3 V, as well as touch-screen control interface and built-in PRBS or customer data patterns. Frequency range is 2 MHz to 1.5 GHz. Read More

Electronic Components & Devices

Pulse Pattern Generators offer programmable capabilities.

October 14, 2008

Suited for serial data, semiconductor, and general purpose high-speed pulse testing, 12000 Series includes 165 MHz/20 Vpp Model 12000, 800 MHz/2.5 Vpp Model 12010, and 1.6 GHz/2.5 Vpp Model 12020. Featuring up to 40 V output, Model 12000 offers adjustable risetime, amplitude, offset, period, duration, delay, load impedance, and source impedance. Models 12010 and 12020 include 16 Mbit memory depth... Read More

Electronic Components & Devices, Test & Measuring Instruments

Waveform/Pattern Generator has 128 kB FIFO memory.

August 11, 2008

Including 4 models, USB-DIO-16H port-powered USB 2.0 device features 16 high-speed buffered digital inputs or outputs at continuous, sustained streaming speeds up to 16 MB/sec for unlimited waveform length. Capable of 80 MB/sec bursts with handshaking signals for synchronizing communications and additional 18 bits of general purpose digital I/O, it offers hot swapping functionality for quick... Read More