Product News: Test & Measuring Instruments
Test SIM Cards feature 4FF format.
Press Release Summary:
July 31, 2012 - With size of 12.3 x 8.8 x 0.67 mm, Nano SIM Cards are used to test mobile phones and devices and to ensure full functionality without having access to live network. Cards are 128 K/J LTE Test (U)SIM units with LTE data fields. Supporting 3 voltage classes of 1.8, 3, and 5 V, cards are suited for SIM, USIM, and ISIM applications. Backwards compatible design enables use of adaptors for devices with different form factors.
Original Press Release
COMPRION Launches New 4FF Products
Press release date: July 1, 2012
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