Product News: Software
Spectral Surface Mapping Software enhances microspectrometers.
Press Release Summary:
September 5, 2012 - Spectral Surface Mapping(TM) (S2M(TM)) lets Perfect Vision(TM) microspectrophotometer users map spectral variation of surfaces of samples with microscopic spatial resolution. Surface profiles can be created using UV-visible-NIR transmission, absorbance, emission, fluorescence, and polarization microspectral data. Used with microspectrometers with programmable stages, solution lets user automatically take spectral measurements with user-defined mapping patterns that reach to limits of stage itself.
Original Press Release
Introducing CRAIC Technologies New Spectral Surface Mapping(TM) Capability
Press release date: September 1, 2012
San Dimas, CA -- CRAIC Technologies, the world leading innovator of microanalysis solutions, is proud to announce Spectral Surface Mapping(TM) (S2M(TM)) capabilities for its Perfect Vision(TM) microspectrophotometer line. S2M(TM) gives CRAIC microspectrometer users the ability to map the spectral variation of surfaces of their samples with microscopic spatial resolution. Surface profiles can be created using UV-visible-NIR transmission, absorbance, emission, fluorescence and polarization microspectral data. S2M(TM) can even create maps from Raman microspectral data from the CRAIC Apollo(TM) Raman microspectrometer. CRAIC microspectrometers can now created highly detailed spectral maps with micron scale resolution rapidly and automatically.
"CRAIC Technologies has worked to develop the Spectral Surface Mapping(TM) package because of customer requests. Our customers wanted the ability to automatically survey and characterize the entire surface of samples by their spectral characteristics. They also wanted a high spatial resolution" states Dr. Paul Martin, President of CRAIC Technologies. "The S2M(TM) package does just that. It allows you to collect spectral data from thousands of points with a user defined mapping pattern. And because our customers deal with so many different types of microspectroscopy, we gave S2M(TM) the ability to map UV-visible-NIR transmission, absorbance, reflectance, emission and even Raman microspectra all with the same tool."
Spectral Surface Mapping(TM) includes a software module to be used with CRAIC Technologies MINERVA(TM) microspectrometer control software. When employed with CRAIC Technologies microspectrometers with programmable stages, S2M(TM) allows a user to automatically take spectral measurements with user-defined mapping patterns that reach to the limits of the stage itself. With the ability to measure up to a million points, high definition maps of the spectral response of the surface of a sample may be generated. And because of the flexibility and power of the software, the maps may be from transmission, absorbance, reflectance, fluorescence, emission and even polarization data. Raman spectral responses may even be collected and mapped when used with CRAIC Technologies Apollo(TM) Raman microspectrometers. S2M(TM) gives even more power to the scientist and engineer to study the entire surface of their samples by several different methods and in the highest level of detail.
For more information about Spectral Surface Mapping(TM) capabilities of CRAIC Technologies microspectrometers, visit www.microspectra.com/ .
About CRAIC Technologies: CRAIC Technologies, Inc. is a global technology leader focused on innovations for microscopy and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates cutting-edge solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides answers for customers in forensic sciences, biotechnology, semiconductor, geology, nanotechnology and materials science markets who demand quality, accuracy, precision, speed and the best in customer support.
Contact information: CRAIC Technologies, Inc. www.microspectra.com/ firstname.lastname@example.org +1-310-573-8180