Boundary-Scan Controller offers sustained clock speeds of 40 MHz.
Press Release Summary:
Supporting PXIe/Compact PCI-express slot format, DataBlaster JT 37x7/PXIe satisfies requirements for high-speed In-System Programming of flash memories, serial memories, and CPLDs as well as complex digital circuit testing. Controller uses Enhanced Throughput Technology and features on-board flash image buffer memory. Supplied with complementary QuadPOD(TM) system, DataBlaster/PXIe offers 4 synchronized Test Access Ports able to support multi-TAP test targets or gang programming of 4 TAP targets.
Original Press Release:
Newest Express Boundary-Scan Controller
Eindhoven, the Netherlands, -- JTAG Technologies, provider of solutions for testing and programming high-density PCBs, announces a further extension to its line of high-performance boundary-scan IEEE Std. 1149.1 controllers. Known as the DataBlaster JT 37x7/PXIe the new unit offers support for the increasingly popular PXIe/Compact PCI-express slot format that now features in some of the latest Automatic Test Equipment based on the PXI(e) standards.
Keeping pace with industry demands, JTAG Technologies has developed the new boundary-scan controller to satisfy the growing requirements for high-speed In-System Programming (ISP) of flash memories, serial memories and CPLDs as well as complex digital circuit testing. The new DataBlaster JT 37x7/PXIe offers users sustained test clock speeds of up to 40MHz by use of JTAG Technologies' proprietary ETT(TM) (Enhanced Throughput Technology) system and features an on-board flash image buffer memory.
Supplied with the complementary QuadPOD(TM) system, the new DataBlaster/PXIe offers four synchronised TAPs (Test Access Ports) able to support multi-TAP test targets (UUTs) or gang programming of four single TAP targets. QuadPOD(TM) can also house the full range of JTAG Technologies' SCIL modules, allowing the user to deploy custom test interfaces (BDM, I2C etc..) or the mixed signal DAF (Digital, Analog Frequency) measurement module.
Peter van den Eijnden (MD), sees more advantages as the JTAG/Boundary-scan capability is finding its way into many industry sectors from Automotive through to Particle Physics, many of which have demanding functional test requirements. Matching JTAG's digital and mixed-signal hardware to their preferred environment is also priority for JTAG Technologies..
The scalable DataBlaster JT 37x7/PXIe range starts with the low-cost entry model JT 3707/PXIe, ideal for high-speed test applications and in-system PLD programming. Companion models JT 3717/PXIe and JT 3727/PXIe, optionally fitted with an ETT(TM) module for flash ISP, support high-throughput flash programming as well as test and PLD programming.
DataBlaster/PXIe units are fully compatible with all revisions of JTAG Technologies' test and ISP tools, such as JTAG ProVision and the former 'Classic' family of development and factory run-time packages.
About JTAG Technologies
JTAG Technologies is a market leader and technology innovator of boundary-scan software and hardware products and services, focusing on the development of boundary-scan technology. It was the first to bring to the market such important advances as automated test generation, automated flash and PLD programming via boundary-scan, and visualized boundary-scan analysis. Its customers include world leaders in electronics design and manufacturing such as Alcatel-Lucent, Ericsson, Flextronics, Honeywell, Medtronic, Motorola, Nokia, Philips, Raytheon, Rockwell-Collins, Samsung, and Sony. Its innovative boundary-scan products provide test development, test execution, coverage analysis and in-system programming applications. With an installed base of over 6,000 systems worldwide, JTAG Technologies serves the communications, medical electronics, avionics, defense, automotive, and consumer industries with offices throughout North America, Europe and Asia. JTAG Technologies headquarters are located in Eindhoven, The Netherlands.
For further details on products and services please contact www.jtag.com
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