XRF Spectrometer determines WEEE/RoHS compliance.
March 30, 2007 -
Matrix XRF spectrometers can be configured with gas-proportional, Si-PIN, or silicon drift type detectors and primary beam filtration to provide non-destructive verification of RoHS restricted elements at 1,000 or 100 ppm action level. Able to measure total lead, mercury, chromium, bromine, and cadmium, bench-top systems also allow for lead content quantification. Products are suited for use on plating applications in metal finishing and electronic industries.
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Original Press release
Matrix Metrologies, Inc.
101-5 Colin Dr.
Holbrook, NY, 11741
USA
Matrix Metrologies Introduces New XRF Tool Platform for WEEE/RoHS Compliance Testing
HOLBROOK, NY - March, 2007 - Matrix Metrologies, Inc., a supplier of film measurement equipment, introduces a new line of XRF tools for Compliance Testing and Monitoring of prohibitive metals for the EU WEEE/ RoHS directive for typical plating applications in the metal finishing and electronic industries. The new RoHS Compliance testing Benchtop XRF systems provide non-destructive measurement of total Lead ( Pb), Mercury ( Hg), Chromium (Cr), Bromine (Br), and Cadmium (Cd) in almost any material and allow for lead content quantification for reverse RoHS applications including military and aerospace demands requiring 2-5 % minimum lead content. In addition, Matrix offers certified reference standards that can be used for tool audit and measurement integrity management. The new RoHS Compliance testing XRF tools can also measure standard film thickness applications on fasteners, connectors, general metal finished parts and circuit boards and electronic packages.
Matrix XRF spectrometers can be configured with gas-proportional, Si-PIN, or Silicon Drift type detectors and primary beam filtration to provide rapid, non-destructive verification of RoHS restricted elements at the 1000 or 100 PPM action level. Mechanical or Optical X-ray beam collimation in conjunction with video camera alignment allows confirmation of specific analysis areas and features.
The Matrix RoHS analyzers are part of Matrix Metrologies complete family of handheld and benchtop x-ray fluorescence thickness and composition and WEEH/RoHS compliance testing measurement tools.
Matrix Metrologies, headquartered in Holbrook, New York, is a supplier of X-ray measurement equipment and services used for film thickness and composition measurement, restricted element concentration determination for WEEH/RoHS compliance testing of hazardous substances and trace element and bulk element composition measurement commonly employed in the metal finishing, microelectronics and pharmaceutical industries. Matrix offers over twenty five years experience in metrology analysis, XRF instrumentation recertification and repair and supplies a complete line of NIST traceable calibration standards and recertification services.
Additional information on Matrix can be found at http://www.matrixmetrologies.com.
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