XRF Glass Panel Sampling Tool suits CIGS/CdTe PV panel film.
March 6, 2009 -
Featuring 600 x 1,200 mm lateral X/Y range of measurement, SMX-FPV is designed for near-line film composition and thickness control of CIGS and CdTe film stacks. It also provides process control of active, contact, and TCO layers. Detailed analysis of full photovoltaic panels is possible, including copper and gallium ratio determination as well as panel gradient analysis. Areas of use include research and process development, in-process monitoring, and post-process QC.
(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Original Press release
Solar Metrology
101-5 Colin Drive
Holbrook, NY, 11714
USA
XRF Glass Panel Sampling Tool for CIGS and CdTe PV Panel Film Composition and Thickness Measurement
HOLBROOK, NY, - February 2009- Solar Metrology, a global provider of X-Ray Fluorescence (XRF) analysis tools, Expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS and CdTe photovoltaic depositions with the addition of the FPV, Full panel view, SMX model.
The SMX-FPV is designed for near-line film composition and thickness control of CIGS and CdTe film stacks. The tool has a full 600 by 1200 mm lateral xy range of measurement and is designed for measurement of rigid glass substrates. The FPV provides process control of active, contact and TCO layers. Detailed analysis of full photovoltaic panels is possible including fast and repeatable Copper and Gallium ratio determination as well as panel gradient analysis allows for yield improvement and management and conversion efficiency gains in production.
Solar Metrology's SMX Measurement System provides a production-ready suite of film thickness and composition measurement tools for research and process development, in-process monitoring and post-process quality control.
Solar Metrology is the global leader in the development and manufacture of high-performance X-Ray Fluorescence (XRF) analysis tools, specifically engineered to meet the demanding thin film measurement requirements of the solar electric and renewable power industries.
Additional information on Solar Metrology can be found at http://www.solarmetrology.com or info@solarmetrology.com
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