XRF Analyzer provides 100% non-destructive measurements.

Press Release Summary:



Incorporating high-power X-ray tube, solid state detector, and fully programmable X, Y, Z stage, X-Strata980 application package P/No P980-S utilizes single collimator which can be configured to 1 of 5 sizes based on user's application needs. Users can also choose empirical or fundamental parameter calibration. With embedded camera and live video imaging, analyzer is suited for metal alloy chemistry identification and coating thickness measurement of gold and palladium on electronics.



Original Press Release:



The X-Strata980 Application Package P/No P980-S is Making High Accuracy Analysis More Affordable for Plating Thickness and Composition Analysis



Oxford Instruments has configured a new high performance, cost-effective X-Strata980 application package P/No P980-S X-ray fluorescence (XRF) analyzer, incorporating all the powerful and robust benefits of the X-Strata series of instruments, but at an affordable price. The X-Strata980 application package P/No P980-S model incorporates a high-power X-ray tube, high resolution solid state detector, large fully programmable X, Y, Z stage, and includes one collimator, which will be configured upon purchase to one of five available sizes based on the user’s typical application needs. Note: This configuration is currently exclusive to users in North and Latin America.



Key applications for this instrument include General Metal Finishing (GMF), coating thickness measurement of gold and palladium on electronics, metal alloy chemistry identification, and coating thickness measurement on jewelry. Analysis with the X-Strata980 application package P/No P980-S is 100% non-destructive and does not require any harsh chemical or sample preparation.



The single collimator X-Strata980 application package P/No P980-S provides the user with freedom to choose the best calibration method for their specific application – either empirical or fundamental parameter calibration.  When the matrix and range is known, the empirical calibration method will provide the best accuracy for alloy identification and chemical composition.  But when matrix matches and standards are not readily available, then the fundamental parameter technique, with full spectrum database, provides reliable quantitative analysis covering a wide range of concentrations and thicknesses for complex coatings and substrates.



If qualitative analysis over a large area is required then the optional mapping software can be used. A comprehensive scan can be performed in one measurement and should a problem area be identified, the operator can return to specific spots with pinpoint accuracy and execute quantitative micro spot analysis.  The analyzer’s embedded camera and live video imaging ensure precise sample measurement.  This flexible imaging can generate an image of the entire sample with the concentration or intensity of an element superimposed with a color map.  Composite maps will display the combined intensity or concentration of multiple elements.



The X-Strata980 application package P/No P980-S is easy to use with reliable results will not vary from operator to operator.  Its detailed reports are available and can quickly be exported into Excel.  Shortcut keys allow the user to choose proper calibrations for a particular sample with just one click and the user interface is available in different languages. 



For further information and electronic copies of the images please contact:

Kim White

Marketing Communications Specialist

Oxford Instruments Industrial Analysis

Email: Kim.White@oxinst.com

Tel:  978 369 9933



About Oxford Instruments Industrial Analysis

Oxford Instruments Industrial Analysis offers a range of analytical X-ray Fluorescence (XRF), Optical Emission Spectroscopy (OES), Nuclear Magnetic Resonance (NMR), and Electron Magnetic Resonance (EMR) instruments essential for quality control in a diverse range of industries. For materials analysis, thickness measurement, product optimisation and research applications, the Industrial Analysis products incorporate the latest field proven technology coupled with over 30 years of experience in designing, producing and supporting world class instruments.



X-MET handheld XRF analyzers and the expanded range of ARC/Spark mobile OES are specifically designed for positive material identification, alloy analysis and screening. The OES systems comprise the FOUNDRY-MASTER range, PMI-MASTER PRO and TEST-MASTER PRO. Benchtop XRF spectrometers, X-Supreme and Lab-X, span the price/performance range for routine chemical analysis. From sulphur in petroleum products to the analysis of limestone, users may select the spectrometer to match their application. The X-Strata systems and thickness gauges provide world-class performance for coating thickness measurement.



The Magnetic Resonance portfolio includes the MQC benchtop NMR analyzers which have broad applications across the agriculture, foods, consumer products, textiles and polymer industries, and the AffirmoEX EMR spectrometer, ideal for reintroducing EMR to undergraduate Chemistry courses. The GeoSpec range of NMR Core Analyzers is designed specifically for studies of core samples from oilfield reservoirs, with installations in almost every major oil producer and SCAL laboratory world-wide.



With leading products and a global sales and service network, Oxford Instruments Industrial Analysis continues to explore innovative ways to deliver instrument solutions for faster and easier measurements. Visit www.oxford-instruments.com for more information on the company and its products


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