Product News: Test & Measuring Instruments, Laboratory and Research Supplies & Equipment, Services
X-ray Fluorescence Analyzer can analyze up to 4 coating layers.
Press Release Summary:
April 20, 2012 - Meeting ASTM B568 and ISO 3497 international test methods, X-Strata920 x-ray fluorescence (XRF) analyzer offers coating thickness measurement and materials analysis for industrial markets such as electronics, metal finishing, alloys, and precious metals assay. Combining large area proportional detector and micro-focus x-ray tube, providing high-intensity, small spot x-ray beam for sample excitation. If problem area is identified, operator can return to specific points for detailed investigation.
Oxford Instruments Analytical
Original Press Release
New X-Strata920 from Oxford Instruments Offers Rapid and Reliable XRF Coating Thickness Measurement and Materials Analysis
Press release date: April 17, 2012
Combining Sleek New Design with Improved Stability and Reliability, Making a Truly Cost Effective Package.
Oxford Instruments is pleased to announce the new X-Strata920 X-ray fluorescence (XRF) analyser for coating thickness measurement and materials analysis. It combines a large area proportional detector and Oxford Instruments' micro-focus X-ray tube, providing a high-intensity, small spot X-ray beam for superior sample excitation. This combination guarantees the best accuracy in its class, with analysis results obtained in seconds to ensure better process control and cost efficiency.
So whether you analyse solder alloys as part of your quality control process, or assay gold jewellery for valuation, or plating thickness in component manufacture, we believe the X-Strata920 is an ideal solution for your business, providing reliable analysis you need at a price you'll like.
X-Strata920 performs excellent analysis and characterisation of multi-layer analysis across a wide range of industrial markets, including electronics, metal finishing, alloys and precious metals assay. For these industries, the X-Strata920 offers a number of benefits:
The X-Strata920 is designed with ease of use, accuracy and value for money in mind. A large sample area can be analysed in one measurement cycle using the X-Strata's multi-point analysis function. If a problem area is identified the operator can return to specific points with pin point accuracy for detailed investigation. With the analyser's embedded camera and live video imaging, precise sample placement is assured. The X-Strata920 even allows unattended operation to ensure minimal downtimes of your production process.
The X-Strata920 comes with a choice of calibration packages tailored for a wide range of materials screening applications; the analyser is supplied with over 800 pre-loaded, easy-to-select application parameters/methods. To build consumer confidence the X-Strata920 meets international test methods such as ASTM B568 and ISO 3497.
With its advanced security and safety features, the X-Strata920 provides a simple user interface for the routine operator whilst assuring manager level access for system set up and preventing unauthorised use through its auto lock function. The improved reporting function allows seamless export to Excel within seconds and export in custom reports, including statistical data analysis and sampling images.
Issued for and on behalf of Oxford Instruments Industrial Analysis
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Global Marketing Communications Manager
Oxford Instruments Industrial Analysis
Tel: +44 (0) 1494 479278
Fax: +44 (0) 1494 461033
About Oxford Instruments plc
Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. It provides solutions needed to advance fundamental physics research and its transfer into commercial nanotechnology applications. Innovation has been the driving force behind Oxford Instruments' growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.
The first technology business to be spun out from Oxford University over fifty years ago, Oxford Instruments is now a global company with over 1900 staff worldwide and is listed on the FTSE250 index of the London Stock Exchange (OXIG). Its objective is to be the leading provider of new generation tools and systems for the research and industrial sectors.
This involves the combination of core technologies in areas such as low temperature, high magnetic field and ultra high vacuum environments, Nuclear Magnetic Resonance, X-ray, electron and optical based metrology, and advanced growth, deposition and etching. Oxford Instruments aims to pursue responsible development and deeper understanding of our world through science and technology. Its products, expertise, and ideas address global issues such as energy, environment, security and health.
About Oxford Instruments Industrial Analysis
Oxford Instruments, Industrial Analysis offers a range of analytical instruments designed for demanding quality control applications. From materials analysis to thickness gauging, the Industrial Analysis products incorporate the latest field proven technology, coupled with over 30 years of experience in designing, producing and supporting world class instruments.
X-MET handheld X-ray Fluorescence (XRF) analysers and our expanded range of ARC/Spark mobile Optical Emission Spectrometers (OES) are specifically designed for positive material identification, alloy analysis and screening. Our OES systems comprise: FOUNDRY-MASTER PRO, FOUNDRY-MASTER Xpert, FOUNDRY-MASTER COMPACT, PMI-MASTER PRO and TEST-MASTER PRO.
X-Supreme, Lab-X, MDX1000 XRF spectrometers span the price/performance range for routine chemical analysis. From sulfur in petroleum products to the analysis of limestone, we can match exactly the correct spectrometer to your needs. For thickness gauging applications we offer handheld magnetic and eddy current gauges to full function, high performance XR systems. Our X-Strata980 and X-Strata920 systems provide world-class performance for coating thickness measurement.