Terminal Test Tool tests smart card interfaces.
February 15, 2011 -
Providing universal terminal test tool for conformance testing of both contact-based and NFC-related smart card interfaces, UTł Platform is suited for testing mobile phones, contactless terminals, NFC chips and devices, M2M modules, and laptops. Platform offers both analog and digital simulation of all interfaces. Integrated oscilloscope ensures that analog signal behavior is not influenced by additional parasitic effected caused by connection of external measurement equipment.
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|Original Press release |
Paderborn, , 33100
COMPRION Premieres the First Universal Conformance Platform for Terminal Testing at the Mobile World Congress
Paderborn, Germany - The leading test equipment provider for handset testing launches UTł Platform, a new universal terminal test tool for conformance testing of both contact-based and NFC-related smart card interfaces.
The UTł Platform is COMPRION's conformance platform for testing ac-cording to the requirements of GCF/PTCRB (listed as test platform TP 118) and the NFC Forum. As a test system supporting all the contact-based and contactless smart card interfaces - be it ISO/IEC 7816, SWP/HCI, IC- USB or NFC - the UTł Platform is the right solution for testing mobile phones, contactless terminals, chipsets, NFC chips, NFC devices, M2M modules or laptops.
The platform offers both analogue and digital simulation of all interfaces. An integrated oscilloscope ensures that the analogue signal behavior is not influenced by additional parasitic effects caused by the connection of external measurement equipment. Another benefit of the UTł Platform lies in the ability to test contact-based and NFC protocols synchronously. Thus, the UTł Platform provides the entire picture of data exchanged be-tween the UICC, the CLF and the contactless device.
Like all COMPRION tools, UTł Platform stands for convenience and easy handling by the test operator. The UTł Platform has a very high automa-tion level, reducing the operator's work to a minimum level. An integrated Test Plan Manager guides the test operator through the definition of the respective device under test (DUT) and uses the specified DUT features to guarantee a complete arrangement of all mandatory test cases in one test plan. Advanced administration of test execution logs and test reports enables customised result statistics and reporting on the test case and test plan level.
Andreas Bertling, Product Manager at COMPRION says "One advantage of the new system is that - as with all COMPRION tools - we offer a one-stop solution with perfect matching hardware and software coming from one source." He adds "We are also proud that all the different technologies can be tested with a single box, making the handling of testing very con-venient for the customer and securing their investment well into the fu-ture."
In time for the Mobile World Congress, COMPRION is pleased to premiere the first ever PTCRB validated SWP/HCI tests which will be shown on the new conformance platform UTł Platform.
COMPRION GmbH is the global leading manufacturer of comprehensive stand-ard test equipment for Smart Card interfaces with more than 15 years experience in Smart Card technology. COMPRION develops, manufactures and markets test and measurement equipment for Smart Card Vendors, Smart Card Issuers and Terminal Manufacturers across various market sectors and technologies.