Spectroscopic Analyzer suits energy dispersive XRF jobs.
May 8, 2007 -
Run in air or vacuum, NanoMaster Micro X-Ray Fluorescence (MXRF) analyzer is configurable with mechanical beam collimation or high-flux beam optics, resolving Si-PIN detector, or Si Drift Detection (SDD). Network-compatible solution integrates XYZ motorized, programmable, graphic-assisted, point-and-shoot positioning system and operates as Windows XP application. It offers spot size down to 40 microns, processes up to 105 counts/sec, and features ppm/low mass level detection sensitivity.
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Original Press release
Matrix Metrologies, Inc.
101-5 Colin Dr.
Holbrook, NY, 11741
USA
Matrix Metrologies Introduces New Microbeam MXRF X-ray Spectroscopic Analysis Tool for Energy Dispersive XRF Analysis
HOLBROOK, NY - April, 2007 - Matrix Metrologies, Inc., a supplier of film measurement equipment, introduces a complete line of Micro X-Ray Fluorescence (MXRF) systems called the NanoMaster MXRF analyzer. For a multitude of applications - microelectronics, materials characterization, pharmaceuticals, forensics, and geology - composition and mass per area / film thickness - NanoMaster features flexibility and performance. Configurable with mechanical beam collimation or high flux beam optics, highly resolving Si-PIN detector or high-resolution ultimate throughput Si Drift Detection (SDD), NanoMaster can meet the most stringent microanalysis requirements for spatial resolution (spot size down to ~40 microns), precision (105 counts per second processing) and sensitivity (ppm / low mass level detection). Most NanoMaster applications can be run in air, but when light elements or low energy lines need to be analyzed the NanoMaster offers analysis in vacuum as well. The NanoMaster tool features an advance Fundamental parameters software suite that enables standard less and standards corrected calibration for any application with up to 24 elements simultaneously analyzed and up to six layers of elemental or compositional films simultaneously analyzed. The NanoMaster features a full XYZ motorized programmable graphic assisted point and shoot positioning system along with real time video positioning optics and operates as a Windows XP application and is network compatible.
The Matrix NanoMaster tool platform is part of Matrix Metrologies complete family of handheld and benchtop x-ray fluorescence thickness and composition and WEEH/RoHS compliance testing measurement tools.
Matrix Metrologies, headquartered in Holbrook, New York, is a supplier of X-ray measurement equipment and services used for film thickness and composition measurement, restricted element concentration determination for WEEH/RoHS compliance testing of hazardous substances, trace element and bulk element composition measurement and molecular identification of crystalline substances commonly employed in the metal finishing, microelectronics, pharmaceutical and general analysis industries. Matrix offers over twenty five years experience in metrology analysis, XRF instrumentation recertification and repair and supplies a complete line of NIST traceable calibration standards and recertification services.
Additional information on Matrix can be found at http://www.matrixmetrologies.com.
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