ThomasNet News Logo
Sign Up | Log In | ThomasNet Home | Promote Your Business

Source Measurement Unit supports measurement rates to 1.8 MS/s.

Print | 
Email |  Comment   Share  
March 4, 2014 - With pulsing capability up to 500 W and current measurement sensitivity down to 100 fA, NI PXIe-4139 source measure unit (SMU) offers up to 17 SMU channels in 4U 19 in. rack space and enables engineers and scientists to test range of devices with one instrument. NI SourceAdapt technology helps engineers produce optimal SMU response to any load by customizing SMU control loop. Measurements rate reduces test time and enables capture of transient device behavior without external scope.

NI Redefines the SMU with Industry-Leading Speed, Density and Flexibility


National Instruments Corp.
11500 North Mopac Expwy.
Austin, TX, 78759-3504
USA



Press release date: February 25, 2014

The NI PXIe-4139 provides 100X faster sampling rate with at least twice the channel density of similar box instruments.

AUSTIN, Texas -- National Instruments (Nasdaq: NATI) today announced the NI PXIe-4139 system source measure unit (SMU), a high-performance addition to the company's SMU portfolio. This SMU can reduce overall cost of test and accelerate time to market for test engineers in a broad range of industries, from semiconductor to automotive and consumer electronics.

"With the NI PXIe-4139, engineers and scientists get broad IV boundaries, including extended range pulsing capability up to 500 W and sensitivity down to 100 fA, to test a wide range of devices with a single instrument," said Luke Schreier, senior group manager of test systems for National Instruments. "The compact size of the NI PXIe-4139 is also critical. It can reduce system footprint significantly compared with legacy box instrument SMUs."

The NI PXIe-4139 features NI SourceAdapt technology to help engineers produce optimal SMU response to any load by customizing the SMU control loop. This protects devices under test and improves system stability. Additionally, the NI PXIe-4139 system SMU can take measurements at 1.8 MS/s, which is 100X faster than traditional SMUs. This helps reduce test time and offers engineers the ability to capture transient device behavior without an external scope.

"A redefined approach to instrumentation is necessary if you want to keep pace with the increasing complexity of modern electronics," said Schreier. "SourceAdapt technology, coupled with the inherent benefits of PXI modular instrumentation and NI LabVIEW system design software, gives engineers a competitive edge in reducing test times and protecting their devices under test."

Key Features:

--  100 fA current measurement sensitivity: Precisely characterize high-performance semiconductor devices.
--  1.8 MS/s sampling rate: Capture transient device characteristics without an external scope.
--  Up to 17 SMU channels in 4U 19 in. rack space: Minimize test system footprint for high-channel-count systems.
--  SourceAdapt technology: Reduce transient times to improve overall test times and protect the device under test from overshoots and oscillations even on highly inductive or capacitive loads.

To learn more about NI SMU devices, visit www.ni.com/smu.

About National Instruments
Since 1976, National Instruments (www.ni.com) has equipped engineers and scientists with tools that accelerate productivity, innovation and discovery. NI's graphical system design approach to engineering provides an integrated software and hardware platform that speeds the development of any system needing measurement and control. The company's long-term vision and focus on improving society through its technology supports the success of its customers, employees, suppliers and shareholders.

LabVIEW, National Instruments, NI, ni.com and SourceAdapt are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies.

Contact:  beth.williams@ni.com, (512) 683-6394
Print | 
Email |  Comment   Share  
Contacts: View detailed contact information.


 

Post a comment about this story

Name:
E-mail:
(your e-mail address will not be posted)
Comment title:
Comment:
To submit comment, enter the security code shown below and press 'Post Comment'.
 



 See related product stories
More .....
 See more product news in:
Test and Measuring Instruments
 More New Product News from this company:
System-on-Module accelerates embedded design.
All-in-One Instrument suits circuit debugging and validation.
Simulation App facilitates circuit design.
Wireless Prototyping Platform leverages LabVIEW RIO architecture.
Vector Signal Transceiver features 200 MHz RF bandwidth.
More ....
| Featured Manufacturing Jobs
 Other News from this company:
NI System on Module Helps Engineers Develop Embedded Systems Faster, with Less Risk
NI Demonstrates Cyber-Physical Systems at the SmartAmerica Challenge
RADX Technologies and National Instruments Introduce the LibertyGT 1200B COTS Benchtop SDSI
National Instruments and MARA Set up LabVIEW Academies to Enhance the Engineering Education Ecosystem in Malaysia
National Instruments' Graphical System Design Summit 2013 in Southeast Asia kicks Off in Malaysia
More ....
 Tools for you
Watch Company 
View Company Profile
Company web site
More news from this company
E-mail this story to a friend
Save Story
Search for suppliers of
Measuring Instruments
Join the forum discussion at:
Tools of the Trade


Home  |  My ThomasNet News®  |  Industry Market Trends®  |  Submit Release  |  Advertise  |  Contact News  |  About Us
Brought to you by Thomasnet.com        Browse ThomasNet Directory

Copyright © 2014 Thomas Publishing Company. All Rights Reserved.
Terms of Use - Privacy Policy



Error close

Please enter a valid email address