Semiconductor Test Equipment is suited for parallel testing.August 18, 2006 -
Magnum Grande, integrated with TechWing TW-380 handler, is capable of testing 720 NAND Flash devices at one time. Providing IC manufacturers with up to 7,680 I/O pins and 960 sites in single test head, 12-chassis system is built from set of Site Assemblies, that contain data generation, error processing, timing, and dc resources needed to test devices including NAND and NOR Flash memories. Each Site Assembly also includes embedded 1.2 GHz PC for local control of test process.
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Original Press release
Nextest Systems Corporation
1901 Monterey Rd.,
San Jose, CA, 95112
USA
Nextest's New Magnum Grande(TM) Enables a 25% Test Cost Reduction
New Magnum Grande enables test-cost reduction by offering a fully integrated solution for testing 720 NAND Flash parts in parallel.
SAN FRANCISCO, July 11 - Nextest Systems Corporation (NASDAQ:NEXT), a leading manufacturer of automatic test equipment (ATE) for cost-sensitive semiconductors, announced today the introduction of its newest member of the Magnum family, Magnum Grande. Grande, integrated with a TechWing handler, will be showcased in Booth #8241 at the SEMICON West trade show. The conference is being held at the Moscone West Convention Center in San Francisco, California, July 11-13, 2006.
On display for the first time, the Grande will be integrated with a TechWing TW-380 handler. This highly parallel test solution is capable of testing 720 NAND Flash devices at one time - more than doubling the configuration Nextest demonstrated only one year ago at SEMICON West 2005. This is the largest capacity tester/handler configuration available today.
Robin Adler, CEO of Nextest Systems Corporation, commented, "Our legacy and commitment to our customers is to provide test solutions that are simple and efficient in design, with advanced product innovation and reliability - and all at the lowest cost of test possible. We believe Grande has raised the bar to a new level in package test. As ASP's continue to erode in Flash, collaboration with customers and other equipment providers is crucial as we develop solutions that drive down test costs. That's what we do best at Nextest."
Magnum Grande, designed for massively parallel test applications, brings a new dimension in testing solutions for the rapidly growing Flash marketplace. With up to 7,680 I/O pins and 960 sites, the twelve-chassis system provides IC manufacturers the largest number of pins, and maximized test capacity, available in a single test head. This unprecedented level of integration brings with it a 25% test cost reduction over last year's 320-site configuration. Magnum Grande does all this with the same floor space, operating software, test programs, and spare parts as the Magnum GV - thus eliminating any additional operating costs.
The key to Magnum's success is its unique architecture. Each Magnum system is built from a set of "Site Assemblies." Each Site Assembly contains all of the data generation, error processing, timing and DC resources required to test a wide variety of devices, including both NAND and NOR Flash memories. Each Site Assembly also includes an embedded 1.2Ghz PC for high efficiency and local control of the test process - therefore, keeping parallel-test overhead to the lowest level in the ATE industry.
Magnum Grande systems are available today at prices starting at less than $400 per-pin.
ABOUT NEXTEST
Nextest Systems Corporation is a low-cost leader in the design and manufacture of automatic test equipment (ATE) for Flash memory and System-On- Chip semiconductors. Nextest's products address the growing demand from manufacturers for ATE with increased throughput, functionality and reliability, while reducing time to market and cost of test. Nextest has shipped over 1,500 systems worldwide. Further information is available at www.nextest.com.
Source: Nextest Systems Corporation
Web site: http://www.nextest.com/
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