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Scanning Probe Microscope includes hand-held tool.

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Scanning Probe Microscope includes hand-held tool.
Scanning Probe Microscope includes hand-held tool.

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February 28, 2002 - MultiMode(TM) PicoForce(TM) Scanning Probe Microscope (SPM) Control System enables force measurements and manipulation of biological/material samples at pico-Newton level. Combined with software developed for force spectroscopy, SPM can view inter- and intra-molecular forces. MultiMode PicoForce utilizes atomic force microscope (AFM), scanner with closed-loop control of Z-axis for sample separation, and software GUI.

(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Original Press release

Veeco Metrology Group
112 Robin Hill Rd.
Goleta, CA, 93117
USA



MultiMode PicoForce Revolutionizes Force Spectroscopy


MultiMode PicoForce Revolutionizes Force Spectroscopy

Santa Barbara, CA, February 1, 2002 * Veeco Metrology Group (NASDAQ:VECO), announces the release of the Digital Instruments MultiMode(TM) PicoForce(TM) Scanning Probe Microscope (SPM) Control System for demanding biology and materials research. The PicoForce system, combined with powerful software developed specifically for force spectroscopy, enables accurate force measurements and manipulation of biological or material samples at the pico-Newton level, including inter- and intra-molecular forces, for applications ranging from drug discovery to basic molecular-scale research.

"Most force spectroscopy experiments demand precise, accurate control of tip-sample separation and low-noise detection of cantilever deflection," explains Bob Tench, product manager at Veeco Metrology Group. "The new PicoForce incorporates several innovations in nanotechnology that allow unprecedented control of these aspects, making this a particularly interesting product in the study of protein unfolding, antibody-antigen interactions, molecular motors, and nanoscale mechanical properties."

The MultiMode PicoForce utilizes the world's best-selling atomic force microscope (AFM), a scanner with closed-loop control of the Z-axis that accurately controls tip-sample separation, and new software GUI developed specifically for force spectroscopy (see di.com/picoforce). It also includes an innovative handheld tool that features unparalleled sensitivity to tip-sample interaction force. Another cost-saving feature is the PicoForce system's modular design, which allows existing MultiMode AFM users to upgrade individual components rather than start over with entirely new equipment.
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