Product News: Optics & Photonics

Scanning Electron Microscope offers sub-nanometer resolution.

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Press Release Summary:

August 8, 2012 - Verios(TM) XHR SEM provides resolution and contrast needed for precise measurements on beam-sensitive materials in semiconductor manufacturing and materials science applications. When combined with IC3D(TM) software, instrument can provide measurements needed to control processes at 22 nm technology node and below. User can switch between operating conditions, maintain sample cleanliness, and obtain sub-nanometer resolution at any accelerating voltage from 1-30 kV.

FEI Co.

5350 NE Dawson Creek Dr., Hillsboro, OR, 97124, USA

Original Press Release

FEI Announces New Verios Extreme High Resolution SEM

Press release date: July 30, 2012

System delivers powerful resolution and contrast on a fast, easy-to-use platform for precise measurement of sensitive materials in semiconductor and materials science applications.

Hillsboro, Ore. -- FEI (NASDAQ: FEIC), a leading instrumentation company providing imaging and analysis systems for research and industry, extends its leadership in the high-resolution scanning electron microscopy (SEM) market with the launch of the new Verios(TM) XHR SEM. The Verios provides the sub-nanometer resolution and enhanced contrast needed for precise measurements on beam-sensitive materials in advanced semiconductor manufacturing and materials science applications.

"The Verios XHR SEM extends the lifetime of SEM as an important measurement tool in semiconductor process control labs by allowing engineers to measure beam-sensitive materials and structures that are too small for conventional SEM," stated Rudy Kellner, vice president & general manager, Electronics Business Unit, FEI. "When combined with our IC3D(TM) software, the Verios is a robust instrument that can provide the precise measurements they need to control processes at the 22nm technology node and below."

Trisha Rice, FEI's vice president & general manager of the Materials Science Business Unit adds, "For materials scientists, the Verios will also enable important new insights by extending sub-nanometer imaging and characterization to novel materials being developed today. This will allow researchers to capture the high resolution, high contrast images required, without the need to transition to TEM or other imaging techniques."

The Verios is the second generation of FEI's leading XHR SEM family. At low kV, where the performance of conventional SEM degrades significantly, the Verios system's advanced optics deliver impressive sensitivity to surface detail. It allows any user to switch quickly between various operating conditions, maintain sample cleanliness, and obtain sub-nanometer resolution at any accelerating voltage from 1 kV to 30 kV.

In addition to its extreme high-resolution performance, the Verios introduces new detection technologies. The optimized signal collection and advanced filtering abilities not only provide higher and more flexible contrast generation, but also allow for a greater range of samples to be investigated. Many beam-sensitive or non-conductive materials can now be accurately observed at the nanoscale, without any preparation.

For more information, please visit: www.fei.com/Verios.

About FEI FEI (Nasdaq: FEIC) is a leading diversified scientific instruments company. It is a premier provider of electron- and ion-beam microscopes and solutions for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. With more than 60 years of technological innovation and leadership, FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams(TM), which combine a SEM with a focused ion beam (FIB). Headquartered in Hillsboro, Ore., USA, FEI has over 2,200 employees and sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.

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