Scanning Electron Microscope offers sub-nanometer resolution.
January 6, 2009 -
Using Magellen(TM) extreme high-resolution SEM, scientists and engineers can see 3D surface images at many different angles and at resolutions below 1 nm. Unit images samples at low beam energies, avoiding distortions otherwise caused by beam penetrating into material below.
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Original Press release
FEI Company
5350 NE Dawson Creek Dr.
Hillsboro, OR, 97124
USA
FEI Presents New Extreme High Resolution Scanning Electron Microscope at Pittcon 2009
FEI extends SEM to applications that were previously impossible or impractical
FEI's new Magellan(TM) extreme high-resolution scanning electron microscope (XHR SEM) allows scientists and engineers to quickly see 3D surface images at many different angles and at resolutions below one nanometer (about the size of ten hydrogen atoms, side-by-side). Most importantly, the Magellan XHR SEM images samples at very low beam energies, avoiding distortions otherwise caused by the beam penetrating into the material below.
FEI delivers the most innovative solutions for imaging, characterization and prototyping at the nanoscale. The company's most advanced TEM, SEM, and DualBeam(TM) solutions were created specifically for materials science, life science, and mining. Please visit FEI at Pittcon 2009 in booth 1642 to learn more about the Magellan and other high-resolution microscopy techniques.
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