Scanning Electron Microscope features variable pressure mode.
August 21, 2009 -
Featuring GEMINIŪ column and variable pressure technology, SIGMA VP FE-SEM is compatible with Carl Zeiss BSD and VPSE G3 detectors, which provide imaging of non-conducting specimens. Chamber includes provision for all WDS variants as well as geometry suitable for co-planar EDS and EBSD analysis. System control is by means of SmartSEMŪ software package with intuitive interface and GEMINI column.
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Original Press release
Carl Zeiss Microimaging, Inc.
One Zeiss Dr.
Thornwood, NY, 10594-1939
USA
Carl Zeiss Expands SIGMA FE-SEM Platform
Variable pressure mode extends analytical capabilities
CAMBRIDGE/UK, OBERKOCHEN/Germany, 08.07.2009.
Today, Carl Zeiss launches SIGMA VP, which adds variable pressure technology to the range of SIGMA field emission scanning electron microscopes (FE-SEM). Featuring the Carl Zeiss GEMINIŪ column, proven VP technology and a design with analytical accessories in mind, the SIGMA VP provides a comprehensive analytical solution for a constantly growing diversity of applications. The chamber includes the provision for all WDS variants as well as a geometry suitable for coplanar EDS and EBSD analysis. The SIGMA VP is compatible with a wealth of accessories including the Carl Zeiss BSD and VPSE G3 detectors, which provide exceptional imaging of non-conducting specimens.
The customer benefits of the SIGMA VP are a combination of outstanding flexibility and unrivalled ease of use with respect to both image acquisition and analytical applications. System control by means of SmartSEMŪ, the Carl Zeiss software package known for its intuitive interface, and the GEMINI column with user-friendly operation allow for excellent imaging by novices and experts alike.
With this launch Carl Zeiss further underlines its slogan: Maximum information - maximum insight.
Outstanding flexibility and unrivalled ease of use are the core benefits of the new SIGMA FE-SEM with variable pressure mode.
Markus Wiederspahn
Public Relations
Carl Zeiss SMT AG
Phone: +49 7364 20-2194
Fax: +49 7364 20-9206
E-Mail: wiederspahn@smt.zeiss.com
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