Product News: Test & Measuring Instruments

PXI-based Test System accelerates LTE waveform creation.

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Press Release Summary:

July 7, 2014 - Providing tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyze multiple channels in frequency and modulation domains simultaneously, LTE/LTE-Advanced Multi-channel PXI-based Test Solution helps engineers gain deep insight into complex carrier aggregation and spatial multiplexing MIMO designs. Chassis backplane trigger tool configures and routes backplane triggers for proper time synchronization in MIMO configuration for up to 2 PXIe chassis.

Agilent Technologies, Inc.

5301 Stevens Creek Blvd., Santa Clara, CA, 95051, USA

Original Press Release

Agilent Technologies' New Multi-Channel PXI-based Test Solution Speeds LTE/LTE-Advanced Waveform Creation and Analysis

Press release date: June 25, 2014

Solution Allows Engineers to Gain Deeper Insight into Carrier Aggregation and Spatial Multiplexing Design

SANTA CLARA, Calif., – Agilent Technologies Inc. (NYSE: A) today announced the LTE/LTE-Advanced multi-channel PXI-based test solution, which accelerates the setup of multi-channel test system configurations and enables engineers to gain deeper insight into complex carrier aggregation and spatial multiplexing MIMO designs.

Designing and characterizing components and RF subsystems for base stations, microcells, picocells, repeaters and mobile devices is becoming more complex as multi-antenna designs require increasingly complex multi-channel test configurations. Agilent's new test solution provides tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyze multiple channels in the frequency and modulation domains simultaneously. The easy-to-use graphical user interface shortens the time it takes to set up a test configuration. In addition, measurement setups are optimized for LTE/LTE-Advanced MIMO and carrier aggregation configurations.

The test solution's chassis backplane trigger tool configures and routes the backplane triggers for proper time synchronization in MIMO configuration for up to two PXIe chassis. Time-synchronized MIMO testing (2x2 or 4x4) is easily accomplished using Agilent's RF M9381A PXIe vector signal generators and M9391A PXIe vector signal analyzers, which provide less than 0.38% EVM and less than 20 nsec time synchronization between channels. In addition, the up to 160 MHz signal generation and analysis bandwidth is capable of supporting the widest LTE-Advanced carrier aggregation applications.

To learn more about the LTE-A multi-channel applications test solution, visit www.agilent.com/find/solution-LTE where you can download literature and register to attend the free webcast "Addressing Design and Test Challenges for the New LTE-Advanced Standard" on July 15.

Contact your local Agilent sales office for pricing on a system tailored to specifically meet the needs of your test environment.

About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is the world's premier measurement company and a technology leader in chemical analysis, life sciences, diagnostics, electronics and communications. The company's 20,600 employees serve customers in more than 100 countries. Agilent had revenues of $6.8 billion in fiscal 2013. Information about Agilent is available at www.agilent.com.

On Sept. 19, 2013, Agilent announced plans to separate into two publicly traded companies through a tax-free spinoff of its electronic measurement business. The new company is named Keysight Technologies, Inc. The separation is expected to be completed in early November 2014.

Contact:

Janet Smith, Americas
+1 970 679 5397
Twitter: @JSmithAgilent

Sarah Calnan, Europe
+44 (118) 927 5101
sarah_calnan@agilent.com

Connie Wong, Asia
+852 3197-7818
connie-ky_wong@agilent.com

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