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PXI Modules support JTAG/Boundary Scan test.

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PXI Modules support JTAG/Boundary Scan test.
PXI Modules support JTAG/Boundary Scan test.

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November 3, 2008 - Offering 96 individually configurable, single-ended channels, PXI 5396-x Modules provide memory depth of 72 MB and 144 MB, and support structural JTAG/Boundary Scan test as well as dynamic I/O operation up to 100 MHz to execute functional tests. Groups of 32 channels from 1.8-5 V can be voltage programmed for adaptation of instrument to unit under test. Up to five 3U PXI 5396-x modules can be cascaded to I/O brick, whereby all PXI trigger signals are supported for synchronizations.

(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Original Press release

GOEPEL electronics LLC
9600 Great Hills Trail, Suite 150 W
Austin, TX, 78759
USA



New PXI Module Enables Combination JTAG/Boundary Scan and Dynamic Functional Test


GOEPEL electronic, world class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x, launches a new series of JTAG Digital I/O PXI modules named PXI 5396-x.

The PXI 5396-x modules offer 96 individually configurable single ended channels and support the structural JTAG/Boundary Scan test as well as dynamic I/O operation up to 100MHz to execute functional tests.

"For users with mission critical applications, Boundary Scan and real-time testing are substantial parts of the entire test strategy, hitherto executed with different equipment", Karl Miles, Manager (UK operations) for GOEPEL electronics Ltd., explains. "The new PXI modules overcome this separation based on a high-performance, standardized platform, which enables our customers to test effectively and save costs at the same time."

PXI 5396-x are 1 Slot 3U modules, which differ in on-board memory depth of 72MB (PXI 5396-X) and 144MB (PXI 5396-XM). All modules offer 96 channels single ended channels configurable as input, output and tri-state, which allow simultaneous driving, measuring and real-time comparison.

While the signals are processed to test bus operations completely synchronous in the JTAG mode, the dynamic I/O mode enables functional testing with freely programmable clock frequencies from 500Hz to maximum 100MHz. That's why, first structural Boundary Scan tests and afterwards functional tests can be executed with the same instrument.
Groups of 32 channels between 1.8V and 5V can be voltage programmed for the flexible adaptation of the instrument to the unit under test (UUT). Additionally, Pull/Up and Pull/Down can be set for each channel. All channels have additional safety measures such as "unstress" and increased current spreading rate based on the well-proven CION interface-ASIC. Up to five PXI 5396-x modules can be cascaded to an I/O brick, whereby all PXI trigger signals are supported for synchronisations. The module's flexibility is determined by the implemented VarioCoreŽ technology, which enables the application of customized IP embedded in the instrument's hardware.

Standard kits, e.g. Virginia Panel Corporation, are optionally available for modules' coupling with commercial interface test adapters (ITA).

In terms of software, the PXI 5396-x modules are fully supported in the Integrated JTAG/Boundary Scan Development Environment SYSTEM CASCON(TM) from version 4.4.1 onwards which frees users from time consuming manual project data processing. This includes the automated generation of wiring lists, automatic test program generation (ATPG) as well the utilisation of the graphical multi-mode debugger. SYSTEM CASCON controls the PXI 5396-x modules' I/O channels via HYSCAN(TM), an interface that enables the simultaneous handling of serial and parallel vectors. In the case of detected connectivity defects, a respective fault diagnostics processor is executed after test execution to obtain pin level and net level diagnostics. The fault location can optionally be visualized in layout and schematic representations of the UUT.
The execution of functional dynamic tests and the following fault diagnostic are based on recently into SYSTEM CASCON(TM) integrated IEE Std. 1445 Digital Test Interchange Format (DTIF).

About GOEPEL electronic:

GOEPEL electronic, founded in 1991 and headquartered in Jena/Germany, is a worldwide leading vendor of innovative JTAG / Boundary Scan / IEEE 1149.x solutions, offering mature software tools in an integrated development environment, high-performance Boundary Scan controllers and accessories, as well as comprehensive product support and value added services. The company of 140 employees generated a revenue of more 18 million EURO (about 25 million US Dollars) in 2007, maintaining support and sales offices in Germany, France, the United Kingdom, and the United States. An extended distribution and service network of more than 300 specialists ensures excellent local and on-site customer support for more than 6,000 worldwide system installations. GOEPEL electronic has continuously been ISO9001 certified since 1996 and has been honoured with TOP-JOB and TOP-100 awards for being one of the best medium-sized companies in Germany. GOEPEL electronic's products won several awards in recent years and are used by the leading companies in telecommunication, automotive, space and avionics, industrial controls, medical technology, and other industries. Further information about the 2004, 2006 and 2007 "Best-in-Test Award" winner can be found on the Internet at www.goepel.com.

US Sales Contact:

GOEPEL electronics LLC

Mr Raj Puri

45209 Helm Street

Plymouth, MI 48170 USA

Tel: +1-408-691-4679

Fax: +1-512 502 3076

Email: r.puri@goepel.com

Internet: www.goepelusa.com

UK Sales Contact:

GOEPEL electronics Ltd.

Mr Karl Miles

Unit 1A, The Old Granary

Oakington Road, Westwick

Cambridge CB24 5AR

United Kingdom

Tel: +44-1223 -858298

Fax: +44-8451-309004

Mobile: +44 7779-652372

Email: k.miles@goepel.co.uk

Internet: www.goepel.co.uk
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