Optical 3D Profiler utilizes 1 million pixel image sensor.July 31, 2008 -
Based around Coherence Correlation Interferometry technique, Talysurf CCI Lite provides non-contact 3D surface texture, step height, and micro dimensional measurement. All types of rough, smooth, or highly reflective materials, including glass, metal, photo resist, polymer, liquid inks, and pastes, can be measured. System also provides automatic pattern measurement as well as X, Y, and Z stitching. Z stage is closed loop over full 100 mm range for high accuracy.
(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Original Press release
Taylor Hobson, Inc.
2100 Golf Rd.
Rolling Meadows, IL, 60008 4274
USA
Taylor Hobson Launches Talysurf CCI Lite
Automated, Small Footprint Version of its World-Leading Talysurf CCI Range of Non-Contact 3D Optical Profilers
LEICESTER, ENGLAND- AMETEK Taylor Hobson, an acknowledged leader in metrology design and manufacturing, has introduced Talysurf CCI Lite to its range of non-contact optical 3D profilers, bringing an unparalleled level of performance to non-contact 3-D measurement within reach of the global manufacturing and research market.
The Talysurf CCI is based around the Coherence Correlation Interferometry technique (Taylor Hobson patented) which provides both long scan ranges and high resolution with a single mode of operation, thus avoiding the compromises associated with systems requiring multiple modes of operation such as combinations of both phase mode and vertical scanning modes. The result is a non-contact 3D surface texture, step height and micro dimensional measurement system that can provide results in seconds. The sensitivity of the coherence correlation algorithm to low light levels adds to the versatility of the instrument.
All types of rough, smooth or highly reflective materials, including glass, metal, photo resist, polymer, liquid inks and pastes, can be measured without difficulty. The instrument is an invaluable tool in the manufacture of automotive components, bearings, MEMS (micro electro-mechanical systems), super-polished optical components, semiconductor devices and many other applications.
Careful design and construction of the Talysurf CCI Lite assures stability throughout the measuring loop, an important requirement for high precision metrology. The system is offered as standard with a high sensitivity 1 million pixel image sensor for excellent data resolution in the X and Y axes and combined with a very low missing data rate; resulting in class leading surface detail. A turret is also included to improve easy of use.
The Talysurf CCI Lite includes many automation features not normally found on tabletop systems, these include automatic pattern measurement, X, Y stitching and Z stitching. The unique Z stage is closed loop over its full 100 mm range leading to very high accuracy Z stitching. Lenses offering up to 6.6 mm field of view are available, the large field of view enables faster stitching as fewer images are required.
Measurement set up is simple. Place a component onto the positioning stage, focus on the surface (auto focus, auto fringe find and auto range are all included), select the Z scan range (up to 2.2 mm) and push the start button. Very little component preparation is required with the sample only needing to be free from contamination. New software options including auto fringe find and auto range have been developed to improve the ease of use of the system during simple scans and more complex automation routines. More complex samples can be measured using a combination of stitching, auto fringe find, auto focus, auto range, fixtures, jigs and vacuum chucks. Preparation and staging of the component is greatly simplified because the measured data can be software leveled and aligned.
Routine calibration is simple and can be carried out with Taylor Hobson's traceable artifacts as well as other specialized artifacts. The routines can be used to calibrate the instrument's vertical and lateral measurement axes. The geometrical, dimensional and surface characteristics of any known artifact can therefore be easily reproduced with confidence. Detailed measurement and analysis can automatically be carried out with the press of a button. Surface features defined by diameter, area or volume can be automatically identified, measured and sorted. Internationally recognized waviness and roughness parameters in both 3D and 2D are included.
Presentation tools include user-defined scale, viewing angle and rotation, plus photo-realistic images in monochrome or full-color providing a natural view of 3D planar surfaces. A full package of desktop publishing tools, including templates for repetitive tests; aids consistent, comprehensive documentation of measurement results and analysis.
Taylor Hobson is a leading manufacturer of ultra-precision measurement instrumentation for a variety of markets, including optics, semiconductors, hard disk drives and nanotechnology research. It is a unit of AMETEK, Inc, a leading global manufacturer of electronic instruments and electromechanical devices, with annual sales of more than $2.4 billion. For more information on Taylor Hobson's complete line of ultra-precision measurement instruments:
Mike Conroy
CCI Product Manager
+44 (0)116 246 3177
Mike.conroy@ametek.co.uk
Ian Lee-Bennett
Business Development Director
+44 (0)116 246 3159
ian.lee-bennett@ametek.co.uk
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