Miniature LTE Test Card is suited for use in mobile devices.
September 27, 2010 -
Featuring LTE data fields up to Release 9, 128K/J LTE Test (U)SIM in Mini-UICC format implements Test SIM, Test USIM, and Test ISIM applications. Product supports Third Form Factor (3FF) format and 1.8, 3, and 5 V voltage classes. Included are commands such as resize, for extending size of data field, and create, for creating new data fields. Card enables user to examine functionality of LTE mobile device without having access to live LTE network.
(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Original Press release
COMPRION GmbH
Technologiepark 25
Paderborn, , 33100
Germany
COMPRION Launches Its First LTE Test (U)SIM in the Mini-UICC Format
Paderborn, Germany
After releasing its first LTE Test (U)SIM in July 2010, COMPRION now also offers an LTE Test (U)SIM supporting the Third Form Factor (3FF).
COMPRION GmbH is the global leading manufacturer of comprehensive standard test equipment for Smart Card interfaces with more than 15 years experience in Smart Card technology. COMPRION develops, manufactures and markets test and measurement equipment for Smart Card Vendors, Smart Card Issuers and Terminal Manufacturers across various market sectors and technologies.
As mobile devices get more and more complex, the components used become smaller and smaller. With the launch of the new LTE Test (U)SIM supporting the 3FF format, also known as Micro-SIM or Mini-UICC, COMPRION is responding to this trend. The LTE Test (U)SIM in the Mini-UICC format is only half the size of a regular Plug-In card and can be used in very small mobile devices.
Just like COMPRION's first released LTE Test (U)SIM, this new 128K/J LTE Test (U)SIM includes all new LTE data fields up to Release 9. The card has three applications implemented: a Test SIM; a Test USIM; and a Test ISIM. The Test (U)SIM also supports the three voltage classes 1.8V, 3V and 5V.
Standardised commands such as "Resize" (for extending the size of a data field) and "Create" (for creating new data fields) are supported. The Test Card's flexibility and feature range enable the user to comprehensively examine the functionality of an LTE mobile device without having access to a live LTE network.
To ensure backwards compatibility to the Plug-In format, COMPRION also offers a Mini-UICC Adapter to turn the Mini-UICC into the Plug-In format. Hence, the Mini- UICC can also be used in today's mobile phones.
Press Contact:
Kathleen Loeser
Marketing Manager
Tel: +49-5251-699 86 67
Fax: +49-5251-699 86 99
E-Mail: Kloeser@comprion.com
COMPRION GmbH
Technologiepark 25
33100 Paderborn
Germany
Tel: +49-5251-699 86 0
Fax: +49-5251-699 86 99
Web: www.comprion.com
E-Mail: info@comprion.com
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