Microscope System identifies defects.November 16, 2001 - Acoustic microscope system, VRM C-SAM, employs Frequency Domain algorithm to extract subtle defect information not seen in conventional pulse-echo imaging. Storing complete 3D of raw data lets high-resolution images be reconstructed later, without original sample. VRM C-SAM inspects individual components, trays of components and components assembled onto printed wiring boards or hybrid substrates smaller than 12 by 12 in.
(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Original Press release
Sonoscan, Inc.
2149 E. Pratt Blvd.
Elk Grove Village, IL, 60007
USA
New Frequency Domain Acoustic Tool for COTS Reliability
Elk Grove Village IL -- Builders of Hi Reliability systems that incorporate COTS (commercial off the shelf) components can greatly enhance system reliability by using a new type of acoustic microscope system developed by Sonoscan, Inc. Based upon
C-SAM® technology, pulse-echo ultrasound is used nondestructively to identify and image defects.
The new system employs a Frequency Domain algorithm to extract subtle defect information not seen in conventional pulse-echo imaging. Storing the complete 3 D of raw data lets very high resolution images be reconstructed later - even without the
original sample.
The new system, known as the VRM(TM) C-SAM, satisfies several important Hi-Rel needs.
1) It reduces the chance of field failure by sorting out defective components.
2) It helps to identify failure modes so manufacturing processes can be corrected.
3) It preserves the full 3-dimensional matrix of acoustic/structural data on each component so that images can be reconstructed later (even years later) at any depth
level, in any direction (planar or cross-sectional view) and at any acoustic frequency within the pulse frequency band.
4) This capability enables system manufacturers and component suppliers to monitor changes that may occur over time in COTS devices that have been put into service.
The VRM C-SAM is available now for inspecting individual components, trays of components and for inspecting components assembled onto printed wiring boards or hybrid substrates smaller than 12 by 12 inches. VRM capability for inspecting boards up to 24 inches square will shortly be available on the Sonoscan D24 system.
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