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Metrology Systems characterize flat panel displays.

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Metrology Systems characterize flat panel displays.
Metrology Systems characterize flat panel displays.

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June 10, 2009 - Implementing sensor heads for in-line product monitoring, 1800 Series offers fully automated conveyor models to monitor uniformity of ITO, TCO, thin films, and other coatings on non-conductive substrates. Optional SPC software gives warning when uniformity or sheet-resistance measurements are out of range. With automatic Z-function sensor head, 1800AG Model offers automatic gap adjustment. R/D Series is suited for characterization of wafers up to 450 mm dia, coated glass panels, and solar cells.

(Archive News Story - Products mentioned in this Archive News Story may or may not be available from the manufacturer.)
Original Press release

Lehighton Electronics, Inc.
P.O. Box 328
Lehighton, PA, 18235
USA



Lehighton Augments 1800 Series Metrology Systems for Solar Cell, Flat Panel Display Mfg. Applications


Lehighton, Pennsylvania, USA - Lehighton Electronics, a leading provider of metrology systems for monitoring the uniformity of ITO, TCO, various thin films and other coatings, announces the augmentation and enhancement of its 1800 Series line of equipment for the characterization of solar cells and flat panel displays. Originally designed for the LED and flat panel market, the enhanced 1800 Series now offers full automation and control and added capabilities to serve a broader range of applications in growing markets.

In making the announcement, Robert Warren, Sales Manager, said, "Our advanced 1800 Series systems are ideal for in-line integration in the manufacturing of multiple solar products, semiconductors, architectural glass products, automobile glass products, microwave food susceptor products, and plastic substrate products. They're proven performers that have even more to offer these challenging, emerging technologies and applications."

The 1800 Series implements sensor heads for in-line product monitoring, and offers fully automated conveyor models to monitor uniformity of ITO, TCO, various thin films and other coatings on non-conductive substrates. Lehighton offers, as an option on fully integrated models, Statistical Process Control software to "give warning" when uniformity or sheet-resistance measurements are out of the desired range for the product line. This series ranges in sophistication from the supply of the sensor head and data extraction software for customer integration to fully automated conveyor systems. Lehighton offers integration services as well to its customers.

The 1800 R&D series is designed for characterization of multiple types of products, e.g., wafers up to 450mm diameter, coated glass panels, solar cells, all with the option of full automation. The 1800AG (Automated Gantry) model is available with the Lehighton automatic Z-function sensor head for automatic gap adjustment to guarantee no contact and excellent sheet resistance measurements.

About Lehighton Electronics Inc.

Lehighton Electronics Inc. has been engineering and providing metrology solutions to the silicon, compound semiconductor, solar, flat panel display and other related industries for more than 40 years. Some tools sold in the 1970s are still used in production today, providing our customers with consistently low tool ownership and operating costs. For more information, visit lehighton.com; or contact Robert Warren at Lehighton Electronics Inc., P.O. Box 328, Lehighton, PA 18235-0328 USA, Tel. (800) 535-1112; Outside the U.S., +717.917.6940; Fax: (610) 377-6820; Email at salesinfo@lehighton.com.
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